title: Contact-free scanning and imaging with the scanning ion conductance microscope.
abstract: Scanning ion conductance microscopy (SICM) offers the ability to obtain very high-resolution topographical images of living cells. One of the great advantages of SICM lies in its ability to perform contact-free scanning. However, it is not yet clear when the requirements for this scan mode are met. We have used finite element modeling (FEM) to examine the conditions for contact-free scanning. Our findings provide a framework for understanding the contact-free mode of SICM and also extend previous findings with regard to SICM resolution. Finally, we demonstrate the importance of our findings for accurate biological imaging.
authors: Department of Neuroscience, Physiology and Pharmacology, University College London , Gower Street, London WC1E 6BT, United Kingdom.
authors: Samantha
authors: S
authors: Del Linz
authors: Eero
authors: E
authors: Willman
authors: Matthew
authors: M
authors: Caldwell
authors: David
authors: D
authors: Klenerman
authors: Anibal
authors: A
authors: Fernández
authors: Guy
authors: G
authors: Moss
mesh_terms: D020342:Finite Element Analysis; D008853:Microscopy / Q000379:methods*; D008962:Models, Theoretical