title: Surface deformations as a necessary requirement for resistance switching at the surface of SrTiO3:N.
abstract: Atomic force microscopy (AFM), conductive AFM and electrochemical strain microscopy were used to study the topography change at the defect surface of SrTiO3:N, breakdown in the electrical conduction of the tip/sample/electrode system and ionic motion. The IV curves show resistance switching behavior in a voltage range ±6 V < U <± 10 V and a current of maximum ±10 nA. A series of sweeping IV curves resulted in an increase in ionically polarized states (surface charging), electrochemical volume (surface deformations) and sequential formations of stable surface protrusions. The surface deformations are reversible (U <± 5 V) without IV pinched hysteresis and remained stable during the resistance switching (U >± 6 V), revealing the additional necessity (albeit insufficient due to 50% yield of working cells) of surface protrusion formation for resistance switching memory.
authors.affiliation: The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA. Empa, Solid State Chemistry and Catalysis, CH-8600 Dübendorf, Switzerland. Forschüngszentrum Jülich, Peter Grünberg Institute (PGI-7), D-52425 Jülich, Germany.
authors.forename: Andrey
authors.initials: A
authors.lastname: Shkabko
authors.forename: Myriam H
authors.initials: MH
authors.lastname: Aguirre
authors.forename: Amit
authors.initials: A
authors.lastname: Kumar
authors.forename: Yunseok
authors.initials: Y
authors.lastname: Kim
authors.forename: Stephen
authors.initials: S
authors.lastname: Jesse
authors.forename: Rainer
authors.initials: R
authors.lastname: Waser
authors.forename: Sergei V
authors.initials: SV
authors.lastname: Kalinin
authors.forename: Anke
authors.initials: A
authors.lastname: Weidenkaff