title: Numerical simulation of ion charge breeding in electron beam ion source.
abstract: The Electron Beam Ion Source particle-in-cell code (EBIS-PIC) tracks ions in an EBIS electron beam while updating electric potential self-consistently and atomic processes by the Monte Carlo method. Recent improvements to the code are reported in this paper. The ionization module has been improved by using experimental ionization energies and shell effects. The acceptance of injected ions and the emittance of extracted ion beam are calculated by extending EBIS-PIC to the beam line transport region. An EBIS-PIC simulation is performed for a Cs charge-breeding experiment at BNL. The charge state distribution agrees well with experiments, and additional simulation results of radial profiles and velocity space distributions of the trapped ions are presented.
authors.affiliation: FAR-TECH, Inc., San Diego, California 92122, USA.
authors.forename: L
authors.initials: L
authors.lastname: Zhao
authors.affiliation: FAR-TECH, Inc., San Diego, California 92122, USA.
authors.forename: Jin-Soo
authors.initials: JS
authors.lastname: Kim