title: Genetics of leaf blight resistance in wheat.
abstract: Studies on the genetics of leaf blight caused byAlternaria triticina using generation mean analysis revealed that additive components played a major role, but that dominance components also contributed significantly in controlling the variability for leaf blight resistance in wheat crosses. Furthermore, the additive x additive type of epistasis was predominant in the first three crosses, whereas in the fourth cross additive x dominance (j) and dominance x dominance (1) components of epistasis were most significant. Because of this it may be desirable to follow a simple recurrent selection scheme for higher tolerance, to isolate resistant plants from the segregating populations derived from crosses of parents of diverse origin following the pedigree method of breeding. CPAN-1887 was very tolerant to leaf blight in the present study and should be utilized in hybridization programs to develop leaf-blight-resistant varieties.
authors.affiliation: Department of Genetics and Plant Breeding, Institute of Agricultural Sciences, Banaras Hindu University, 221 005, Varanasi, India.
authors.forename: B
authors.initials: B
authors.lastname: Sinha
authors.forename: R M
authors.initials: RM
authors.lastname: Singh
authors.forename: U P
authors.initials: UP
authors.lastname: Singh