title: Specimen-thickness effects on transmission Kikuchi patterns in the scanning electron microscope.
abstract: We report the effects of varying specimen thickness on the generation of transmission Kikuchi patterns in the scanning electron microscope. Diffraction patterns sufficient for automated indexing were observed from films spanning nearly three orders of magnitude in thickness in several materials, from 5 nm of hafnium dioxide to 3 μm of aluminum, corresponding to a mass-thickness range of ~5 to 810 μg cm(-2) . The scattering events that are most likely to be detected in transmission are shown to be very near the exit surface of the films. The energies, spatial distribution and trajectories of the electrons that are transmitted through the film and are collected by the detector are predicted using Monte Carlo simulations.
authors.affiliation: Applied Chemicals and Materials Division, National Institute of Standards and Technology, Boulder, Colorado, U.S.A.
authors.forename: K P
authors.initials: KP
authors.lastname: Rice
authors.forename: R R
authors.initials: RR
authors.lastname: Keller
authors.forename: M P
authors.initials: MP
authors.lastname: Stoykovich
keywords: Monte Carlo simulations; scanning electron microscopy; transmission EBSD; transmission kikuchi diffraction; ultrathin films