A modified implementation of tristate inverter based static master-slave flip-flop with improved power-delay-area product.
The paper introduces novel architectures for implementation of fully static master-slave flip-flops for low power, high performance, and high density. Based on the proposed structure, traditional C(2)MOS latch (tristate inverter/clocked inverter) based flip-flop is implemented with fewer transistors. The modified C(2)MOS based flip-flop designs mC(2)MOSff1 and mC(2)MOSff2 are realized using only sixteen transistors each while the number of clocked transistors is also reduced in case of mC(2)MOSff1. Postlayout simulations indicate that mC(2)MOSff1 flip-flop shows 12.4% improvement in PDAP (power-delay-area product) when compared with transmission gate flip-flop (TGFF) at 16X capacitive load which is considered to be the best design alternative among the conventional master-slave flip-flops. To validate the correct behaviour of the proposed design, an eight bit asynchronous counter is designed to layout level. LVS and parasitic extraction were carried out on Calibre, whereas layouts were implemented using IC station (Mentor Graphics). HSPICE simulations were used to characterize the transient response of the flip-flop designs in a 180 nm/1.8 V CMOS technology. Simulations were also performed at 130 nm, 90 nm, and 65 nm to reveal the scalability of both the designs at modern process nodes.
Department of Electrical Engineering, Delhi Technological University, Room No. FW1-SF1, EED, DTU, New Delhi 110042, India.
Kunwar
0000-0002-8932-046X
K
Singh
Division of ECE, Netaji Subhas Institute of Technology (NSIT), University of Delhi, Sector 3, Dwarka, New Delhi 110078, India.
Satish Chandra
SC
Tiwari
Division of ECE, Netaji Subhas Institute of Technology (NSIT), University of Delhi, Sector 3, Dwarka, New Delhi 110078, India.
Maneesha
M
Gupta
D017076:Computer-Aided Design; D011211:Electric Power Supplies; D004581:Electronics / Q000295:instrumentation*; D004735:Energy Transfer; D004867:Equipment Design; D019544:Equipment Failure Analysis; D012815:Signal Processing, Computer-Assisted / Q000295:instrumentation*