title: Structured illumination quantitative phase microscopy for enhanced resolution amplitude and phase imaging.
abstract: Structured illumination microscopy (SIM) is an established microscopy technique typically used to image samples at resolutions beyond the diffraction limit. Until now, however, achieving sub-diffraction resolution has predominantly been limited to intensity-based imaging modalities. Here, we introduce an analogue to conventional SIM that allows sub-diffraction resolution, quantitative phase-contrast imaging of optically transparent objects. We demonstrate sub-diffraction resolution amplitude and quantitative-phase imaging of phantom targets and enhanced resolution quantitative-phase imaging of cells. We report a phase accuracy to within 5% and phase noise of 0.06 rad.
authors.affiliation: Department of Biomedical Engineering, Fitzpatrick Institute for Photonics, Duke University 136 Hudson Hall, Durham NC 27708, USA.
authors.forename: Shwetadwip
authors.initials: S
authors.lastname: Chowdhury
authors.forename: Joseph
authors.initials: J
authors.lastname: Izatt
keywords: (030.0030) Coherence and statistical optics; (100.6640) Superresolution; (180.0180) Microscopy