title: Retrieval of the atomic displacements in the crystal from the coherent X-ray diffraction pattern.
abstract: The retrieval of spatially resolved atomic displacements is investigated via the phases of the direct(real)-space image reconstructed from the strained crystal's coherent X-ray diffraction pattern. It is demonstrated that limiting the spatial variation of the first- and second-order spatial displacement derivatives improves convergence of the iterative phase-retrieval algorithm for displacements reconstructions to the true solution. This approach is exploited to retrieve the displacement in a periodic array of silicon lines isolated by silicon dioxide filled trenches.
authors: ANKA/Institute for Photon Science and Synchrotron Radiation, Karlsruhe Institute of Technology, 76344 Eggenstein-Leopoldshafen, Germany.
authors: A A
authors: AA
authors: Minkevich
authors: ANKA/Institute for Photon Science and Synchrotron Radiation, Karlsruhe Institute of Technology, 76344 Eggenstein-Leopoldshafen, Germany.
authors: M
authors: M
authors: Köhl
authors: Aix-Marseille Université, CNRS, IM2NP, UMR 7334, 13397 Marseille Cedex 20, France.
authors: S
authors: S
authors: Escoubas
authors: Aix-Marseille Université, CNRS, IM2NP, UMR 7334, 13397 Marseille Cedex 20, France.
authors: O
authors: O
authors: Thomas
authors: ANKA/Institute for Photon Science and Synchrotron Radiation, Karlsruhe Institute of Technology, 76344 Eggenstein-Leopoldshafen, Germany.
authors: T
authors: T
authors: Baumbach
keywords: coherent X-ray diffraction imaging; phase retrieval; strained crystal