title: SWeRF--A method for estimating the relevant fine particle fraction in bulk materials for classification and labelling purposes.
abstract: In accordance with the European regulation for classification, labelling and packaging of substances and mixtures (CLP) as well as the criteria as set out in the Globally Harmonized System (GHS), fine fraction of crystalline silica (CS) has been classified as a specific target organ toxicity, the specific organ in this case being the lung. Generic cut-off values for products containing a fine fraction of CS trigger the need for a method for the quantification of the fine fraction of CS in bulk materials. This article describes the so-called SWeRF method, the size-weighted relevant fine fraction. The SWeRF method combines the particle size distribution of a powder with probability factors from the EN 481 standard and allows the relevant fine fraction of a material to be calculated. The SWeRF method has been validated with a number of industrial minerals. This will enable manufacturers and blenders to apply the CLP and GHS criteria for the classification of mineral products containing RCS a fine fraction of CS.
authors.affiliation: Sibelco Europe MineralsPlus (Ankerpoort NV), Op de Bos 300, NL-6223 EP Maastricht, The Netherlands;
authors.forename: Ingeborg
authors.initials: I
authors.lastname: Pensis
authors.forename: Frank
authors.initials: F
authors.lastname: Luetzenkirchen
authors.forename: Bernd
authors.initials: B
authors.lastname: Friede
mesh_terms: D000395:Air Pollutants, Occupational / Q000032:analysis; D004391:Dust / Q000032:analysis; D004784:Environmental Monitoring / Q000379:methods*; D005062:European Union; D033161:Government Regulation; D015386:Hazardous Substances / Q000032:analysis; D006801:Humans; D010316:Particle Size; D011336:Probability; D011356:Product Labeling / Q000331:legislation & jurisprudence / Q000592:standards*; D012822:Silicon Dioxide / Q000032:analysis* / Q000145:classification
chemical_list: D000395:Air Pollutants, Occupational; D004391:Dust; D015386:Hazardous Substances; D012822:Silicon Dioxide
keywords: CLP; GHS; SWeRF; crystalline silica; fine fraction of crystalline silica; industrial minerals; quartz