title: Nanoscale topography and spatial light modulator characterization using wide-field quantitative phase imaging.
abstract: We demonstrate an optical technique for large field of view quantitative phase imaging of reflective samples. It relies on a common-path interferometric design, which ensures high stability without the need for active stabilization. The technique provides single-shot, full-field and robust measurement of nanoscale topography of large samples. Further, the inherent stability allows reliable measurement of the temporally varying phase retardation of the liquid crystal cells, and thus enables real-time characterization of spatial light modulators. The technique's application potential is validated through experimental results.
authors.forename: Gannavarpu
authors.initials: G
authors.lastname: Rajshekhar
authors.forename: Basanta
authors.initials: B
authors.lastname: Bhaduri
authors.forename: Chris
authors.initials: C
authors.lastname: Edwards
authors.forename: Renjie
authors.initials: R
authors.lastname: Zhou
authors.forename: Lynford L
authors.initials: LL
authors.lastname: Goddard
authors.forename: Gabriel
authors.initials: G
authors.lastname: Popescu
mesh_terms: D007368:Interferometry / Q000295:instrumentation*; D050866:Liquid Crystals / Q000737:chemistry*; D008422:Materials Testing / Q000379:methods*; D053758:Nanoparticles / Q000737:chemistry* / Q000648:ultrastructure*; D012031:Refractometry / Q000295:instrumentation*; D013499:Surface Properties