title: Planar temperature sensing using heavy-metal-free quantum dots with micrometer resolution.
abstract: This work describes a micrometer resolution and plane-array temperature-sensing method using the photoluminescence (PL) of ZnCuInS/ZnSe/ZnS quantum dots (QDs). Heavy-metal-free QDs were directly deposited on a printed circuit board to analyze the surface temperature of the devices on the board. An optical fiber monochromator and a high-powered microscope were employed to fabricate a system which could collect temperature-dependent QD emissions from the micrometer area for the temperature measurements. This system realizes the imaging of the surface temperature distribution in the planar micrometer area. Temperature sensitivity of the PL intensity reached 0.66% °C(-1), and the relative error was less than 2%.
authors: State Key Laboratory of Integrated Optoelectronics, and College of Electronic Science and Engineering, Jilin University, Changchun 130012, People's Republic of China.
authors: Wenyan
authors: W
authors: Liu
authors: Yu
authors: Y
authors: Zhang
authors: Hua
authors: H
authors: Wu
authors: Yi
authors: Y
authors: Feng
authors: Tieqiang
authors: T
authors: Zhang
authors: Wenzhu
authors: W
authors: Gao
authors: Hairong
authors: H
authors: Chu
authors: Jingzhi
authors: J
authors: Yin
authors: Tian
authors: T
authors: Cui
authors: Yiding
authors: Y
authors: Wang
authors: Jun
authors: J
authors: Zhao
authors: William W
authors: WW
authors: Yu