title: Direct measurements of effect of counterion concentration on mechanical properties of cationic vesicles.
abstract: Theoretical analyses of charged membranes in aqueous solutions have long predicted that the electric double layer surrounding them contributes significantly to their mechanical properties. Here we report the first, direct experimental measurements of the effect of counterion concentration on the bending and area expansion modulus of cationic surfactant vesicles. Using the classical technique of micropipet aspiration coupled with a modified experimental protocol that is better suited for cationic vesicles, we successfully measure the mechanical properties of a double-tailed cationic surfactant, diethylesterdimethyl ammonium chloride (diC18:1 DEEDMAC) in CaCl2 solutions. It is observed that the area expansion modulus of the charged membrane exhibits no measurable dependence on the counterion concentration, in accordance with existing models of bilayer elasticity. The measured bending modulus, however, is found to vary nonmonotonically and exhibits a minimum in its variation with counterion concentration. The experimental results are interpreted based on theoretical calculations of charged and bare membrane mechanics. It is determined that the initial decrease in bending modulus with increasing counterion concentration may be attributed to a decreasing double layer thickness, while the subsequent increase is likely due to an increasing membrane thickness. These mechanical moduli measurements qualitatively confirm, for the first time, theoretical predictions of a nonmonotonic behavior and the opposing effects of ionic strength on the bending rigidity of charged bilayers.
authors.affiliation: Department of Chemical Engineering, University of California, Santa Barbara , Santa Barbara, California 93106-5080, United States.
authors.forename: Mansi
authors.initials: M
authors.lastname: Seth
authors.forename: Arun
authors.initials: A
authors.lastname: Ramachandran
authors.forename: L Gary
authors.initials: LG
authors.lastname: Leal