title: The electrically detected magnetic resonance microscope: combining conductive atomic force microscopy with electrically detected magnetic resonance.
abstract: We present the design and implementation of a scanning probe microscope, which combines electrically detected magnetic resonance (EDMR) and (photo-)conductive atomic force microscopy ((p)cAFM). The integration of a 3-loop 2-gap X-band microwave resonator into an AFM allows the use of conductive AFM tips as a movable contact for EDMR experiments. The optical readout of the AFM cantilever is based on an infrared laser to avoid disturbances of current measurements by absorption of straylight of the detection laser. Using amorphous silicon thin film samples with varying defect densities, the capability to detect a spatial EDMR contrast is demonstrated. Resonant current changes as low as 20 fA can be detected, allowing the method to realize a spin sensitivity of 8×10(6)spins/√Hz at room temperature.
authors.affiliation: Walter Schottky Institut, Technische Universität München, Am Coulombwall 4, 85748 Garching, Germany.
authors.forename: Konrad
authors.initials: K
authors.lastname: Klein
authors.forename: Benedikt
authors.initials: B
authors.lastname: Hauer
authors.forename: Benedikt
authors.initials: B
authors.lastname: Stoib
authors.forename: Markus
authors.initials: M
authors.lastname: Trautwein
authors.forename: Sonja
authors.initials: S
authors.lastname: Matich
authors.forename: Hans
authors.initials: H
authors.lastname: Huebl
authors.forename: Oleksandr
authors.initials: O
authors.lastname: Astakhov
authors.forename: Friedhelm
authors.initials: F
authors.lastname: Finger
authors.forename: Robert
authors.initials: R
authors.lastname: Bittl
authors.forename: Martin
authors.initials: M
authors.lastname: Stutzmann
authors.forename: Martin S
authors.initials: MS
authors.lastname: Brandt