title: Diffused reflectance and structure analysis for the nano-matrix (ZnO(1-x)SiO2(x)) system.
abstract: Optical and structural properties of the investigated matrix ZnO(1-x)SiO2(x) system were characterized by various techniques such as X-ray analysis and UV-VIS-NIR absorption. The structural changes of the studied nano-matrix ZnO(1-x)SiO2(x) with the concentration of nanosilica are checked by X-ray analysis measurement. The crystal structures for ZnO, (ZnO)0.75(SiO2)0.25, (ZnO)0.50(SiO2)0.50 and (ZnO)0.25(SiO2)0.75 and pure SiO2 are hexagonal, monoclinic, tetragonal, orthorhombic and amorphous respectively and detailed crystal parameters are obtained. The electronic properties of ZnO(1-x)SiO2(x) are investigated, where the optical band gaps for the five studied systems are 3.22eV, 3.24eV, 3.27eV, 3.30eV and 4.5eV respectively. It is clear that the band gap increases with increasing SiO2 content. Mixing the ZnO with SiO2 enhance the UV response of these materials which is confirmed by diffused reflectance spectrum used to analyze the UV response of the studied systems.
authors.affiliation: Physics Department, Faculty of Science, Cairo University, Cairo, Egypt. Electronic address: marwa_hafez@yahoo.com.
authors.forename: M
authors.initials: M
authors.lastname: Hafez
authors.affiliation: Nano-Science & Semiconductor Labs, Physics Department, Faculty of Education, Ain Shams University, Roxy, Cairo, Egypt; Department of Physics, Faculty of Science, King Khalid University, P.O. Box 9004, Abha, Saudi Arabia.
authors.forename: I S
authors.initials: IS
authors.lastname: Yahia
authors.affiliation: Department of Physics, Faculty of Science, King Khalid University, P.O. Box 9004, Abha, Saudi Arabia; Physics Department, Faculty of Science, El-Fayoum University, EL-Fayoum, Egypt.
authors.forename: S
authors.initials: S
authors.lastname: Taha
mesh_terms: D015394:Molecular Structure; D049329:Nanostructures / Q000737:chemistry*; D055620:Optical Phenomena; D012822:Silicon Dioxide / Q000737:chemistry*; D014466:Ultraviolet Rays; D015034:Zinc Oxide / Q000737:chemistry*
chemical_list: D012822:Silicon Dioxide; D015034:Zinc Oxide
keywords: Diffused reflectance; Structural analysis; ZnO((1−)(x)())SiO(2()(x)())