title: In situ TEM and STEM studies of reversible electromigration in thin palladium-platinum bridges.
abstract: We investigated the reversible electromigration in Pd-Pt nanobridges by means of in situ electron microscopy. Real-time nanometer-scale imaging with scanning transmission electron microscopy was used to determine the material transport. For high current densities (3-5 × 10(7) A cm(-2)), material transport occurs from the cathode towards the anode side, indicating a negative effective charge. The electromigration is dominated by atom diffusion at grain boundaries on the free surface. The reversal of material transport upon a change of the electric field direction could be the basis of a memristor.
authors.affiliation: Kavli Institute of Nanoscience, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, The Netherlands.
authors.forename: Tatiana
authors.initials: T
authors.lastname: Kozlova
authors.forename: Maria
authors.initials: M
authors.lastname: Rudneva
authors.forename: Henny W
authors.initials: HW
authors.lastname: Zandbergen