Optimal mapping of x-ray laser diffraction patterns into three dimensions using routing algorithms.
Coherent diffractive imaging with x-ray free-electron lasers (XFEL) promises high-resolution structure determination of noncrystalline objects. Randomly oriented particles are exposed to XFEL pulses for acquisition of two-dimensional (2D) diffraction snapshots. The knowledge of their orientations enables 3D imaging by multiview reconstruction, combining 2D diffraction snapshots in different orientations. Here we introduce a globally optimal algorithm that can infer these orientations. We apply it to experimental XFEL data of nanoparticles and so determine their 3D electron density.
Max-Planck-Institut für medizinische Forschung, Jahnstr. 29, 69120 Heidelberg and Max Planck Advanced Study Group, Center for Free-Electron Laser Science (CFEL), Notkestr. 85, 22607 Hamburg, Germany.
Stephan
S
Kassemeyer
Aliakbar
A
Jafarpour
Lukas
L
Lomb
Jan
J
Steinbrener
Andrew V
AV
Martin
Ilme
I
Schlichting
D000465:Algorithms; D007091:Image Processing, Computer-Assisted / Q000379:methods*; D007834:Lasers; D017785:Photons; D012399:Rotation; D014961:X-Ray Diffraction