Impact of thermal frequency drift on highest precision force microscopy using quartz-based force sensors at low temperatures.
In frequency modulation atomic force microscopy (FM-AFM) the stability of the eigenfrequency of the force sensor is of key importance for highest precision force measurements. Here, we study the influence of temperature changes on the resonance frequency of force sensors made of quartz, in a temperature range from 4.8-48 K. The sensors are based on the qPlus and length extensional principle. The frequency variation with temperature T for all sensors is negative up to 30 K and on the order of 1 ppm/K, up to 13 K, where a distinct kink appears, it is linear. Furthermore, we characterize a new type of miniaturized qPlus sensor and confirm the theoretically predicted reduction in detector noise.
Institute of Experimental and Applied Physics, University of Regensburg, D-93053 Regensburg, Germany.
Florian
F
Pielmeier
Institute of Experimental and Applied Physics, University of Regensburg, D-93053 Regensburg, Germany.
Daniel
D
Meuer
Institute of Experimental and Applied Physics, University of Regensburg, D-93053 Regensburg, Germany.
Daniel
D
Schmid
Institute of Experimental and Applied Physics, University of Regensburg, D-93053 Regensburg, Germany.
Christoph
C
Strunk
Institute of Experimental and Applied Physics, University of Regensburg, D-93053 Regensburg, Germany.
Franz J
FJ
Giessibl
AFM; frequency drift; length extensional resonator; needle sensor; qPlus sensor; quartz