title: Impact of interface roughness on the performance of broadband blackbody absorber based on dielectric-metal film multilayers.
abstract: We report on factors affecting the performance of a broadband, mid-IR absorber based on multiple, alternating dielectric / metal layers. In particular, we investigate the effect of interface roughness. Atomic layer deposition produces both a dramatic suppression of the interface roughness and a significant increase in the optical absorption as compared to devices fabricated using a conventional thermal evaporation source. Absorption characteristics greater than 80% across a 300 K black body spectrum are achieved. We demonstrate a further increase in this absorption via the inclusion of a patterned, porous anti-reflection layer.
authors: Shy-hauh
authors: SH
authors: Guo
authors: Andrei B
authors: AB
authors: Sushkov
authors: Dong Hun
authors: DH
authors: Park
authors: H Dennis
authors: HD
authors: Drew
authors: Paul W
authors: PW
authors: Kolb
authors: Warren N
authors: WN
authors: Herman
authors: Raymond J
authors: RJ
authors: Phaneuf