title: Photon-in/photon-out spectroscopic techniques for materials analysis: some recent developments.
abstract: Third-generation synchrotron light source technology has greatly improved the capabilities for materials analysis using tunable X-rays. Two such capabilities developed recently are reported herein - inverse partial fluorescence yield (IPFY) XANES (X-ray absorption near edge structure) and 2D XANES - XEOL (X-ray excited optical luminescence) in both the energy and time domain. These techniques take advantage of recent advances in soft X-ray solid state detector, optical spectrometer with a CCD detector and optical streak camera on a soft X-ray beamline as well as new data acquisition schemes. The studies of LiFePO4 materials for Li ion battery and solid solutions of GaN-ZnO nanostructures for water splitting are used to illustrate these capabilities. The prospects of these and related synchrotron photon-in photon-out techniques are also noted.
authors.affiliation: Department of Chemistry, University of Western Ontario, 1151 Richmond Street, London, Ontario, N6A 5B7, Canada.
authors.forename: Tsun-Kong
authors.initials: TK
authors.lastname: Sham
keywords: 2D; X-ray excited optical luminescence; photon-in photon-out; soft X-ray fluorescence; synchrotron