title: All two-dimensional, flexible, transparent, and thinnest thin film transistor.
abstract: In this article, we report only 10 atomic layer thick, high mobility, transparent thin film transistors (TFTs) with ambipolar device characteristics fabricated on both a conventional silicon platform as well as on a flexible substrate. Monolayer graphene was used as metal electrodes, 3-4 atomic layers of h-BN were used as the gate dielectric, and finally bilayers of WSe2 were used as the semiconducting channel material for the TFTs. The field effect carrier mobility was extracted to be 45 cm(2)/(V s), which exceeds the mobility values of state of the art amorphous silicon based TFTs by ∼100 times. The active device stack of WSe2-hBN-graphene was found to be more than 88% transparent over the entire visible spectrum and the device characteristics were unaltered for in-plane mechanical strain of up to 2%. The device demonstrated remarkable temperature stability over 77-400 K. Low contact resistance value of 1.4 kΩ-μm, subthreshold slope of 90 mv/decade, current ON-OFF ratio of 10(7), and presence of both electron and hole conduction were observed in our all two-dimensional (2D) TFTs, which are extremely desirable but rarely reported characteristics of most of the organic and inorganic TFTs. To the best of our knowledge, this is the first report of all 2D transparent TFT fabricated on flexible substrate along with the highest mobility and current ON-OFF ratio.
authors.affiliation: Center for Nanoscale Material, Argonne National Laboratory, Argonne, Illinois 60439, United States.
authors.forename: Saptarshi
authors.initials: S
authors.lastname: Das
authors.forename: Richard
authors.initials: R
authors.lastname: Gulotty
authors.forename: Anirudha V
authors.initials: AV
authors.lastname: Sumant
authors.forename: Andreas
authors.initials: A
authors.lastname: Roelofs