title: Noise and analyzer-crystal angular position analysis for analyzer-based phase-contrast imaging.
abstract: The analyzer-based phase-contrast x-ray imaging (ABI) method is emerging as a potential alternative to conventional radiography. Like many of the modern imaging techniques, ABI is a computed imaging method (meaning that images are calculated from raw data). ABI can simultaneously generate a number of planar parametric images containing information about absorption, refraction, and scattering properties of an object. These images are estimated from raw data acquired by measuring (sampling) the angular intensity profile of the x-ray beam passed through the object at different angular positions of the analyzer crystal. The noise in the estimated ABI parametric images depends upon imaging conditions like the source intensity (flux), measurements angular positions, object properties, and the estimation method. In this paper, we use the Cramér-Rao lower bound (CRLB) to quantify the noise properties in parametric images and to investigate the effect of source intensity, different analyzer-crystal angular positions and object properties on this bound, assuming a fixed radiation dose delivered to an object. The CRLB is the minimum bound for the variance of an unbiased estimator and defines the best noise performance that one can obtain regardless of which estimation method is used to estimate ABI parametric images. The main result of this paper is that the variance (hence the noise) in parametric images is directly proportional to the source intensity and only a limited number of analyzer-crystal angular measurements (eleven for uniform and three for optimal non-uniform) are required to get the best parametric images. The following angular measurements only spread the total dose to the measurements without improving or worsening CRLB, but the added measurements may improve parametric images by reducing estimation bias. Next, using CRLB we evaluate the multiple-image radiography, diffraction enhanced imaging and scatter diffraction enhanced imaging estimation techniques, though the proposed methodology can be used to evaluate any other ABI parametric image estimation technique.
authors.affiliation: Department of Electrical and Computer Engineering, Illinois Institute of Technology, Chicago, IL 60616, USA.
authors.forename: Keivan
authors.initials: K
authors.lastname: Majidi
authors.forename: Jun
authors.initials: J
authors.lastname: Li
authors.forename: Carol
authors.initials: C
authors.lastname: Muehleman
authors.forename: Jovan G
authors.initials: JG
authors.lastname: Brankov
mesh_terms: D007091:Image Processing, Computer-Assisted; D008962:Models, Theoretical; D011859:Radiography / Q000379:methods*; D059629:Signal-To-Noise Ratio