title: High-resolution tomographic diffractive microscopy in reflection configuration.
abstract: Tomographic diffractive microscopy (TDM) is a label-free imaging technique that reconstructs the 3D refractive index map of the probed object with an improved resolution compared to confocal microscopy. In this work, we consider a TDM implementation in which the sample is deposited on a reflective substrate. We show that this configuration requires calibration and inversion procedures that account for the presence of the substrate for getting highly resolved quantitative reconstructions.
authors: Guillaume
authors: G
authors: Maire
authors: Yi
authors: Y
authors: Ruan
authors: Ting
authors: T
authors: Zhang
authors: Patrick C
authors: PC
authors: Chaumet
authors: Hugues
authors: H
authors: Giovannini
authors: Daniel
authors: D
authors: Sentenac
authors: Anne
authors: A
authors: Talneau
authors: Kamal
authors: K
authors: Belkebir
authors: Anne
authors: A
authors: Sentenac
mesh_terms: D000465:Algorithms; D005583:Fourier Analysis; D007091:Image Processing, Computer-Assisted / Q000379:methods*; D021621:Imaging, Three-Dimensional / Q000379:methods*; D008853:Microscopy / Q000379:methods*; D018613:Microscopy, Confocal / Q000379:methods*; D012031:Refractometry; D014054:Tomography / Q000379:methods*