title: Soft-X-ray ARPES facility at the ADRESS beamline of the SLS: concepts, technical realisation and scientific applications.
abstract: Soft-X-ray angle-resolved photoelectron spectroscopy (ARPES) with photon energies around 1 keV combines the momentum space resolution with increasing probing depth. The concepts and technical realisation of the new soft-X-ray ARPES endstation at the ADRESS beamline of SLS are described. The experimental geometry of the endstation is characterized by grazing X-ray incidence on the sample to increase the photoyield and vertical orientation of the measurement plane. The vacuum chambers adopt a radial layout allowing most efficient sample transfer. High accuracy of the angular resolution is ensured by alignment strategies focused on precise matching of the X-ray beam and optical axis of the analyzer. The high photon flux of up to 10(13) photons s(-1) (0.01% bandwidth)(-1) delivered by the beamline combined with the optimized experimental geometry break through the dramatic loss of the valence band photoexcitation cross section at soft-X-ray energies. ARPES images with energy resolution up to a few tens of meV are typically acquired on the time scale of minutes. A few application examples illustrate the power of our advanced soft-X-ray ARPES instrumentation to explore the electronic structure of bulk crystals with resolution in three-dimensional momentum, access buried heterostructures and study elemental composition of the valence states using resonant excitation.
authors.affiliation: Swiss Light Source, Paul Scherrer Institute, CH-5232 Villigen-PSI, Switzerland.
authors.forename: V N
authors.initials: VN
authors.lastname: Strocov
authors.affiliation: Swiss Light Source, Paul Scherrer Institute, CH-5232 Villigen-PSI, Switzerland.
authors.forename: X
authors.initials: X
authors.lastname: Wang
authors.affiliation: Swiss Light Source, Paul Scherrer Institute, CH-5232 Villigen-PSI, Switzerland.
authors.forename: M
authors.initials: M
authors.lastname: Shi
authors.affiliation: Swiss Light Source, Paul Scherrer Institute, CH-5232 Villigen-PSI, Switzerland.
authors.forename: M
authors.initials: M
authors.lastname: Kobayashi
authors.affiliation: Swiss Light Source, Paul Scherrer Institute, CH-5232 Villigen-PSI, Switzerland.
authors.forename: J
authors.initials: J
authors.lastname: Krempasky
authors.affiliation: Swiss Light Source, Paul Scherrer Institute, CH-5232 Villigen-PSI, Switzerland.
authors.forename: C
authors.initials: C
authors.lastname: Hess
authors.affiliation: Swiss Light Source, Paul Scherrer Institute, CH-5232 Villigen-PSI, Switzerland.
authors.forename: T
authors.initials: T
authors.lastname: Schmitt
authors.affiliation: Swiss Light Source, Paul Scherrer Institute, CH-5232 Villigen-PSI, Switzerland.
authors.forename: L
authors.initials: L
authors.lastname: Patthey
keywords: ADRESS beamline; Swiss Light Source; angle-resolved photoelectron spectroscopy; bulk sensitivity; buried heterostructures; electronic structure; resonant photoemission; soft-X-ray energy range; three-dimensional momentum