title: Using coherent X-ray ptychography to probe medium-range order.
abstract: Characterization of microscopic structural order and in particular medium range order (MRO) in amorphous materials is challenging. A new technique is demonstrated that allows analysis of MRO using X-rays. Diffraction data were collected from a sample consisting of densely packed polystyrene-latex micro-spheres. Ptychography is used to reconstruct the sample transmission function and fluctuation microscopy applied to characterize structural order producing a detailed `fluctuation map' allowing analysis of the sample at two distinct length scales. Independent verification is provided via X-ray diffractometry. Simulations of dense random packing of spheres have also been used to explore the origin of the structural order measured.
authors: A T J
authors: AT
authors: Torrance
authors: B
authors: B
authors: Abbey
authors: C T
authors: CT
authors: Putkunz
authors: D
authors: D
authors: Pelliccia
authors: E
authors: E
authors: Balaur
authors: G J
authors: GJ
authors: Williams
authors: D J
authors: DJ
authors: Vine
authors: A Y
authors: AY
authors: Nikulin
authors: I
authors: I
authors: McNulty
authors: H M
authors: HM
authors: Quiney
authors: K A
authors: KA
authors: Nugent