title: Application of muonic X-rays for elemental analysis.
abstract: Because of the large μ mass compared to the electron mass, the muonic X-rays have energies very suitable for standard γ-ray spectroscopy (Ge detectors), so every element is easily recognized. By selecting the primary μ energies appropriately any part of the specimen, also well inside, can be nondestructively investigated. On the other hand, surface layers may be analyzed. Accuracies of quantitative analyses are 1% of the atomic abundance of the element in question in favorite cases. Results on applications in nuclear medicine and surface physics are presented, and ways of improving the muon flux density are discussed.
authors.affiliation: Physics Department, Technical University of Munich, Munich, FRG.
authors.forename: H
authors.initials: H
authors.lastname: Daniel