title: Evaluating bandgap distributions of carbon nanotubes via scanning electron microscopy imaging of the Schottky barriers.
abstract: We show that the Schottky barrier at the metal-single walled carbon nanotube (SWCNT) contact can be clearly observed in scanning electron microscopy (SEM) images as a bright contrast segment with length up to micrometers due to the space charge distribution in the depletion region. The lengths of the charge depletion increase with the diameters of semiconducting SWCNTs (s-SWCNTs) when connected to one metal electrode, which enables direct and efficient evaluation of the bandgap distributions of s-SWCNTs. Moreover, this approach can also be applied for a wide variety of semiconducting nanomaterials, adding a new function to conventional SEM.
authors.affiliation: State Key Laboratory of Low-Dimensional Quantum Physics, Department of Physics and Tsinghua-Foxconn Nanotechnology Research Center, Tsinghua University , Beijing 100084, China.
authors.forename: Yujun
authors.initials: Y
authors.lastname: He
authors.forename: Jin
authors.initials: J
authors.lastname: Zhang
authors.forename: Dongqi
authors.initials: D
authors.lastname: Li
authors.forename: Jiangtao
authors.initials: J
authors.lastname: Wang
authors.forename: Qiong
authors.initials: Q
authors.lastname: Wu
authors.forename: Yang
authors.initials: Y
authors.lastname: Wei
authors.forename: Lina
authors.initials: L
authors.lastname: Zhang
authors.forename: Jiaping
authors.initials: J
authors.lastname: Wang
authors.forename: Peng
authors.initials: P
authors.lastname: Liu
authors.forename: Qunqing
authors.initials: Q
authors.lastname: Li
authors.forename: Shoushan
authors.initials: S
authors.lastname: Fan
authors.forename: Kaili
authors.initials: K
authors.lastname: Jiang