title: Direct measurement of electrostatic fields using single Teflon nanoparticle attached to AFM tip.
abstract: A single 210-nm Teflon nanoparticle (sTNP) was attached to the vertex of a silicon nitride (Si3N4) atomic force microscope tip and charged via contact electrification. The charged sTNP can then be considered a point charge and used to measure the electrostatic field adjacent to a parallel plate condenser using 30-nm gold/20-nm titanium as electrodes. This technique can provide a measurement resolution of 250/100 nm along the X- and Z-axes, and the minimum electrostatic force can be measured within 50 pN. PACS: 07.79.Lh, 81.16.-c, 84.37. + q.
authors: Joe-Ming
authors: JM
authors: Chang
authors: Wei-Yu
authors: WY
authors: Chang
authors: Fu-Rong
authors: FR
authors: Chen
authors: Institute of NanoEngineering and MicroSystems, Hsinchu 30013, Taiwan. fangangt@gmail.com.
authors: Fan-Gang
authors: FG
authors: Tseng