title: Continuous-wave terahertz system based on a dual-mode laser for real-time non-contact measurement of thickness and conductivity.
abstract: Terahertz (THz) waves have been exploited for the non-contact measurements of thickness and refractive index, which has enormous industrial applicability. In this work, we demonstrate a 1.3-μm dual-mode laser (DML)-based continuous-wave THz system for the real-time measurement of a commercial indium-tin-oxide (ITO)-coated glass. The system is compact, cost-effective, and capable of performing broadband measurement within a second at the setting resolution of 1 GHz. The thickness of the glass and the sheet conductivity of the ITO film were successfully measured, and the measurements agree well with those of broadband pulse-based time domain spectroscopy and Hall measurement results.
authors.forename: Kiwon
authors.initials: K
authors.lastname: Moon
authors.forename: Namje
authors.initials: N
authors.lastname: Kim
authors.forename: Jun-Hwan
authors.initials: JH
authors.lastname: Shin
authors.forename: Young-Jong
authors.initials: YJ
authors.lastname: Yoon
authors.forename: Sang-Pil
authors.initials: SP
authors.lastname: Han
authors.forename: Kyung Hyun
authors.initials: KH
authors.lastname: Park
mesh_terms: D003217:Conductometry / Q000295:instrumentation*; D004553:Electric Conductivity; D005898:Glass / Q000737:chemistry*; D007834:Lasers; D008422:Materials Testing / Q000295:instrumentation*; D010783:Photometry / Q000295:instrumentation*; D055053:Terahertz Radiation; D017971:Tin Compounds / Q000032:analysis / Q000737:chemistry*
chemical_list: D017971:Tin Compounds; C109984:indium tin oxide