title: Quantitative phase imaging via Fourier ptychographic microscopy.
abstract: Fourier ptychographic microscopy (FPM) is a recently developed imaging modality that uses angularly varying illumination to extend a system's performance beyond the limit defined by its optical components. The FPM technique applies a novel phase-retrieval procedure to achieve resolution enhancement and complex image recovery. In this Letter, we compare FPM data to theoretical prediction and phase-shifting digital holography measurement to show that its acquired phase maps are quantitative and artifact-free. We additionally explore the relationship between the achievable spatial and optical thickness resolution offered by a reconstructed FPM phase image. We conclude by demonstrating enhanced visualization and the collection of otherwise unobservable sample information using FPM's quantitative phase.
authors: Xiaoze
authors: X
authors: Ou
authors: Roarke
authors: R
authors: Horstmeyer
authors: Changhuei
authors: C
authors: Yang
authors: Guoan
authors: G
authors: Zheng
mesh_terms: D004867:Equipment Design; D019544:Equipment Failure Analysis; D005583:Fourier Analysis; D007089:Image Enhancement / Q000295:instrumentation* / Q000379:methods*; D008858:Microscopy, Phase-Contrast / Q000295:instrumentation* / Q000379:methods*; D012815:Signal Processing, Computer-Assisted / Q000295:instrumentation*