title: Measuring partial fluorescence yield using filtered detectors.
abstract: Typically, X-ray absorption near-edge structure measurements aim to probe the linear attenuation coefficient. These measurements are often carried out using partial fluorescence yield techniques that rely on detectors having photon energy discrimination improving the sensitivity and the signal-to-background ratio of the measured spectra. However, measuring the partial fluorescence yield in the soft X-ray regime with reasonable efficiency requires solid-state detectors, which have limitations due to the inherent dead-time while measuring. Alternatively, many of the available detectors that are not energy dispersive do not suffer from photon count rate limitations. A filter placed in front of one of these detectors will make the energy-dependent efficiency non-linear, thereby changing the responsivity of the detector. It is shown that using an array of filtered X-ray detectors is a viable method for measuring soft X-ray partial fluorescence yield spectra without dead-time. The feasibility of this technique is further demonstrated using α-Fe2O3 as an example and it is shown that this detector technology could vastly improve the photon collection efficiency at synchrotrons and that these detectors will allow experiments to be completed with a much lower photon flux reducing X-ray-induced damage.
authors: Department of Physics and Engineering Physics, University of Saskatchewan, Saskatoon, Saskatchewan, Canada.
authors: T D
authors: TD
authors: Boyko
authors: Department of Physics and Engineering Physics, University of Saskatchewan, Saskatoon, Saskatchewan, Canada.
authors: R J
authors: RJ
authors: Green
authors: Department of Physics and Engineering Physics, University of Saskatchewan, Saskatoon, Saskatchewan, Canada.
authors: A
authors: A
authors: Moewes
authors: Canadian Light Source Inc., University of Saskatchewan, Saskatoon, Saskatchewan, Canada.
authors: T Z
authors: TZ
authors: Regier
mesh_terms: D004867:Equipment Design; D019544:Equipment Failure Analysis; D005374:Filtration / Q000295:instrumentation*; D010783:Photometry / Q000295:instrumentation*; D015203:Reproducibility of Results; D012666:Semiconductors; D012680:Sensitivity and Specificity; D013052:Spectrometry, X-Ray Emission / Q000295:instrumentation*; D017356:Synchrotrons / Q000295:instrumentation*
keywords: XANES; partial fluorescence yield; photodiode