Laboratory-based micro-X-ray fluorescence setup using a von Hamos crystal spectrometer and a focused beam X-ray tube.
The high-resolution von Hamos bent crystal spectrometer of the University of Fribourg was upgraded with a focused X-ray beam source with the aim of performing micro-sized X-ray fluorescence (XRF) measurements in the laboratory. The focused X-ray beam source integrates a collimating optics mounted on a low-power micro-spot X-ray tube and a focusing polycapillary half-lens placed in front of the sample. The performances of the setup were probed in terms of spatial and energy resolution. In particular, the fluorescence intensity and energy resolution of the von Hamos spectrometer equipped with the novel micro-focused X-ray source and a standard high-power water-cooled X-ray tube were compared. The XRF analysis capability of the new setup was assessed by measuring the dopant distribution within the core of Er-doped SiO2 optical fibers.
Department of Physics, University of Fribourg, 1700 Fribourg, Switzerland.
Y
Y
Kayser
Department of Physics, University of Fribourg, 1700 Fribourg, Switzerland.
W
W
Błachucki
Department of Physics, University of Fribourg, 1700 Fribourg, Switzerland.
J-Cl
JC
Dousse
Department of Physics, University of Fribourg, 1700 Fribourg, Switzerland.
J
J
Hoszowska
Institute of Applied Physics, University of Bern, 3012 Bern, Switzerland.
M
M
Neff
Institute of Applied Physics, University of Bern, 3012 Bern, Switzerland.
V
V
Romano
D013052:Spectrometry, X-Ray Emission / Q000295:instrumentation* / Q000379:methods*; D014965:X-Rays