title: Laser-induced instabilities in liquid crystal cells with a photosensitive substrate.
abstract: Liquid crystal layers sandwiched between a reference plate and a photosensitive substrate were investigated. We focused on the reverse geometry, where the cell was illuminated by a laser beam from the reference side. In planar cells both static and dynamic instabilities occurred, depending on the angle between the laser polarization and the director orientation on the reference plate. In cells where the molecules were aligned along the normal of the reference plate, a dynamic pattern was observed at all angles of polarization. A simple model based on a photoinduced surface torque accounts for the findings. Light scattering studies revealed some basic properties of the instabilities.
authors.affiliation: Institute for Solid State Physics and Optics, Wigner Research Centre for Physics, Hungarian Academy of Sciences, H-1525 Budapest, P. O. Box 49, Hungary.
authors.forename: István
authors.initials: I
authors.lastname: Jánossy
authors.affiliation: Institute for Solid State Physics and Optics, Wigner Research Centre for Physics, Hungarian Academy of Sciences, H-1525 Budapest, P. O. Box 49, Hungary.
authors.forename: Katalin
authors.initials: K
authors.lastname: Fodor-Csorba
authors.affiliation: Institute for Solid State Physics and Optics, Wigner Research Centre for Physics, Hungarian Academy of Sciences, H-1525 Budapest, P. O. Box 49, Hungary.
authors.forename: Anikó
authors.initials: A
authors.lastname: Vajda
authors.affiliation: Institute for Solid State Physics and Optics, Wigner Research Centre for Physics, Hungarian Academy of Sciences, H-1525 Budapest, P. O. Box 49, Hungary.
authors.forename: Tibor
authors.initials: T
authors.lastname: Tóth-Katona
mesh_terms: D003198:Computer Simulation; D007834:Lasers; D050866:Liquid Crystals / Q000737:chemistry* / Q000528:radiation effects*; D008956:Models, Chemical; D008958:Models, Molecular; D008968:Molecular Conformation / Q000528:radiation effects; D011829:Radiation Dosage; D012031:Refractometry / Q000379:methods*; D013499:Surface Properties / Q000528:radiation effects