title: Atomic structure from large-area, low-dose exposures of materials: a new route to circumvent radiation damage.
abstract: Beam-induced structural modifications are a major nuisance in the study of materials by high-resolution electron microscopy. Here, we introduce a new approach to circumvent the radiation damage problem by a statistical treatment of large, noisy, low-dose data sets of non-periodic configurations (e.g. defects) in the material. We distribute the dose over a mixture of different defect structures at random positions and with random orientations, and recover representative model images via a maximum likelihood search. We demonstrate reconstructions from simulated images at such low doses that the location of individual entities is not possible. The approach may open a route to study currently inaccessible beam-sensitive configurations.
authors: University of Vienna, Department of Physics, Vienna, Austria. Electronic address: jannik.meyer@univie.ac.at.
authors: J C
authors: JC
authors: Meyer
authors: University of Vienna, Department of Physics, Vienna, Austria.
authors: J
authors: J
authors: Kotakoski
authors: University of Vienna, Department of Physics, Vienna, Austria.
authors: C
authors: C
authors: Mangler
mesh_terms: D004583:Electrons / Q000009:adverse effects; D006108:Graphite / Q000737:chemistry / Q000528:radiation effects; D006147:Guanine / Q000737:chemistry / Q000528:radiation effects; D007091:Image Processing, Computer-Assisted / Q000706:statistics & numerical data; D016013:Likelihood Functions; D055641:Mathematical Concepts; D008854:Microscopy, Electron / Q000379:methods* / Q000706:statistics & numerical data; D017348:Microscopy, Electron, Scanning Transmission / Q000706:statistics & numerical data; D046529:Microscopy, Electron, Transmission / Q000706:statistics & numerical data; D015394:Molecular Structure
chemical_list: D006147:Guanine; D006108:Graphite
keywords: Electron microscopy; Low-dimensional materials; Maximum likelihood reconstructions; Radiation damage