title: Spatially resolved surface topography retrieved from far-field intensity scattering measurements.
abstract: A far-field setup based on the fast and simultaneous recording of 1 million intensity angle-resolved-light-scattering patterns allows both to reconstruct surface topography and to cancel local defects in this topography. A spectral analysis is performed on measured data and allows to extract roughness and slopes mapping of a surface taking into account the spectral bandpass.
authors: Myriam
authors: M
authors: Zerrad
authors: Michel
authors: M
authors: Lequime
authors: Claude
authors: C
authors: Amra