title: Birefringence-induced wavelength mismatch between the polarization rotation and resonant modes in magnetophotonic structures containing nematic layers.
abstract: The present work is devoted to the study of spectral characteristics of normal incident light transmitted by a multilayered structure composed of an alternated sequence of nematic and magnetic layers presenting a central magneto-optical defect. Using the Berreman 4 × 4 matrix formalism, we numerically obtain the transmission spectrum and the polarization rotation angle of the system as a function of the nematic optical axis direction. Our results reveal the emergence of a shift between the wavelengths of the resonant mode and polarization rotation angle, which strongly depends on the birefringence of the nematic layers. In particular, we show the existence of distinct regimes for the wavelength mismatch between the transmission of resonant modes and the maximum polarization rotation angle, which are governed by the ordinary and extraordinary refractive indices of nematic layers. The mechanism behind such shift is discussed under the light of propagation eigenmodes for a medium presenting circular and linear birefringence. The effects associated with the defect thickness are also analyzed.
authors.affiliation: Instituto de Física, Universidade Federal de Alagoas 57072-970 Maceió-AL, Brazil.
authors.forename: R R
authors.initials: RR
authors.lastname: da Silva
authors.affiliation: Universidade Federal de Alagoas, Campus Arapiraca, 57309-005 Arapiraca-AL, Brazil.
authors.forename: F M
authors.initials: FM
authors.lastname: Zanetti
authors.affiliation: Instituto de Física, Universidade Federal de Alagoas 57072-970 Maceió-AL, Brazil.
authors.forename: I N
authors.initials: IN
authors.lastname: de Oliveira
mesh_terms: D016880:Anisotropy; D001718:Birefringence; D003198:Computer Simulation; D008027:Light; D050866:Liquid Crystals / Q000737:chemistry* / Q000528:radiation effects*; D060526:Magnetic Fields; D008956:Models, Chemical; D008958:Models, Molecular; D012031:Refractometry / Q000379:methods*