title: EFM data mapped into 2D images of tip-sample contact potential difference and capacitance second derivative.
abstract: We report a simple technique for mapping Electrostatic Force Microscopy (EFM) bias sweep data into 2D images. The method allows simultaneous probing, in the same scanning area, of the contact potential difference and the second derivative of the capacitance between tip and sample, along with the height information. The only required equipment consists of a microscope with lift-mode EFM capable of phase shift detection. We designate this approach as Scanning Probe Potential Electrostatic Force Microscopy (SPP-EFM). An open-source MATLAB Graphical User Interface (GUI) for images acquisition, processing and analysis has been developed. The technique is tested with Indium Tin Oxide (ITO) and with poly(3-hexylthiophene) (P3HT) nanowires for organic transistor applications.
authors.affiliation: 1] School of Physics and Astronomy, Cardiff University, Queens Buildings, The Parade, Cardiff CF243AA, United Kingdom [2] Masdar Institute of Science and Technology, PO Box 54224, Abu Dhabi, United Arab Emirates.
authors.forename: S
authors.initials: S
authors.lastname: Lilliu
authors.forename: C
authors.initials: C
authors.lastname: Maragliano
authors.forename: M
authors.initials: M
authors.lastname: Hampton
authors.forename: M
authors.initials: M
authors.lastname: Elliott
authors.forename: M
authors.initials: M
authors.lastname: Stefancich
authors.forename: M
authors.initials: M
authors.lastname: Chiesa
authors.forename: M S
authors.initials: MS
authors.lastname: Dahlem
authors.forename: J E
authors.initials: JE
authors.lastname: Macdonald