title: Quantification of deep traps in nanocrystal solids, their electronic properties, and their influence on device behavior.
abstract: We implement three complementary techniques to quantify the number, energy, and electronic properties of trap states in nanocrystal (NC)-based devices. We demonstrate that, for a given technique, the ability to observe traps depends on the Fermi level position, highlighting the importance of a multitechnique approach that probes trap coupling to both the conduction and the valence bands. We then apply our protocol for characterizing traps to quantitatively explain the measured performances of PbS NC-based solar cells.
authors.affiliation: Department of Information Technology and Electrical Engineering, ETH Zurich , Gloriastr. 35, 8092 Zurich, Switzerland.
authors.forename: Deniz
authors.initials: D
authors.lastname: Bozyigit
authors.forename: Sebastian
authors.initials: S
authors.lastname: Volk
authors.forename: Olesya
authors.initials: O
authors.lastname: Yarema
authors.forename: Vanessa
authors.initials: V
authors.lastname: Wood