title: Microring-based ratio-metric wavelength monitor on silicon.
abstract: An integrated dual-ring ratio-metric wavelength monitor (DR-RMWM) with ultra-high wavelength resolution and compact size is demonstrated. Two microrings are used as the edge filters and designed to achieve an "X-type" spectral response in a particular wavelength range. It is fabricated with the CMOS-compatible fabrication process on the silicon-on-insulator. The measured wavelength resolution is 5 pm in a 1.2 nm wide wavelength range. By tuning the resonant wavelength thermally, the functional wavelength range can be shifted. The DR-RMWM can find applications in wavelength monitoring systems, especially the on-chip systems.
authors.forename: Bing
authors.initials: B
authors.lastname: Yang
authors.forename: Ao
authors.initials: A
authors.lastname: Shen
authors.forename: Chen
authors.initials: C
authors.lastname: Qiu
authors.forename: Ting
authors.initials: T
authors.lastname: Hu
authors.forename: Longzhi
authors.initials: L
authors.lastname: Yang
authors.forename: Hui
authors.initials: H
authors.lastname: Yu
authors.forename: Xiaoqing
authors.initials: X
authors.lastname: Jiang
authors.forename: Yubo
authors.initials: Y
authors.lastname: Li
authors.forename: Yinlei
authors.initials: Y
authors.lastname: Hao
authors.forename: Jianyi
authors.initials: J
authors.lastname: Yang