title: Measurement of enhanced radiation force on a parallel metallic-plate system in the microwave regime.
abstract: We measure the force exerted by microwave radiation on a centimeter-sized parallel-plate metallic resonant unit. By varying the ambient environment, we distinguish carefully between the direct radiation force and the indirect photothermal component. At the microwave resonance, the former is measured quantitatively to be 100 times larger than the conventional radiation force. Furthermore, the enhanced radiation force tends to increase the separation of the plates. Both the direction and the magnitude of the measured force agree well with numerical calculations.
authors.affiliation: Department of Physics, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong, China and William Mong Institute of Nano Science and Technology, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong, China and Department of Physics, University of Florida, Gainesville, Florida 32611, USA.
authors.forename: Z
authors.initials: Z
authors.lastname: Marcet
authors.affiliation: Department of Physics, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong, China and School of Physical Science and Technology, Soochow University, 1 Shizi Street, Suzhou 215006, China.
authors.forename: Z H
authors.initials: ZH
authors.lastname: Hang
authors.affiliation: Department of Physics, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong, China and William Mong Institute of Nano Science and Technology, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong, China.
authors.forename: S B
authors.initials: SB
authors.lastname: Wang
authors.affiliation: Department of Physics and Institute of Computational and Theoretical Studies, Hong Kong Baptist University, Kowloon Tong, Hong Kong, China.
authors.forename: J
authors.initials: J
authors.lastname: Ng
authors.affiliation: Department of Physics, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong, China and Institute for Advanced Study, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong, China.
authors.forename: C T
authors.initials: CT
authors.lastname: Chan
authors.affiliation: Department of Physics, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong, China and William Mong Institute of Nano Science and Technology, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong, China.
authors.forename: H B
authors.initials: HB
authors.lastname: Chan