title: Effects of roughness and temperature on low-energy hydrogen positive and negative ion reflection from silicon and carbon surfaces.
abstract: Angle-resolved energy distribution functions of positive and negative hydrogen ions produced from a rough-finished Si surface under 1 keV proton irradiation have been measured. The corresponding distribution from a crystalline surface and a carbon surface are also measured for comparison. Intensities of positive and negative ions from the rough-finished Si are substantially smaller than those from crystalline Si. The angular distributions of these species are broader for rough surface than the crystalline surface. No significant temperature dependence for positive and negative ion intensities is observed for all samples in the temperature range from 300 to 400 K.
authors.affiliation: Institute of Laser Engineering, Osaka University, Suita, Osaka 565-0871, Japan.
authors.forename: N
authors.initials: N
authors.lastname: Tanaka
authors.affiliation: Graduate School of Science and Engineering, Doshisha University, Kyotanabe, Kyoto 610-0321, Japan.
authors.forename: S
authors.initials: S
authors.lastname: Kato
authors.affiliation: Graduate School of Science and Engineering, Doshisha University, Kyotanabe, Kyoto 610-0321, Japan.
authors.forename: T
authors.initials: T
authors.lastname: Miyamoto
authors.affiliation: National Institute for Fusion Science, Toki, Gifu 509-5292, Japan.
authors.forename: M
authors.initials: M
authors.lastname: Nishiura
authors.affiliation: National Institute for Fusion Science, Toki, Gifu 509-5292, Japan.
authors.forename: K
authors.initials: K
authors.lastname: Tsumori
authors.affiliation: Tokushima Bunri University, Yamashiro, Tokushima 770-8514, Japan.
authors.forename: Y
authors.initials: Y
authors.lastname: Matsumoto
authors.affiliation: Faculty of Life and Medical Sciences, Doshisha University, Kyotanabe, Kyoto 610-0321, Japan.
authors.forename: T
authors.initials: T
authors.lastname: Kenmotsu
authors.affiliation: School of Engineering, Tohoku University, Aoba, Sendai, Miyagi 980-8579, Japan.
authors.forename: A
authors.initials: A
authors.lastname: Okamoto
authors.affiliation: School of Engineering, Tohoku University, Aoba, Sendai, Miyagi 980-8579, Japan.
authors.forename: S
authors.initials: S
authors.lastname: Kitajima
authors.affiliation: Organization for Research Initiatives and Development, Doshisha University, Kyotanabe, Kyoto 610-0321, Japan.
authors.forename: M
authors.initials: M
authors.lastname: Sasao
authors.affiliation: Graduate School of Science and Engineering, Doshisha University, Kyotanabe, Kyoto 610-0321, Japan.
authors.forename: M
authors.initials: M
authors.lastname: Wada
authors.affiliation: RIKEN SPring-8 Center, Mikazuki, Sayo, Hyogo 679-5148, Japan.
authors.forename: H
authors.initials: H
authors.lastname: Yamaoka
mesh_terms: D002244:Carbon / Q000737:chemistry*; D006859:Hydrogen / Q000737:chemistry*; D055620:Optical Phenomena; D012825:Silicon / Q000737:chemistry*; D013499:Surface Properties; D013696:Temperature
chemical_list: D002244:Carbon; D006859:Hydrogen; D012825:Silicon