title: Effects of load and maintenance duration on the time course of information encoding and retrieval in working memory: from perceptual analysis to post-categorization processes.
abstract: information encoding, maintenance, and retrieval; these are supported by brain activity in a network of frontal, parietal and temporal regions. Manipulation of WM load and duration of the maintenance period can modulate this activity. Although such modulations have been widely studied using the event-related potentials (ERP) technique, a precise description of the time course of brain activity during encoding and retrieval is still required. Here, we used this technique and principal component analysis to assess the time course of brain activity during encoding and retrieval in a delayed match to sample task. We also investigated the effects of memory load and duration of the maintenance period on ERP activity. Brain activity was similar during information encoding and retrieval and comprised six temporal factors, which closely matched the latency and scalp distribution of some ERP components: P1, N1, P2, N2, P300, and a slow wave. Changes in memory load modulated task performance and yielded variations in frontal lobe activation. Moreover, the P300 amplitude was smaller in the high than in the low load condition during encoding and retrieval. Conversely, the slow wave amplitude was higher in the high than in the low load condition during encoding, and the same was true for the N2 amplitude during retrieval. Thus, during encoding, memory load appears to modulate the processing resources for context updating and post-categorization processes, and during retrieval it modulates resources for stimulus classification and context updating. Besides, despite the lack of differences in task performance related to duration of the maintenance period, larger N2 amplitude and stronger activation of the left temporal lobe after long than after short maintenance periods were found during information retrieval. Thus, results regarding the duration of maintenance period were complex, and future work is required to test the time-based decay theory predictions.
authors.affiliation: Department of Clinical Psychology and Psychobiology, Universidade de Santiago de Compostela Santiago de Compostela, Spain.
authors.forename: Diego
authors.initials: D
authors.lastname: Pinal
authors.affiliation: Department of Clinical Psychology and Psychobiology, Universidade de Santiago de Compostela Santiago de Compostela, Spain.
authors.forename: Montserrat
authors.initials: M
authors.lastname: Zurrón
authors.affiliation: Department of Clinical Psychology and Psychobiology, Universidade de Santiago de Compostela Santiago de Compostela, Spain.
authors.forename: Fernando
authors.initials: F
authors.lastname: Díaz
keywords: delayed match-to-sample; eLORETA; encoding; event-related potentials; maintenance duration; memory load; retrieval; working memory
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