Control theory for scanning probe microscopy revisited.
We derive a theoretical model for studying SPM feedback in the context of control theory. Previous models presented in the literature that apply standard models for proportional-integral-derivative controllers predict a highly unstable feedback environment. This model uses features specific to the SPM implementation of the proportional-integral controller to give realistic feedback behaviour. As such the stability of SPM feedback for a wide range of feedback gains can be understood. Further consideration of mechanical responses of the SPM system gives insight into the causes of exciting mechanical resonances of the scanner during feedback operation.
School of Physics and Astronomy, The University of Nottingham, University Park, Nottingham, NG7 2RD, United Kingdom.
Julian
J
Stirling
AFM; control theory; feedback; scanning probe microscopy