title: Tests and characterization of a laterally graded multilayer Montel mirror.
abstract: Multilayers are becoming an increasingly important tool in X-ray optics. The essential parameters to design a pair of laterally graded multilayer mirrors arranged in a Montel-type configuration for use as an X-ray collimating device are provided. The results of X-ray reflectometry tests carried out on the optics in addition to metrology characterization are also shown. Finally, using experimental data and combined with X-ray tracing simulations it is demonstrated that the mirror meets all stringent specifications as required for a novel ultra-high-resolution inelastic X-ray scattering spectrometer at the Advanced Photon Source.
authors.affiliation: Diamond Light Source Ltd, Harwell Science and Innovation Campus, Didcot OX11 0DE, UK.
authors.forename: K
authors.initials: K
authors.lastname: Mundboth
authors.affiliation: Diamond Light Source Ltd, Harwell Science and Innovation Campus, Didcot OX11 0DE, UK.
authors.forename: J
authors.initials: J
authors.lastname: Sutter
authors.affiliation: Diamond Light Source Ltd, Harwell Science and Innovation Campus, Didcot OX11 0DE, UK.
authors.forename: D
authors.initials: D
authors.lastname: Laundy
authors.affiliation: Diamond Light Source Ltd, Harwell Science and Innovation Campus, Didcot OX11 0DE, UK.
authors.forename: S
authors.initials: S
authors.lastname: Collins
authors.affiliation: Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA.
authors.forename: S
authors.initials: S
authors.lastname: Stoupin
authors.affiliation: Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA.
authors.forename: Y
authors.initials: Y
authors.lastname: Shvyd'ko
keywords: KB mirrors; Montel mirrors; X-ray optics; collimating optics; laterally graded multilayers