title: Non-binary phase gratings for x-ray imaging with a compact Talbot interferometer.
abstract: X-ray imaging using a Talbot-Lau interferometer, consisting of three binary gratings, is a well-established approach to acquire x-ray phase-contrast and dark-field images with a polychromatic source. However, challenges in the production of high aspect ratio gratings limit the construction of a compact setup for high x-ray energies. In this study we consider the use of phase gratings with triangular-shaped structures in an x-ray interferometer and show that such gratings can yield high visibilities for significantly shorter propagation distances than conventional gratings with binary structures. The findings are supported by simulation and experimental results for both cases of a monochromatic and a polychromatic source.
authors: Andre
authors: A
authors: Yaroshenko
authors: Martin
authors: M
authors: Bech
authors: Guillaume
authors: G
authors: Potdevin
authors: Andreas
authors: A
authors: Malecki
authors: Thomas
authors: T
authors: Biernath
authors: Johannes
authors: J
authors: Wolf
authors: Arne
authors: A
authors: Tapfer
authors: Markus
authors: M
authors: Schüttler
authors: Jan
authors: J
authors: Meiser
authors: Danays
authors: D
authors: Kunka
authors: Maximilian
authors: M
authors: Amberger
authors: Juergen
authors: J
authors: Mohr
authors: Franz
authors: F
authors: Pfeiffer
mesh_terms: D003198:Computer Simulation; D017076:Computer-Aided Design; D004867:Equipment Design; D019544:Equipment Failure Analysis; D007368:Interferometry / Q000295:instrumentation*; D008029:Lighting / Q000295:instrumentation*; D008962:Models, Theoretical; D012031:Refractometry / Q000295:instrumentation*; D014961:X-Ray Diffraction / Q000295:instrumentation*