title: High-resolution multislice x-ray ptychography of extended thick objects.
abstract: We report the first demonstration of hard x-ray ptychography using a multislice approach, which can solve the problem of the limited spatial resolution under the projection approximation. We measured ptychographic diffraction patterns of a two-layered object with a 105  μm gap using 7 keV focused coherent x rays. We successfully reconstructed the phase map of each layer at ∼50  nm resolution using a multislice approach, while the resolution was worse than ∼192  nm under the projection approximation. The present method has the potential to enable the three-dimensional high-resolution observation of extended thick specimens in materials science and biology.
authors.affiliation: Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan.
authors.forename: Akihiro
authors.initials: A
authors.lastname: Suzuki
authors.affiliation: Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan.
authors.forename: Shin
authors.initials: S
authors.lastname: Furutaku
authors.affiliation: Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan.
authors.forename: Kei
authors.initials: K
authors.lastname: Shimomura
authors.affiliation: Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan.
authors.forename: Kazuto
authors.initials: K
authors.lastname: Yamauchi
authors.affiliation: RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo-cho, Sayo, Hyogo 679-5148, Japan.
authors.forename: Yoshiki
authors.initials: Y
authors.lastname: Kohmura
authors.affiliation: RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo-cho, Sayo, Hyogo 679-5148, Japan.
authors.forename: Tetsuya
authors.initials: T
authors.lastname: Ishikawa
authors.affiliation: Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan.
authors.forename: Yukio
authors.initials: Y
authors.lastname: Takahashi