title: Determination of the rough interface parameters using the self-imaging effect.
abstract: In this work, a linear grating is used to project a periodic light intensity distribution on a rough interface, and the near field transmitted light scattering is studied. It is shown theoretically that the intensity in the Fresnel regime depends on statistical properties of the rough interface and the light intensity period. The self-image contrast exponentially depends on the interface height-height correlation function. The correlation is obtained in terms of multiplication of the self-image number and the period of the light intensity distribution. Therefore, the roughness and the correlation length of the interface can be obtained by determining the contrast of the self-images when the light intensity period is smaller than the interface correlation length. For periods longer than twice the correlation length, the contrast measurements only provide the interface roughness. In experimental studies, the roughness of interfaces is determined by square gratings with periods much longer than the correlation lengths. The rough interfaces are prepared by roughening sheet glass by powders of different grit numbers. The results for different gratings and light wavelengths are quite consistent.
authors: Masoomeh
authors: M
authors: Dashtdar
authors: S
authors: S
authors: Mohammad Ali Hosseini Saber