title: Simultaneous detection and localization of secondary ions and electrons from single large cluster impacts.
abstract: The use of large cluster primary ions (e.g. C60, Au400) in secondary ion mass spectrometry has become prevalent in recent years due to their enhanced emission of secondary ions, in particular, molecular ions (MW ≤ 1500 Da). The co-emission of electrons with SIs was investigated per projectile impact. It has been found that SI and electrons yields increased with increasing projectile energy and size. The use of the emitted electrons from impacts of C60for localization has been demonstrated for cholesterol deposited on a copper grid. The instrumentation, methodologies, and results from these experiments are presented.
authors.affiliation: Department of Chemistry, Texas A&M University, College Station, TX, 77842-3012, USA.
authors.forename: M J
authors.initials: MJ
authors.lastname: Eller
authors.forename: S V
authors.initials: SV
authors.lastname: Verkhoturov
authors.forename: F A
authors.initials: FA
authors.lastname: Fernandez-Lima
authors.forename: J D
authors.initials: JD
authors.lastname: Debord
authors.forename: E A
authors.initials: EA
authors.lastname: Schweikert
authors.forename: S
authors.initials: S
authors.lastname: Della-Negra
keywords: Cluster SIMS; Electron Emission; Electron Emission Microscope; Localization