title: Structured illumination for tomographic X-ray diffraction imaging.
abstract: Tomographic imaging of the molecular structure of an object is important for a variety of applications, ranging from medical and industrial radiography to security screening. X-ray diffraction imaging is the preeminent technique for performing molecular analysis of large volumes. Here we propose and demonstrate a new measurement architecture to improve the source and detector efficiency for diffraction imaging. In comparison with previous techniques, our approach reduces the required overall scan time by 1-2 orders of magnitude, which makes possible real-time scanning of a broad range of materials over a large volume using a table-top setup. This method, which relies on structuring spatially the illumination incident on an object moving relative to the X-ray source, is compatible with existing systems and has the potential to significantly enhance performance in an array of areas, such as medical diagnostic imaging and explosives detection.
authors: Department of Electrical and Computer Engineering, Duke University, Durham, NC, USA. dbrady@duke.edu.
authors: Joel A
authors: JA
authors: Greenberg
authors: Mehadi
authors: M
authors: Hassan
authors: Kalyani
authors: K
authors: Krishnamurthy
authors: David
authors: D
authors: Brady