title: Optimization of overlap uniformness for ptychography.
abstract: We demonstrate the advantages of imaging with ptychography scans that follow a Fermat spiral trajectory. This scan pattern provides a more uniform coverage and a higher overlap ratio with the same number of scan points over the same area than the presently used mesh and concentric [13] patterns. Under realistically imperfect measurement conditions, numerical simulations show that the quality of the reconstructed image is improved significantly with a Fermat spiral compared with a concentric scan pattern. The result is confirmed by the performance enhancement with experimental data, especially under low-overlap conditions. These results suggest that the Fermat spiral pattern increases the quality of the reconstructed image and tolerance to data with imperfections.
authors.forename: Xiaojing
authors.initials: X
authors.lastname: Huang
authors.forename: Hanfei
authors.initials: H
authors.lastname: Yan
authors.forename: Ross
authors.initials: R
authors.lastname: Harder
authors.forename: Yeukuang
authors.initials: Y
authors.lastname: Hwu
authors.forename: Ian K
authors.initials: IK
authors.lastname: Robinson
authors.forename: Yong S
authors.initials: YS
authors.lastname: Chu