title: Lateral resolution enhancement of vertical scanning interferometry by sub-pixel sampling.
abstract: We apply common image enhancement principles and sub-pixel sample positioning to achieve a significant enhancement in the spatial resolution of a vertical scanning interferometer. We illustrate the potential of this new method using a standard atomic force microscope calibration grid and other materials having motifs of known lateral and vertical dimensions. This approach combines the high vertical resolution of vertical scanning interferometry and its native advantages (large field of view, rapid and nondestructive data acquisition) with important increases in lateral resolution. This combination offers the means to address a common challenge in microscopy: the integration of properties and processes that depend on, and vary as a function of observational length.
authors.affiliation: MARUM/Geowissenschaften FB5, Klagenfurter Straße, Universität Bremen, 28359 Bremen, Germany.
authors.forename: Rolf S
authors.initials: RS
authors.lastname: Arvidson
authors.affiliation: MARUM/Geowissenschaften FB5, Klagenfurter Straße, Universität Bremen, 28359 Bremen, Germany.
authors.forename: Cornelius
authors.initials: C
authors.lastname: Fischer
authors.affiliation: Department of Earth Science MS-126, Rice University, 6100 Main Street, Houston, TX 77005, USA.
authors.forename: Dale S
authors.initials: DS
authors.lastname: Sawyer
authors.affiliation: Bell Laboratories, Alcatel-Lucent, 600 Mountain Avenue, Murray Hill, NJ 07974, USA.
authors.forename: Gavin D
authors.initials: GD
authors.lastname: Scott
authors.affiliation: Department of Physics and Astronomy, Rice University, Houston, TX 77005, USA.
authors.forename: Douglas
authors.initials: D
authors.lastname: Natelson
authors.affiliation: MARUM/Geowissenschaften FB5, Klagenfurter Straße, Universität Bremen, 28359 Bremen, Germany.
authors.forename: Andreas
authors.initials: A
authors.lastname: Lüttge