Durable resistance to two leaf blights in two maize inbred lines.
It has been determined that the occurrence of 'durable resistance' as defined by Johnson and Kranz operates in maize inbred lines CM104 and CM105 against the leaf blight pathogens Setosphaeria turcica (= Exserohilum turcicum) and Drechslera maydis (=Cochliobolus heterostrophus), by analyzing data for 16 and 14 years, respectively. Essentially the methodology estimated the longevity of cultivar resistance by determining whether the regression coefficient of linear regression with years of testing and mean disease intensity is zero or not significantly different from zero. The values for both Turcicum Leaf Blight and Maydis Leaf Blight were not significantly different from zero. The resistant inbred lines have been used in hybrid combinations and have the potential to transmit this resistance to progenies in hybrid combinations that are governed by additive gene action.
Division of Mycology and Plant Pathology, Indian Agricultural Research Institute, 110012, New Delhi, India.
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Sharma
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Payak