title: Surface defect detection in tiling Industries using digital image processing methods: analysis and evaluation.
abstract: Ceramic and tile industries should indispensably include a grading stage to quantify the quality of products. Actually, human control systems are often used for grading purposes. An automatic grading system is essential to enhance the quality control and marketing of the products. Since there generally exist six different types of defects originating from various stages of tile manufacturing lines with distinct textures and morphologies, many image processing techniques have been proposed for defect detection. In this paper, a survey has been made on the pattern recognition and image processing algorithms which have been used to detect surface defects. Each method appears to be limited for detecting some subgroup of defects. The detection techniques may be divided into three main groups: statistical pattern recognition, feature vector extraction and texture/image classification. The methods such as wavelet transform, filtering, morphology and contourlet transform are more effective for pre-processing tasks. Others including statistical methods, neural networks and model-based algorithms can be applied to extract the surface defects. Although, statistical methods are often appropriate for identification of large defects such as Spots, but techniques such as wavelet processing provide an acceptable response for detection of small defects such as Pinhole. A thorough survey is made in this paper on the existing algorithms in each subgroup. Also, the evaluation parameters are discussed including supervised and unsupervised parameters. Using various performance parameters, different defect detection algorithms are compared and evaluated.
authors: Laboratory of Signals and Electronic Systems, Electrical and Computer Engineering Faculty, K.N. Toosi University of Technology, Shariati Avenue, Tehran 1355-16315, Iran.
authors: Mohammad H
authors: MH
authors: Karimi
authors: Laboratory of Signals and Electronic Systems, Electrical and Computer Engineering Faculty, K.N. Toosi University of Technology, Shariati Avenue, Tehran 1355-16315, Iran. Electronic address: Asemani@eetd.kntu.ac.ir.
authors: Davud
authors: D
authors: Asemani
keywords: Pattern recognition; Surface defect; Tiling