Order quantification of hexagonal periodic arrays fabricated by in situ solvent-assisted nanoimprint lithography of block copolymers.
Directed self-assembly of block copolymer polystyrene-b-polyethylene oxide (PS-b-PEO) thin film was achieved by a one-pot methodology of solvent vapor assisted nanoimprint lithography (SAIL). Simultaneous solvent-anneal and imprinting of a PS-b-PEO thin film on silicon without surface pre-treatments yielded a 250 nm line grating decorated with 20 nm diameter nanodots array over a large surface area of up to 4' wafer scale. The grazing-incidence small-angle x-ray scattering diffraction pattern showed the fidelity of the NIL stamp pattern replication and confirmed the periodicity of the BCP of 40 nm. The order of the hexagonally arranged nanodot lattice was quantified by SEM image analysis using the opposite partner method and compared to conventionally solvent-annealed block copolymer films. The imprint-based SAIL methodology thus demonstrated an improvement in ordering of the nanodot lattice of up to 50%, and allows significant time and cost reduction in the processing of these structures.
Institut Catala de Nanociencia i Nanotecnologia, Campus de la UAB, Barcelona 08193, Spain.
Claudia
C
Simão
Worawut
W
Khunsin
Nikolaos
N
Kehagias
Mathieu
M
Salaun
Marc
M
Zelsmann
Michael A
MA
Morris
Clivia M
CM
Sotomayor Torres
D049329:Nanostructures / Q000648:ultrastructure; D011092:Polyethylene Glycols / Q000737:chemistry*; D011137:Polystyrenes / Q000737:chemistry*; D014961:X-Ray Diffraction
D011137:Polystyrenes; C541965:polystyrene-b-poly(ethylene oxide); D011092:Polyethylene Glycols