title: Determination of the diffusion coefficient of protons in Nafion thin films by ac-electrogravimetry.
abstract: This letter deals with an adaptation of the ac-electrogravimetry technique to extract separately the dynamic properties of H(+) and water in Nafion nanometric thin films (average thickness of 400 nm). An original theoretical approach was developed to extract the representative parameters from ac-electrogravimetry data. The concentration change of the exchanged species and the diffusion coefficient of the protons in a Nafion nanometric thin film (D = 0.5 × 10(-6) cm(2) s(-1) at 0.3 V vs SCE) were estimated for the first time according to the applied potential. The conductivity value of Nafion thin films was calculated from the Nernst-Einstein equation using diffusion coefficients and concentration values extracted from ac-electrogravimetry data. The calculated conductivity results agree well with the experimental proton conductivity values of Nafion thin films.
authors.affiliation: UPR 15 du CNRS, LISE , 4 place Jussieu, 75252 Paris, France.
authors.forename: Ozlem
authors.initials: O
authors.lastname: Sel
authors.forename: L
authors.initials: L
authors.lastname: To Thi Kim
authors.forename: Catherine
authors.initials: C
authors.lastname: Debiemme-Chouvy
authors.forename: Claude
authors.initials: C
authors.lastname: Gabrielli
authors.forename: Christel
authors.initials: C
authors.lastname: Laberty-Robert
authors.forename: Hubert
authors.initials: H
authors.lastname: Perrot