title: Optical sectioning by wide-field photobleaching imprinting microscopy.
abstract: We present a generic wide-field optical sectioning scheme, photobleaching imprinting microscopy (PIM), for depth-resolved cross-sectional fluorescence imaging. Wide-field PIM works by extracting a nonlinear component that depends on the excitation fluence as a result of photobleaching-induced fluorescence decay. Since no specific fluorescent dyes or illumination modules are required, wide-field PIM is easy to implement on a standard microscope. Moreover, wide-field PIM is superior to deconvolution microscopy in removing background fluorescence, yielding a six-fold improvement in image contrast.
authors.affiliation: Optical Imaging Laboratory, Department of Biomedical Engineering, Washington University in St. Louis, One Brookings Dr., St. Louis, Missouri 63130, USA.
authors.forename: Chiye
authors.initials: C
authors.lastname: Li
authors.forename: Liang
authors.initials: L
authors.lastname: Gao
authors.forename: Yan
authors.initials: Y
authors.lastname: Liu
authors.forename: Lihong V
authors.initials: LV
authors.lastname: Wang