title: [Lateral chromatic aberrations correction for AOTF imaging spectrometer based on doublet prism].
abstract: An user defined surface function method was proposed to model the acousto-optic interaction of AOTF based on wave-vector match principle. Assessment experiment result shows that this model can achieve accurate ray trace of AOTF diffracted beam. In addition, AOTF imaging spectrometer presents large residual lateral color when traditional chromatic aberrations correcting method is adopted. In order to reduce lateral chromatic aberrations, a method based on doublet prism is proposed. The optical material and angle of the prism are optimized automatically using global optimization with the help of user defined AOTF surface. Simulation result shows that the proposed method provides AOTF imaging spectrometer with great conveniences, which reduces the lateral chromatic aberration to less than 0.000 3 degrees and improves by one order of magnitude, with spectral image shift effectively corrected.
authors.affiliation: Key Laboratory of Precision Opto-mechatronics Technology, Ministry of Education, School of Instrumentation Science & Opto-electronics Engineering, Beijing University of Aeronautics and Astronautics, Beijing 100191, China. hjzhao@buaa.edu.cn
authors.forename: Hui-Jie
authors.initials: HJ
authors.lastname: Zhao
authors.affiliation: Key Laboratory of Precision Opto-mechatronics Technology, Ministry of Education, School of Instrumentation Science & Opto-electronics Engineering, Beijing University of Aeronautics and Astronautics, Beijing 100191, China.
authors.forename: Peng-Wei
authors.initials: PW
authors.lastname: Zhou
authors.affiliation: Key Laboratory of Precision Opto-mechatronics Technology, Ministry of Education, School of Instrumentation Science & Opto-electronics Engineering, Beijing University of Aeronautics and Astronautics, Beijing 100191, China.
authors.forename: Ying
authors.initials: Y
authors.lastname: Zhang
authors.affiliation: Key Laboratory of Precision Opto-mechatronics Technology, Ministry of Education, School of Instrumentation Science & Opto-electronics Engineering, Beijing University of Aeronautics and Astronautics, Beijing 100191, China.
authors.forename: Chong-Chong
authors.initials: CC
authors.lastname: Li