title: High-energy x-ray diffractometer for nondestructive strain depth profile measurement.
abstract: We describe a lab-based high-energy x-ray diffraction system and a new approach to nondestructively measuring strain profiles in polycrystalline samples. This technique utilizes the tungsten K(α1) characteristic radiation from a standard industrial x-ray tube. We introduce a simulation model that is used to determine strain values from data collected with this system. Examples of depth profiling are shown for shot peened aluminum and titanium samples. Profiles to 1 mm depth in aluminum and 300 μm depth in titanium with a depth resolution of 20 μm are presented.
authors.affiliation: Department of Physics, Yarmouk University, 21163 Irbid, Jordan.
authors.forename: M Y
authors.initials: MY
authors.lastname: Al-Shorman
authors.affiliation: Center for Nondestructive Evaluation, Iowa State University, Ames, Iowa 50011, USA.
authors.forename: T C
authors.initials: TC
authors.lastname: Jensen
authors.affiliation: Center for Nondestructive Evaluation, Iowa State University, Ames, Iowa 50011, USA.
authors.forename: J N
authors.initials: JN
authors.lastname: Gray