title: Microscopy and microanalysis of complex nanosized strengthening precipitates in new generation commercial Al-Cu-Li alloys.
abstract: Precipitates (ppts) in new generation aluminum-lithium alloys (AA2099 and AA2199) were characterised using scanning and transmission electron microscopy and atom probe tomography. Results obtained on the following ppts are reported: Guinier-Preston zones, T1 (Al2 CuLi), β' (Al3 Zr) and δ' (Al3 Li). The focus was placed on their composition and the presence of minor elements. X-ray energy-dispersive spectrometry in the electron microscopes and mass spectrometry in the atom probe microscope showed that T1 ppts were enriched in zinc (Zn) and magnesium up to about 1.9 and 3.5 at.%, respectively. A concentration of 2.5 at.% Zn in the δ' ppts was also measured. Unlike Li and copper, Zn in the T1 ppts could not be detected using electron energy-loss spectroscopy in the transmission electron microscope because of its too low concentration and the small sizes of these ppts. Indeed, Monte Carlo simulations of EEL spectra for the Zn L2,3 edge showed that the signal-to-noise ratio was not high enough and that the detection limit was at least 2.5 at.%, depending on the probe current. Also, the simulation of X-ray spectra confirmed that the detection limit was exceeded for the Zn Kα X-ray line because the signal-to-noise ratio was high enough in that case, which is in agreement with our observations.
authors.affiliation: Departments of Chemistry and Physics, College of Natural Sciences, University of Puerto Rico, San Juan, Puerto Rico.
authors.forename: M J-F
authors.initials: MJ
authors.lastname: Guinel
authors.forename: N
authors.initials: N
authors.lastname: Brodusch
authors.forename: G
authors.initials: G
authors.lastname: Sha
authors.forename: M A
authors.initials: MA
authors.lastname: Shandiz
authors.forename: H
authors.initials: H
authors.lastname: Demers
authors.forename: M
authors.initials: M
authors.lastname: Trudeau
authors.forename: S P
authors.initials: SP
authors.lastname: Ringer
authors.forename: R
authors.initials: R
authors.lastname: Gauvin
keywords: Atom probe tomography; Monte Carlo simulations; X-ray energy-dispersive spectrometry (XEDS); detection limit; electron energy-loss spectroscopy (EELS); electron microscopy