title: Nanometer scale alignment of block-copolymer domains by means of a scanning probe tip.
abstract: Alignment of perpendicularly oriented lamellar block copolymer domains using an AFM tip is demonstrated. The AFM tip orients the domains through local shearing, resulting in domain alignment parallel to tip travel. AFM tips can also deposit block copolymer nanostructures on heated substrates with a variety of experimentally observed domain alignments.
authors: Department of Mechanical Science and Engineering, University of Illinois Urbana-Champaign, 1206 W. Green St., Urbana, IL, 61801, United States.
authors: Jonathan R
authors: JR
authors: Felts
authors: M Serdar
authors: MS
authors: Onses
authors: John A
authors: JA
authors: Rogers
authors: William P
authors: WP
authors: King
keywords: block-copolymer lithography; shear alignment; tip-based nanofabrication