title: Far-field polarization characterization of the fundamental modes of a strip silicon waveguide.
abstract: The fundamental quasi-TE and quasi-TM modes of a sub-wavelength strip silicon waveguide are not purely TE or TM as the plane waves in free space. We investigate theoretically and experimentally the far-field polarization compositions of the two waveguide modes after they emanate from the waveguide facet. The measured polarization extinction ratios (PERs) of 31 dB for the quasi-TM mode and 26 dB for quasi-TE mode using free-space polarizers are consistent with our numerical analysis. Moreover, our far-field simulations show that the free-space measurement of PERs is influenced, and in many cases limited, by the sizes of various apertures in the experimental setup. This suggests a potential trade-off between achievable PERs and overall power detection/collection efficiency.
authors: Jian
authors: J
authors: Wang
authors: Justin C
authors: JC
authors: Wirth
authors: Yi
authors: Y
authors: Xuan
authors: Daniel E
authors: DE
authors: Leaird
authors: Andrew M
authors: AM
authors: Weiner
authors: Minghao
authors: M
authors: Qi
mesh_terms: D003198:Computer Simulation; D017076:Computer-Aided Design; D004867:Equipment Design; D019544:Equipment Failure Analysis; D008027:Light; D008962:Models, Theoretical; D012031:Refractometry / Q000295:instrumentation* / Q000379:methods*; D012542:Scattering, Radiation; D012825:Silicon / Q000737:chemistry*; D020349:Surface Plasmon Resonance / Q000295:instrumentation*
chemical_list: D012825:Silicon