title: Investigation of the thermal stability of the carbon framework of graphene oxide.
abstract: In this study, we use our recently prepared graphene oxide (GO) with an almost intact σ-framework of carbon atoms (ai-GO) to probe the thermal stability of the carbon framework for the first time. Ai-GO exhibits few defects because CO2 formation is prevented during synthesis. Ai-GO was thermally treated before chemical reduction and the resulting defect density in graphene was subsequently determined by statistical Raman microscopy. Surprisingly, the carbon framework of ai-GO is stable in thin films up to 100 °C. Furthermore, we find evidence for an increase in the quality of ai-GO upon annealing at 50 °C before reduction. The carbon framework of GO prepared according to the popular Hummers' method (GO-c) appears to be less stable and decomposition starts at 50 °C, which is qualitatively indicated by CO2-trapping experiments in μm-thin films. Information about the stability of GO is important for storing, processing, and using GO in many applications.
authors.affiliation: Department of Chemistry and Pharmacy and Institute of Advanced Materials and Processes (ZMP), Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Henkestrasse 42, 91054 Erlangen and Dr.-Mack Strasse 81, 90762 Fürth (Germany), Fax: (+49) 911-6507865015. siegfried.eigler@fau.de.
authors.forename: Siegfried
authors.initials: S
authors.lastname: Eigler
authors.forename: Stefan
authors.initials: S
authors.lastname: Grimm
authors.forename: Andreas
authors.initials: A
authors.lastname: Hirsch
keywords: Raman spectroscopy; carbon framework; graphene oxide; reduction; stability