title: The correlation of single-particle diffraction patterns as a continuous function of particle orientation.
abstract: A statistical model for X-ray scattering of a non-periodic sample to high angles is introduced. It is used to calculate analytically the correlation of distinct diffraction measurements of a particle as a continuous function of particle orientation. Diffraction measurements with shot-noise are also considered. This theory provides a general framework for a deeper understanding of single particle imaging techniques used at X-ray free-electron lasers. Many of these techniques use correlations as a measure of diffraction-pattern similarity in order to determine properties of the sample, such as particle orientation.
authors.affiliation: ARC Centre of Excellence for Coherent X-ray Science, School of Physics, The University of Melbourne, Melbourne, Victoria 3010, Australia andrew.martin@unimelb.edu.au.
authors.forename: Andrew V
authors.initials: AV
authors.lastname: Martin
mesh_terms: D004583:Electrons; D007834:Lasers; D008962:Models, Theoretical; D008968:Molecular Conformation; D016012:Poisson Distribution; D012542:Scattering, Radiation; D059629:Signal-To-Noise Ratio; D014961:X-Ray Diffraction / Q000379:methods*
keywords: X-ray diffraction; X-ray free-electron laser; coherent diffractive imaging