X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution.
X-ray ptychography is a scanning variant of coherent diffractive imaging with the ability to image large fields of view at high resolution. It further allows imaging of non-isolated specimens and can produce quantitative mapping of the electron density distribution in 3D when combined with computed tomography. The method does not require imaging lenses, which makes it dose efficient and suitable to multi-keV X-rays, where efficient photon counting, pixelated detectors are available. Here we present the first highly resolved quantitative X-ray ptychographic tomography of an extended object yielding 16 nm isotropic 3D resolution recorded at 2 Å wavelength. This first-of-its-kind demonstration paves the way for ptychographic X-ray tomography to become a promising method for X-ray imaging of representative sample volumes at unmatched resolution, opening tremendous potential for characterizing samples in materials science and biology by filling the resolution gap between electron microscopy and other X-ray imaging techniques.
Paul Scherrer Institut, 5232 Villigen PSI, Switzerland.
M
M
Holler
Paul Scherrer Institut, 5232 Villigen PSI, Switzerland.
A
A
Diaz
Paul Scherrer Institut, 5232 Villigen PSI, Switzerland.
M
M
Guizar-Sicairos
Paul Scherrer Institut, 5232 Villigen PSI, Switzerland.
P
P
Karvinen
Department of Chemistry, University of Helsinki, Helsinki, FI-00014, Finland.
Elina
E
Färm
Department of Chemistry, University of Helsinki, Helsinki, FI-00014, Finland.
Emma
E
Härkönen
Department of Chemistry, University of Helsinki, Helsinki, FI-00014, Finland.
Mikko
M
Ritala
Paul Scherrer Institut, 5232 Villigen PSI, Switzerland.
A
A
Menzel
Paul Scherrer Institut, 5232 Villigen PSI, Switzerland.
J
J
Raabe
Paul Scherrer Institut, 5232 Villigen PSI, Switzerland.
O
O
Bunk