title: Three-dimensional rotation electron diffraction: softwareREDfor automated data collection and data processing.
abstract: Implementation of a computer program package for automated collection and processing of rotation electron diffraction (RED) data is described. The software package contains two computer programs:REDdata collection andREDdata processing. TheREDdata collection program controls the transmission electron microscope and the camera. Electron beam tilts at a fine step (0.05-0.20°) are combined with goniometer tilts at a coarse step (2.0-3.0°) around a common tilt axis, which allows a fine relative tilt to be achieved between the electron beam and the crystal in a large tilt range. An electron diffraction (ED) frame is collected at each combination of beam tilt and goniometer tilt. TheREDdata processing program processes three-dimensional ED data generated by theREDdata collection program or by other approaches. It includes shift correction of the ED frames, peak hunting for diffraction spots in individual ED frames and identification of these diffraction spots as reflections in three dimensions. Unit-cell parameters are determined from the positions of reflections in three-dimensional reciprocal space. All reflections are indexed, and finally a list withhklindices and intensities is output. The data processing program also includes a visualizer to view and analyse three-dimensional reciprocal lattices reconstructed from the ED frames. Details of the implementation are described. Data collection and data processing with the softwareREDare demonstrated using a calcined zeolite sample, silicalite-1. The structure of the calcined silicalite-1, with 72 unique atoms, could be solved from the RED data by routine direct methods.
authors.affiliation: Inorganic and Structural Chemistry and Berzelii Centre EXSELENT on Porous Materials, Department of Materials and Environmental Chemistry, Stockholm University, Arrhenius Laboratory, Stockholm SE-106 91, Sweden.
authors.forename: Wei
authors.initials: W
authors.lastname: Wan
authors.forename: Junliang
authors.initials: J
authors.lastname: Sun
authors.forename: Jie
authors.initials: J
authors.lastname: Su
authors.forename: Sven
authors.initials: S
authors.lastname: Hovmöller
authors.forename: Xiaodong
authors.initials: X
authors.lastname: Zou
keywords: computer programs; electron diffraction; electron diffraction tomography; rotation electron diffraction; structure analysis; three-dimensional electron diffraction