title: Abnormal drop in electrical resistivity with impurity doping of single-crystal Ag.
abstract: Resistivity is an intrinsic feature that specifies the electrical properties of a material and depends on electron-phonon scattering near room temperature. Reducing the resistivity of a metal to its potentially lowest value requires eliminating grain boundaries and impurities, but to date few studies have focused on reducing the intrinsic resistivity of a pure metal itself. We could reduce the intrinsic resistivity of single-crystal Ag, which has an almost perfect structure, by impurity doping it with Cu. This paper presents our results: resistivity was reduced to 1.35 μΩ · cm at room temperature after 3 mol% Cu-doping of single-crystal Ag. Various mechanisms were examined in an attempt to explain the abnormal behavior.
authors: 1] Department of Nano Fusion Technology, Pusan National University, Miryang, 627-706, Republic of Korea [2].
authors: Ji Young
authors: JY
authors: Kim
authors: 1] Fundamental and Creativity Research Division, Korea Electrotechnology Research Institute, Changwon-si, 642-120, Republic of Korea [2].
authors: Min-Wook
authors: MW
authors: Oh
authors: 1] Department of Cogno-Mechatronics Engineering, Pusan National University, Miryang, 627-706, Republic of Korea [2].
authors: Seunghun
authors: S
authors: Lee
authors: Crystal Bank Research Institute, Pusan National University, Miryang 627-706, Republic of Korea.
authors: Yong Chan
authors: YC
authors: Cho
authors: Busan center, Korea Basic Science Institute, Busan, 618-230, Republic of Korea.
authors: Jang-Hee
authors: JH
authors: Yoon
authors: Korea Research Institute of Standards and Science & Department of Science of Measurement, University of Science and Technology, Daejeon, 305-340, Republic of Korea.
authors: Geun Woo
authors: GW
authors: Lee
authors: Department of Nano Fusion Technology, Pusan National University, Miryang, 627-706, Republic of Korea.
authors: Chae-Ryong
authors: CR
authors: Cho
authors: Department of Physics Education & RCDAMP, Pusan National University, Busan, 609-735, Republic of Korea.
authors: Chul Hong
authors: CH
authors: Park
authors: Department of Cogno-Mechatronics Engineering, Pusan National University, Miryang, 627-706, Republic of Korea.
authors: Se-Young
authors: SY
authors: Jeong