Note: application of a pixel-array area detector to simultaneous single crystal X-ray diffraction and X-ray absorption spectroscopy measurements.
X-ray diffraction (XRD) and X-ray absorption spectroscopy (XAS) are two main x-ray techniques in synchrotron radiation facilities. In this Note, we present an experimental setup capable of performing simultaneous XRD and XAS measurements by the application of a pixel-array area detector. For XRD, the momentum transfer in specular diffraction was measured by scanning the X-ray energy with fixed incoming and outgoing x-ray angles. By selecting a small fixed region of the detector to collect the XRD signal, the rest of the area was available for collecting the x-ray fluorescence for XAS measurements. The simultaneous measurement of XRD and X-ray absorption near edge structure for Pr0.67Sr0.33MnO3 film was demonstrated as a proof of principle for future time-resolved pump-probe measurements. A static sample makes it easy to maintain an accurate overlap of the X-ray spot and laser pump beam.
Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA.
Cheng-Jun
CJ
Sun
Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA.
Bangmin
B
Zhang
Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA.
Dale L
DL
Brewe
Department of Materials Science and Engineering, National University of Singapore, 117575 Singapore.
Jing-Sheng
JS
Chen
Department of Materials Science and Engineering, National University of Singapore, 117575 Singapore.
G M
GM
Chow
NUSNNI-Nanocore, National University of Singapore, 117411 Singapore.
T
T
Venkatesan
Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA.
Steve M
SM
Heald