title: Akinetic all-semiconductor programmable swept-source at 1550 nm and 1310 nm with centimeters coherence length.
abstract: We demonstrate, for the first time, OCT imaging capabilities of a novel, akinetic (without any form of movement in the tuning mechanism), all-semiconductor, all-electronic tunable, compact and flexible swept source laser technology at 1550 nm and 1310 nm. To investigate its OCT performance, 2D and 3D ex vivo and in vivo OCT imaging was performed at different sweep rates, from 20 kHz up to 200 kHz, with different axial resolutions, about 10 µm to 20 µm, and at different coherence gate displacements, from zero delay to >17 cm. Laser source phase linearity and phase repeatability standard deviation of <2 mrad (<160 pm) were observed without external phase referencing, indicating that the laser operated close to the shot noise limit (~2 × factor); constant percentile wavelengths variations of sliding RIN and ortho RIN <0.2% could be demonstrated, ~5 times better as compared to other swept laser technologies.
authors.forename: M
authors.initials: M
authors.lastname: Bonesi
authors.forename: M P
authors.initials: MP
authors.lastname: Minneman
authors.forename: J
authors.initials: J
authors.lastname: Ensher
authors.forename: B
authors.initials: B
authors.lastname: Zabihian
authors.forename: H
authors.initials: H
authors.lastname: Sattmann
authors.forename: P
authors.initials: P
authors.lastname: Boschert
authors.forename: E
authors.initials: E
authors.lastname: Hoover
authors.forename: R A
authors.initials: RA
authors.lastname: Leitgeb
authors.forename: M
authors.initials: M
authors.lastname: Crawford
authors.forename: W
authors.initials: W
authors.lastname: Drexler
mesh_terms: D004867:Equipment Design; D019544:Equipment Failure Analysis; D007089:Image Enhancement / Q000295:instrumentation*; D007834:Lasers; D054023:Lasers, Semiconductor; D008029:Lighting / Q000295:instrumentation*; D018613:Microscopy, Confocal / Q000295:instrumentation*; D041623:Tomography, Optical Coherence / Q000379:methods*