title: 2D electron temperature diagnostic using soft x-ray imaging technique.
abstract: We have developed a two-dimensional (2D) electron temperature (T(e)) diagnostic system for thermal structure studies in a low-aspect-ratio reversed field pinch (RFP). The system consists of a soft x-ray (SXR) camera with two pin holes for two-kinds of absorber foils, combined with a high-speed camera. Two SXR images with almost the same viewing area are formed through different absorber foils on a single micro-channel plate (MCP). A 2D Te image can then be obtained by calculating the intensity ratio for each element of the images. We have succeeded in distinguishing T(e) image in quasi-single helicity (QSH) from that in multi-helicity (MH) RFP states, where the former is characterized by concentrated magnetic fluctuation spectrum and the latter, by broad spectrum of edge magnetic fluctuations.
authors.affiliation: Department of Electronics, Kyoto Institute of Technology, Kyoto 606-8585, Japan.
authors.forename: K
authors.initials: K
authors.lastname: Nishimura
authors.affiliation: Department of Electronics, Kyoto Institute of Technology, Kyoto 606-8585, Japan.
authors.forename: A
authors.initials: A
authors.lastname: Sanpei
authors.affiliation: Department of Electronics, Kyoto Institute of Technology, Kyoto 606-8585, Japan.
authors.forename: H
authors.initials: H
authors.lastname: Tanaka
authors.affiliation: Department of Electronics, Kyoto Institute of Technology, Kyoto 606-8585, Japan.
authors.forename: G
authors.initials: G
authors.lastname: Ishii
authors.affiliation: Department of Electronics, Kyoto Institute of Technology, Kyoto 606-8585, Japan.
authors.forename: R
authors.initials: R
authors.lastname: Kodera
authors.affiliation: Department of Electronics, Kyoto Institute of Technology, Kyoto 606-8585, Japan.
authors.forename: R
authors.initials: R
authors.lastname: Ueba
authors.affiliation: Department of Electronics, Kyoto Institute of Technology, Kyoto 606-8585, Japan.
authors.forename: H
authors.initials: H
authors.lastname: Himura
authors.affiliation: Department of Electronics, Kyoto Institute of Technology, Kyoto 606-8585, Japan.
authors.forename: S
authors.initials: S
authors.lastname: Masamune
authors.affiliation: National Institute for Fusion Science, 322-6 Oroshi-cho, Toki 509-5292, Japan.
authors.forename: S
authors.initials: S
authors.lastname: Ohdachi
authors.affiliation: National Institute for Fusion Science, 322-6 Oroshi-cho, Toki 509-5292, Japan.
authors.forename: N
authors.initials: N
authors.lastname: Mizuguchi