title: [Research on electron density in DC needle-plate corona discharge at atmospheric pressure].
abstract: Using needle-plate discharge device, corona discharge experiment was done in the atmosphere. Through photo of spot size of light-emitting area, the relationship between the voltage and thickness of corona layer was discussed. When the distance between tip and plate is fixed, the thickness of corona layer increases with the increase in voltage; when the voltage is fixed, the thickness of corona layer decreases with the increase in the distance between tip and plate. As spectral intensity of N2 (C3pi(u)) (337.1 nm)reflects high energy electron density, it was measured with emission spectrometry. The results show that high energy electron density is the biggest near the needle tip and the relationship between high energy electron density and voltage is basically linear increasing. Fixing voltage, high energy electron density decreases with the increase in the distance between tip and plate. When the voltage and the distance between tip and plate are fixed, the high energy electron density increases with the decrease in the curvature radius of needle tip. These results are of great importance for the study of plasma parameters of corona discharge.
authors.affiliation: Electrostatic Research Institute of Hebei University, Baoding 071002, China. lzq@hbu.edu.cn
authors.forename: Zhi-Qiang
authors.initials: ZQ
authors.lastname: Liu
authors.affiliation: Electrostatic Research Institute of Hebei University, Baoding 071002, China.
authors.forename: Wei
authors.initials: W
authors.lastname: Guo
authors.affiliation: Electrostatic Research Institute of Hebei University, Baoding 071002, China.
authors.forename: Tao-Tao
authors.initials: TT
authors.lastname: Liu
authors.affiliation: Electrostatic Research Institute of Hebei University, Baoding 071002, China.
authors.forename: Wen-Shuo
authors.initials: WS
authors.lastname: Wu
authors.affiliation: Electrostatic Research Institute of Hebei University, Baoding 071002, China.
authors.forename: Shu-Min
authors.initials: SM
authors.lastname: Liu