title: An introduction to modeling longitudinal data with generalized additive models: applications to single-case designs.
abstract: Single-case designs (SCDs) are short time series that assess intervention effects by measuring units repeatedly over time in both the presence and absence of treatment. This article introduces a statistical technique for analyzing SCD data that has not been much used in psychological and educational research: generalized additive models (GAMs). In parametric regression, the researcher must choose a functional form to impose on the data, for example, that trend over time is linear. GAMs reverse this process by letting the data inform the choice of functional form. In this article we review the problem that trend poses in SCDs, discuss how current SCD analytic methods approach trend, describe GAMs as a possible solution, suggest a GAM model testing procedure for examining the presence of trend in SCDs, present a small simulation to show the statistical properties of GAMs, and illustrate the procedure on 3 examples of different lengths. Results suggest that GAMs may be very useful both as a form of sensitivity analysis for checking the plausibility of assumptions about trend and as a primary data analysis strategy for testing treatment effects. We conclude with a discussion of some problems with GAMs and some future directions for research on the application of GAMs to SCDs.
authors.affiliation: School of Social Sciences, Humanities and Arts.
authors.forename: Kristynn J
authors.initials: KJ
authors.lastname: Sullivan
authors.affiliation: School of Social Sciences, Humanities and Arts.
authors.forename: William R
authors.initials: WR
authors.lastname: Shadish
authors.affiliation: Department of Educational Psychology, University of Wisconsin- Madison.
authors.forename: Peter M
authors.initials: PM
authors.lastname: Steiner
mesh_terms: D035843:Biomedical Research / Q000706:statistics & numerical data*; D006801:Humans; D015233:Models, Statistical; D012107:Research Design / Q000706:statistics & numerical data*