title: Polarization characteristics of semipolar (112̄2) InGaN/GaN quantum well structures grown on relaxed InGaN buffer layers and comparison with experiment.
abstract: Partial strain relaxation effects on polarization ratio of semipolar (112̄2) InxGa1−xN/GaN quantum well (QW) structures grown on relaxed InGaN buffers were investigated using the multiband effective-mass theory. The absolute value of the polarization ratio gradually decreases with increasing In composition in InGaN buffer layer when the strain relaxation ratio (ε0y′y′−εy′y′)/ε0y′y′ along y′-axis is assumed to be linearly proportional to the difference of lattice constants between the well and the buffer layer. Also, it changes its sign for the QW structure grown on InGaN buffer layer with a relatively larger In composition (x > 0.07). These results are in good agreement with the experiment. This can be explained by the fact that, with increasing In composition in the InGaN subsrate, the spontaneous emission rate for the y′-polarization gradually increases while that for x′-polarization decreases due to the decrease in a matrix element at the band-edge (k‖ = 0).
authors: Seoung-Hwan
authors: SH
authors: Park
authors: Dhaneshwar
authors: D
authors: Mishra
authors: Y
authors: Y
authors: Eugene Pak
authors: K
authors: K
authors: Kang
authors: Chang Yong
authors: CY
authors: Park
authors: Seung-Hyun
authors: SH
authors: Yoo
authors: Yong-Hee
authors: YH
authors: Cho
authors: Mun-Bo
authors: MB
authors: Shim
authors: Sungjin
authors: S
authors: Kim