title: Improving the energy resolution of bent crystal X-ray spectrometers with position-sensitive detectors.
abstract: Wavelength-dispersive high-resolution X-ray spectrometers often employ elastically bent crystals for the wavelength analysis. In a preceding paper [Honkanen et al. (2014). J. Synchrotron Rad. 21, 104-110] a theory for quantifying the internal stress of a macroscopically large spherically curved analyser crystal was presented. Here the theory is applied to compensate for the corresponding decrease of the energy resolution. The technique is demonstrated with a Johann-type spectrometer using a spherically bent Si(660) analyser in near-backscattering geometry, where an improvement in the energy resolution from 1.0 eV down to 0.5 eV at 9.7 keV incident photon energy was observed.
authors: Department of Physics, PO Box 64, FI-00014 Helsinki, Finland.
authors: Ari Pekka
authors: AP
authors: Honkanen
authors: European Synchrotron Radiation Facility, BP 220, F-38043 Grenoble Cedex, France.
authors: Roberto
authors: R
authors: Verbeni
authors: European Synchrotron Radiation Facility, BP 220, F-38043 Grenoble Cedex, France.
authors: Laura
authors: L
authors: Simonelli
authors: European Synchrotron Radiation Facility, BP 220, F-38043 Grenoble Cedex, France.
authors: Marco
authors: M
authors: Moretti Sala
authors: European Synchrotron Radiation Facility, BP 220, F-38043 Grenoble Cedex, France.
authors: Ali
authors: A
authors: Al-Zein
authors: European Synchrotron Radiation Facility, BP 220, F-38043 Grenoble Cedex, France.
authors: Michael
authors: M
authors: Krisch
authors: European Synchrotron Radiation Facility, BP 220, F-38043 Grenoble Cedex, France.
authors: Giulio
authors: G
authors: Monaco
authors: Department of Physics, PO Box 64, FI-00014 Helsinki, Finland.
authors: Simo
authors: S
authors: Huotari
keywords: X-ray spectrometers; bent analyser crystals; position-sensitive detectors