title: Detection of epileptic seizure event and onset using EEG.
abstract: This study proposes a method of automatic detection of epileptic seizure event and onset using wavelet based features and certain statistical features without wavelet decomposition. Normal and epileptic EEG signals were classified using linear classifier. For seizure event detection, Bonn University EEG database has been used. Three types of EEG signals (EEG signal recorded from healthy volunteer with eye open, epilepsy patients in the epileptogenic zone during a seizure-free interval, and epilepsy patients during epileptic seizures) were classified. Important features such as energy, entropy, standard deviation, maximum, minimum, and mean at different subbands were computed and classification was done using linear classifier. The performance of classifier was determined in terms of specificity, sensitivity, and accuracy. The overall accuracy was 84.2%. In the case of seizure onset detection, the database used is CHB-MIT scalp EEG database. Along with wavelet based features, interquartile range (IQR) and mean absolute deviation (MAD) without wavelet decomposition were extracted. Latency was used to study the performance of seizure onset detection. Classifier gave a sensitivity of 98.5% with an average latency of 1.76 seconds.
authors.affiliation: Department of Electrical Engineering, National Institute of Technology, Calicut, Kerala 673601, India.
authors.forename: Nabeel
authors.initials: N
authors.lastname: Ahammad
authors.affiliation: Department of Electrical Engineering, National Institute of Technology, Calicut, Kerala 673601, India.
authors.forename: Thasneem
authors.initials: T
authors.lastname: Fathima
authors.affiliation: Department of Electrical Engineering, National Institute of Technology, Calicut, Kerala 673601, India.
authors.forename: Paul
authors.initials: P
authors.lastname: Joseph
mesh_terms: D000465:Algorithms; D019992:Databases as Topic; D004569:Electroencephalography; D004827:Epilepsy / Q000175:diagnosis*; D006801:Humans; D058067:Wavelet Analysis