title: [Determination of film thickness, component and content based on glass surface by using XRF spectrometry].
abstract: Film thickness, component and content based on glass surface were determined by using XRF technic, measure condition and instrument work condition in every layer were set and adjusted for the best measure effect for every element. Background fundamental parameter (BG-FP) method was built up. Measure results with this method were consistent with the actual preparation course and the method could fit to production application.
authors.affiliation: College of Materials Science and Engineering, Beijing University of Technology, Beijing, China. meiyan@bjut.edu.cn
authors.forename: Yan
authors.initials: Y
authors.lastname: Mei
authors.affiliation: Special Education College of Beijing Union University, Beijing 100075, China
authors.forename: Mi-Xia
authors.initials: MX
authors.lastname: Ma
authors.affiliation: College of Materials Science and Engineering, Beijing University of Technology, Beijing, China.
authors.forename: Zuo-Ren
authors.initials: ZR
authors.lastname: Nie