title: Comparison of anterior corneal curvature measurements using a galilei dual scheimpflug analyzer and topcon auto kerato-refractometer.
abstract: Purpose. To compare anterior corneal keratometry (K) measurements taken by a dual Scheimpflug analyzer and an auto kerato-refractometer. Methods. Sixty-four normal eyes underwent keratometric measurements with both devices. The repeatability of the auto kerato-refractometer measurements was assessed by calculating the coefficient of variation (COV). The interdevice agreement was evaluated using the Bland-Altman analysis, Pearson correlation coefficient, and paired two-tailed t-test. Results. The COV of the flat K and steep K measurements taken by the auto kerato-refractometer were 0.21% and 0.29%, respectively. There were no significant differences between the steep K and average K measurements for the Topcon and Galilei devices (P = 0.475, and P = 0.137, resp.). The Galilei flat K values were lower than those of the Topcon (P = 0.002). Both of the instruments showed good agreement for all anterior corneal keratometric values. There was a significant linear correlation between the Galilei and Topcon devices for the flat K (r = 0.989, P < 0.0001), steep K (r = 0.987, P < 0.0001), and average K values (r = 0.994, P < 0.0001). Conclusions. The anterior corneal flat keratometric values were not interchangeable between the Galilei and Topcon devices. However, the measurements of the two instruments showed significant linear correlation with each other.
authors: Department of Ophthalmology, Affiliated Sixth People's Hospital Shanghai Jiao Tong University, No. 600, Yishan Road, Shanghai 200233, China ; Department of Ophthalmology, Shanxi Eye Hospital, Shanxi 030002, China.
authors: Xiaogang
authors: X
authors: Wang
authors: Department of Ophthalmology, The First Hospital of Shanxi Medical University, Shanxi 030001, China.
authors: Jing
authors: J
authors: Dong
authors: Department of Ophthalmology, Affiliated Sixth People's Hospital Shanghai Jiao Tong University, No. 600, Yishan Road, Shanghai 200233, China.
authors: Qiang
authors: Q
authors: Wu