title: Exploring single semiconductor nanowires with a multimodal hard X-ray nanoprobe.
abstract: Semiconductor nanowires offer new opportunities for optoelectronic and spintronic nanodevices. However, their full potential is ultimately dictated by our ability to control multiple property-function relationships taking place at the nanoscale in the spatial and time domains. Only a combination of high-resolution analytical techniques can provide a comprehensive understanding of their complex functionalities. Here we describe how a multimodal hard X-ray nanoprobe addresses fundamental questions in nanowire research. Selected topics ranging from cluster formation, dopant segregation, and phase separations to quantum confinement effects are investigated with sub-100 nm spatial resolution and sub-50 ps temporal resolution. This approach opens new avenues for structural, composition and optical studies with broad applicability in materials science.
authors.affiliation: European Synchrotron Radiation Facility, 38043, Grenoble, France.
authors.forename: Gema
authors.initials: G
authors.lastname: Martínez-Criado
authors.forename: Jaime
authors.initials: J
authors.lastname: Segura-Ruiz
authors.forename: Benito
authors.initials: B
authors.lastname: Alén
authors.forename: Joël
authors.initials: J
authors.lastname: Eymery
authors.forename: Andrei
authors.initials: A
authors.lastname: Rogalev
authors.forename: Rémi
authors.initials: R
authors.lastname: Tucoulou
authors.forename: Alejandro
authors.initials: A
authors.lastname: Homs
keywords: X-ray fluorescence; X-ray nanoprobe; luminescence; nanowires; semiconductors