title: Wave optics theory and 3-D deconvolution for the light field microscope.
abstract: Light field microscopy is a new technique for high-speed volumetric imaging of weakly scattering or fluorescent specimens. It employs an array of microlenses to trade off spatial resolution against angular resolution, thereby allowing a 4-D light field to be captured using a single photographic exposure without the need for scanning. The recorded light field can then be used to computationally reconstruct a full volume. In this paper, we present an optical model for light field microscopy based on wave optics, instead of previously reported ray optics models. We also present a 3-D deconvolution method for light field microscopy that is able to reconstruct volumes at higher spatial resolution, and with better optical sectioning, than previously reported. To accomplish this, we take advantage of the dense spatio-angular sampling provided by a microlens array at axial positions away from the native object plane. This dense sampling permits us to decode aliasing present in the light field to reconstruct high-frequency information. We formulate our method as an inverse problem for reconstructing the 3-D volume, which we solve using a GPU-accelerated iterative algorithm. Theoretical limits on the depth-dependent lateral resolution of the reconstructed volumes are derived. We show that these limits are in good agreement with experimental results on a standard USAF 1951 resolution target. Finally, we present 3-D reconstructions of pollen grains that demonstrate the improvements in fidelity made possible by our method.
authors.forename: Michael
authors.initials: M
authors.lastname: Broxton
authors.forename: Logan
authors.initials: L
authors.lastname: Grosenick
authors.forename: Samuel
authors.initials: S
authors.lastname: Yang
authors.forename: Noy
authors.initials: N
authors.lastname: Cohen
authors.forename: Aaron
authors.initials: A
authors.lastname: Andalman
authors.forename: Karl
authors.initials: K
authors.lastname: Deisseroth
authors.forename: Marc
authors.initials: M
authors.lastname: Levoy
mesh_terms: D000465:Algorithms; D003198:Computer Simulation; D017076:Computer-Aided Design; D004867:Equipment Design; D019544:Equipment Failure Analysis; D007090:Image Interpretation, Computer-Assisted / Q000379:methods*; D021621:Imaging, Three-Dimensional / Q000295:instrumentation*; D008027:Light; D008853:Microscopy / Q000295:instrumentation*; D008962:Models, Theoretical; D012542:Scattering, Radiation