title: Impact of the mechanical stress on switching characteristics of electrochemical resistive memory.
authors.affiliation: Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano and IU.NET, Piazza L. da Vinci, 32, - 20133, Milano, MI, Italy.
authors.forename: Stefano
authors.initials: S
authors.lastname: Ambrogio
authors.forename: Simone
authors.initials: S
authors.lastname: Balatti
authors.forename: Seol
authors.initials: S
authors.lastname: Choi
authors.forename: Daniele
authors.initials: D
authors.lastname: Ielmini
keywords: electrochemical devices; mechanical stress; memristors; nanoelectronics; resistive switching