title: Mode imaging and loss evaluation of semiconductor waveguides.
abstract: An imaging and loss evaluation method for semiconductor waveguides coupled with non-doped quantum wells is presented. Using the internal emission of the wells as a probe light source, the numbers and widths of the modes of waveguides with various ridge sizes were evaluated by CCD imaging, and the obtained values were consistent with effective index method calculation. Waveguide internal losses were obtained from analyses of the Fabry-Pérot fringes of waveguide emission spectra. We quantified the quality of 29 single-mode waveguide samples as an internal loss and variation of 10.2 ± 0.6  cm(-1).
authors.affiliation: Institute for Solid State Physics, The University of Tokyo, Kashiwanoha 5-1-5, Kashiwa, Chiba, Japan.
authors.forename: Toshimitsu
authors.initials: T
authors.lastname: Mochizuki
authors.affiliation: Institute for Solid State Physics, The University of Tokyo, Kashiwanoha 5-1-5, Kashiwa, Chiba, Japan.
authors.forename: Changsu
authors.initials: C
authors.lastname: Kim
authors.affiliation: Institute for Solid State Physics, The University of Tokyo, Kashiwanoha 5-1-5, Kashiwa, Chiba, Japan.
authors.forename: Masahiro
authors.initials: M
authors.lastname: Yoshita
authors.affiliation: Institute for Solid State Physics, The University of Tokyo, Kashiwanoha 5-1-5, Kashiwa, Chiba, Japan.
authors.forename: Takahiro
authors.initials: T
authors.lastname: Nakamura
authors.affiliation: Institute for Solid State Physics, The University of Tokyo, Kashiwanoha 5-1-5, Kashiwa, Chiba, Japan.
authors.forename: Hidefumi
authors.initials: H
authors.lastname: Akiyama
authors.affiliation: Department of Electrical Engineering, Princeton University, New Jersey 08544, USA.
authors.forename: Loren N
authors.initials: LN
authors.lastname: Pfeiffer
authors.affiliation: Department of Electrical Engineering, Princeton University, New Jersey 08544, USA.
authors.forename: Ken W
authors.initials: KW
authors.lastname: West