Energy dissipation in multifrequency atomic force microscopy.
The instantaneous displacement, velocity and acceleration of a cantilever tip impacting onto a graphite surface are reconstructed. The total dissipated energy and the dissipated energy per cycle of each excited flexural mode during the tip interaction is retrieved. The tip dynamics evolution is studied by wavelet analysis techniques that have general relevance for multi-mode atomic force microscopy, in a regime where few cantilever oscillation cycles characterize the tip-sample interaction.
Dipartimento di Fisica, Università degli Studi di Milano, I-20122 Milano, Italy ; Interdisciplinary Laboratories for Advanced Materials Physics (i-LAMP) and Dipartimento di Matematica e Fisica, Università Cattolica, I-25121 Brescia, Italy.
Valentina
V
Pukhova
Interdisciplinary Laboratories for Advanced Materials Physics (i-LAMP) and Dipartimento di Matematica e Fisica, Università Cattolica, I-25121 Brescia, Italy.
Francesco
F
Banfi
Interdisciplinary Laboratories for Advanced Materials Physics (i-LAMP) and Dipartimento di Matematica e Fisica, Università Cattolica, I-25121 Brescia, Italy.
Gabriele
G
Ferrini
band excitation; multifrequency atomic force microscopy (AFM); phase reference; wavelet transforms