title: Synthesis, characterization and dielectric properties of SnO2 thin films.
abstract: SnO2 thin films have been grown on glass substrates using Successive Ionic Layer Adsorption and Reaction (SILAR) method at room temperature and ambient pressure. The annealing temperature effect on the structural, morphological, optical and electrical properties of SnO2 thin films has been investigated. The X-ray Diffraction (XRD) and Scanning Electron Microscopy (SEM) studies have showed that all the films have exhibited polycrystalline nature with tetragonal structure and have been covered well on glass substrates. The crystalline and surface properties of the films have improved with increasing annealing temperature. The band gap values have been changed from 3.73 to 3.66eV depending on the annealing temperature. The refractive index (n), optical static and high frequency dielectric constants (εo, ε∞) values have been calculated as a function of the annealing temperature. The resistivity values of the films have changed between 10(-1) - 10(-3)Ωcm with annealing temperature and light at room temperature.
authors.affiliation: Department of Physics, Science and Art Faculty, Erzincan University, Erzincan, Turkey. Electronic address: mayildirim@erzincan.edu.tr.
authors.forename: M Ali
authors.initials: MA
authors.lastname: Yıldırım
authors.affiliation: Department of Chemistry, Science and Art Faculty, Erzincan University, Erzincan, Turkey.
authors.forename: Sümeyra Tuna
authors.initials: ST
authors.lastname: Yıldırım
authors.affiliation: Department of Physics, Science and Art Faculty, Erzincan University, Erzincan, Turkey.
authors.forename: Emine Fedakar
authors.initials: EF
authors.lastname: Sakar
authors.affiliation: Department of Material Engineering, Engineering and Natural Sciences Faculty, Yıldırım Beyazıt University, Ankara, Turkey.
authors.forename: Aytunç
authors.initials: A
authors.lastname: Ateş
mesh_terms: D003460:Crystallization; D017097:Electric Impedance; D005898:Glass / Q000737:chemistry; D012031:Refractometry; D013499:Surface Properties; D013696:Temperature; D017971:Tin Compounds / Q000737:chemistry*; D014961:X-Ray Diffraction
chemical_list: D017971:Tin Compounds; C045358:stannic oxide
keywords: Annealing effect; Dielectric constant; Refractive index; SILAR; SnO(2)