Hyphenating atomic force microscopy.
Atomic force microscopy can be readily combined with complementary instrumental techniques ranging from optical to mass-sensitive methods. This Feature highlights recent advances on hyphenated AFM technology, which enables localized studies and mapping of complementary information at surfaces and interfaces.
Institute of Analytical and Bioanalytical Chemistry, University of Ulm , Albert-Einstein-Allee 11, 89081 Ulm, Germany.
Alexander
A
Eifert
Christine
C
Kranz