title: Study on the reflectivity properties of spherically bent analyser crystals.
abstract: Theoretical and experimental studies are presented on properties of spherically bent analyser crystals for high-resolution X-ray spectrometry. A correction to the bent-crystal strain field owing to its finite surface area is derived. The results are used to explain the reflectivity curves and anisotropic properties of Si(660) and Si(553) analysers in near-backscattering geometry. The results from the calculation agree very well with experimental results obtained using an inelastic X-ray scattering synchrotron beamline.
authors.affiliation: Department of Physics, PO Box 64, FI-00014 Helsinki, Finland.
authors.forename: Ari-Pekka
authors.initials: AP
authors.lastname: Honkanen
authors.affiliation: European Synchrotron Radiation Facility, BP 220, F-38043 Grenoble Cedex, France.
authors.forename: Roberto
authors.initials: R
authors.lastname: Verbeni
authors.affiliation: European Synchrotron Radiation Facility, BP 220, F-38043 Grenoble Cedex, France.
authors.forename: Laura
authors.initials: L
authors.lastname: Simonelli
authors.affiliation: European Synchrotron Radiation Facility, BP 220, F-38043 Grenoble Cedex, France.
authors.forename: Marco
authors.initials: M
authors.lastname: Moretti Sala
authors.affiliation: European Synchrotron Radiation Facility, BP 220, F-38043 Grenoble Cedex, France.
authors.forename: Giulio
authors.initials: G
authors.lastname: Monaco
authors.affiliation: Department of Physics, PO Box 64, FI-00014 Helsinki, Finland.
authors.forename: Simo
authors.initials: S
authors.lastname: Huotari
keywords: bent crystals; high-energy-resolution analysers; inelastic X-ray scattering