title: Cluster TOF-SIMS imaging as a tool for micrometric histology of lipids in tissue.
abstract: Recent developments in instrumentation, ion beams or analyzers, for cluster time-of-flight secondary ion mass spectrometry (TOF-SIMS) imaging are described here. The methods which are employed to increase the sensitivity or to perform three-dimensional analyses in the organic materials are also illustrated. This review shows the improvements made for lipid imaging by cluster TOF-SIMS in various types of material and applications, and gives reasons for the expansion of its utilization.
authors.affiliation: Centre de Recherche de Gif, Institut de Chimie des Substances Naturelles, CNRS, Avenue de la Terrasse, 91198, Gif-sur-Yvette Cedex, France.
authors.forename: Claudia
authors.initials: C
authors.lastname: Bich
authors.forename: David
authors.initials: D
authors.lastname: Touboul
authors.forename: Alain
authors.initials: A
authors.lastname: Brunelle
mesh_terms: D000818:Animals; D004867:Equipment Design; D006801:Humans; D007089:Image Enhancement / Q000295:instrumentation*; D050356:Lipid Metabolism / Q000502:physiology*; D008279:Magnetic Resonance Imaging / Q000295:instrumentation*; D009682:Magnetic Resonance Spectroscopy / Q000295:instrumentation*; D008832:Microchemistry / Q000295:instrumentation*; D057054:Molecular Imaging / Q000295:instrumentation*; D014018:Tissue Distribution
keywords: TOF-SIMS; clusters; lipids; mass spectrometry imaging