title: Accurate determination of terahertz optical constants by vector network analyzer of Fabry-Perot response.
abstract: We present a method based on a Fabry-Perot model to efficiently and accurately estimate optical constants of wafer samples in transmission-only measurements performed by a vector network analyzer (VNA). The method is demonstrated on two separate wafer samples: one of silicon and the other of polymethylmethacrylate. Results show that the method can not only acquire optical constants accurately and simply over a broad frequency domain but also overcome the limitations of calculation for dispersive and lossy materials to which existing methods are susceptible, such as those based on VNA-driven quasi-optical transmissometers and terahertz time-domain spectrometry.
authors.forename: Wenfeng
authors.initials: W
authors.lastname: Sun
authors.forename: Bin
authors.initials: B
authors.lastname: Yang
authors.forename: Xinke
authors.initials: X
authors.lastname: Wang
authors.forename: Yan
authors.initials: Y
authors.lastname: Zhang
authors.forename: Robert
authors.initials: R
authors.lastname: Donnan