title: Structured illumination fluorescence microscopy with distorted excitations using a filtered blind-SIM algorithm.
abstract: Structured illumination microscopy (SIM) is a powerful technique for obtaining super-resolved fluorescence maps of samples, but it is very sensitive to aberrations or misalignments affecting the excitation patterns. Here, we present a reconstruction algorithm that is able to process SIM data even if the illuminations are strongly distorted. The approach is an extension of the recent blind-SIM technique, which reconstructs simultaneously the sample and the excitation patterns without a priori information on the latter. Our algorithm was checked on synthetic and experimental data using distorted and nondistorted illuminations. The reconstructions were similar to that obtained by up-to-date SIM methods when the illuminations were periodic and remained artifact-free when the illuminations were strongly distorted.
authors: R
authors: R
authors: Ayuk
authors: H
authors: H
authors: Giovannini
authors: A
authors: A
authors: Jost
authors: E
authors: E
authors: Mudry
authors: J
authors: J
authors: Girard
authors: T
authors: T
authors: Mangeat
authors: N
authors: N
authors: Sandeau
authors: R
authors: R
authors: Heintzmann
authors: K
authors: K
authors: Wicker
authors: K
authors: K
authors: Belkebir
authors: A
authors: A
authors: Sentenac
mesh_terms: D000465:Algorithms; D016477:Artifacts; D007089:Image Enhancement / Q000379:methods*; D007090:Image Interpretation, Computer-Assisted / Q000379:methods*; D008029:Lighting / Q000379:methods*; D008856:Microscopy, Fluorescence / Q000379:methods*