title: Three-dimensional structured illumination microscopy using Lukosz bound apodization reduces pixel negativity at no resolution cost.
abstract: The quality of the reconstructed image in structured illumination microscopy (SIM) depends on various aspects of the image filtering process. To optimize the trade-off between resolution and ringing artifacts, which lead to negative intensities, we extend Lukosz-bound filtering to 3D SIM and derive the parametrization of the 3D SIM cut-off. We compare the use of the Lukosz-bound as apodization filter to triangular apodization and find a tenfold reduction in the most negative pixel value with a minimal resolution loss. We test this algorithm on experimental SIM images of tubulin filaments and DAPI stained DNA structure in cancer cells and find a substantial reduction in the most negative pixel value and the percentage of pixels with a negative value. This means that there is no longer a need to clip the final image to avoid these negative pixel values.
authors.forename: Christiaan H
authors.initials: CH
authors.lastname: Righolt
authors.forename: Sabine
authors.initials: S
authors.lastname: Mai
authors.forename: Lucas J
authors.initials: LJ
authors.lastname: van Vliet
authors.forename: Sjoerd
authors.initials: S
authors.lastname: Stallinga
mesh_terms: D000465:Algorithms; D003599:Cytoskeleton / Q000648:ultrastructure*; D006801:Humans; D021621:Imaging, Three-Dimensional; D008029:Lighting / Q000379:methods*; D008853:Microscopy