title: Archaeometric study of black-coated pottery from Pompeii by different analytical techniques.
abstract: Complementary spectroscopic methods were used to characterize ceramic body and black coating of fine pottery found at Pompeii (Italy). This has enabled us to investigate local productions and to clarify the technological changes over the 4th-1st centuries BC. Two different groups of ceramics were originally distinguished on the basis of macroscopic observations. Optical microscopy (OM), X-ray diffraction (XRD) and X-ray fluorescence (XRF) seem to indicate the usage of the same raw materials for the production of black-coated ceramics at Pompeii for about three centuries. Raman microscopy (RM) and micro-analysis (SEM/EDS) suggest different production treatments for both raw material processing and firing practice (duration of the reducing step and the cooling rate).
authors.affiliation: Christopher Ingold Laboratories, University College London, 20 Gordon Street, London WC1H OAJ, UK; Department of Biology, Ecology and Earth Science, University of Calabria, via Pietro Bucci, 87036 Arcavacata di Rende, CS, Italy. Electronic address: roberta.scarpelli@unical.it.
authors.forename: Roberta
authors.initials: R
authors.lastname: Scarpelli
authors.affiliation: Christopher Ingold Laboratories, University College London, 20 Gordon Street, London WC1H OAJ, UK.
authors.forename: Robin J H
authors.initials: RJ
authors.lastname: Clark
authors.affiliation: Department of Biology, Ecology and Earth Science, University of Calabria, via Pietro Bucci, 87036 Arcavacata di Rende, CS, Italy.
authors.forename: Anna Maria
authors.initials: AM
authors.lastname: De Francesco
mesh_terms: D002516:Ceramics / Q000737:chemistry* / Q000266:history*; D049690:History, Ancient; D007558:Italy; D008422:Materials Testing; D008853:Microscopy; D008855:Microscopy, Electron, Scanning; D008903:Minerals / Q000032:analysis*; D013052:Spectrometry, X-Ray Emission; D014961:X-Ray Diffraction
chemical_list: D008903:Minerals
keywords: Black coating; Pompeii; Raman microscopy; SEM/EDS; XRF