title: [Correction method for infrared spectral emissivity measurement system based on integrating sphere reflectometer].
abstract: In view of the influence of non-ideal reference standard on spectral emissivity measurement, by analyzing the principle of infrared emissivity measurement system based on integrating sphere reflectometer, a calibration method suitable for measuring spectral emissivity system using the reflection measurement was proposed. By fitting a spectral reflectance curve of the reference standard sample to the given reflectance data, the correction coefficient of measurement system was computed. Then the output voltage curve of reference standard sample was corrected by this coefficient. The system error caused by the imperfection of reference standard was eliminated. The correction method was applied to the spectral emissivity measurement system based on integrating sphere reflectometer. The results measured by the corrected system and the results measured by energy comparison measurement were compared to verify the feasibility and effectivity of this correction method in improving the accuracy of spectral emissivity measurement.
authors.affiliation: School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin 150001, China. zyf81@aliyun.com
authors.forename: Yu-Feng
authors.initials: YF
authors.lastname: Zhang
authors.forename: Jing-Min
authors.initials: JM
authors.lastname: Dai
authors.forename: Yu
authors.initials: Y
authors.lastname: Zhang
authors.forename: Wei-Dong
authors.initials: WD
authors.lastname: Pan
authors.forename: Lei
authors.initials: L
authors.lastname: Zhang