title: Nanoscale surface tracking of laser material processing using phase shifting diffraction interferometry.
abstract: Phase shifting diffraction interferometry (PSDI) was adapted to provide real-time feedback control of a laser-based chemical vapor deposition (LCVD) process with nanometer scale sensitivity. PSDI measurements of laser heated BK7 and fused silica substrates were used to validate a finite element model that accounts for both refractive index changes and displacement contributions to the material response. Utilizing PSDI and accounting for the kinetics of the modeled thermomechanical response, increased control of the LCVD process was obtained. This approach to surface tracking is useful in applications where extreme environments on the working surface require back-side optical probing through the substrate.
authors: Gabriel M
authors: GM
authors: Guss
authors: Arun K
authors: AK
authors: Sridharan
authors: Selim
authors: S
authors: Elhadj
authors: Michael A
authors: MA
authors: Johnson
authors: Manyalibo J
authors: MJ
authors: Matthews