title: Mapping of charge distribution in organic field-effect transistors by confocal photoluminescence electromodulation microscopy.
abstract: A novel method for mapping the charge density spatial distribution in organic field-effect transistors based on the electromodulation of the photoluminescence is demonstrated. In field-effect transistors exciton quenching is dominated by exciton-charge carrier interaction so that it can be used to map the charge distribution in different operating conditions. From a quantitative analysis of the photoluminescence quenching, the thickness of the charge carrier accumulation layer is derived. The injection of minority charge carriers in unipolar conditions is unexpectedly evidenced, which is not displayed by the electrical characteristics.
authors.affiliation: CNR-ISMN , Bologna Via P. Gobetti 101, 40129 Bologna (BO), Italy.
authors.forename: Wouter W A
authors.initials: WW
authors.lastname: Koopman
authors.forename: Stefano
authors.initials: S
authors.lastname: Toffanin
authors.forename: Marco
authors.initials: M
authors.lastname: Natali
authors.forename: Stefano
authors.initials: S
authors.lastname: Troisi
authors.forename: Raffaella
authors.initials: R
authors.lastname: Capelli
authors.forename: Viviana
authors.initials: V
authors.lastname: Biondo
authors.forename: Andrea
authors.initials: A
authors.lastname: Stefani
authors.forename: Michele
authors.initials: M
authors.lastname: Muccini