title: A compact methodology to understand, evaluate, and predict the performance of automatic target recognition.
abstract: This paper offers a compacted mechanism to carry out the performance evaluation work for an automatic target recognition (ATR) system: (a) a standard description of the ATR system's output is suggested, a quantity to indicate the operating condition is presented based on the principle of feature extraction in pattern recognition, and a series of indexes to assess the output in different aspects are developed with the application of statistics; (b) performance of the ATR system is interpreted by a quality factor based on knowledge of engineering mathematics; (c) through a novel utility called "context-probability" estimation proposed based on probability, performance prediction for an ATR system is realized. The simulation result shows that the performance of an ATR system can be accounted for and forecasted by the above-mentioned measures. Compared to existing technologies, the novel method can offer more objective performance conclusions for an ATR system. These conclusions may be helpful in knowing the practical capability of the tested ATR system. At the same time, the generalization performance of the proposed method is good.
authors: School of Electrical Science and Engineering, National University of Defense Technology, 137 Yanwachi Street, Changsha 410073, China. liyanpeng@nudt.edu.cn.
authors: Yanpeng
authors: Y
authors: Li
authors: School of Electrical Science and Engineering, National University of Defense Technology, 137 Yanwachi Street, Changsha 410073, China. lixiang01@vip.sina.com.
authors: Xiang
authors: X
authors: Li
authors: School of Electrical Science and Engineering, National University of Defense Technology, 137 Yanwachi Street, Changsha 410073, China. oliverwhq@tom.com.
authors: Hongqiang
authors: H
authors: Wang
authors: School of Electrical Science and Engineering, National University of Defense Technology, 137 Yanwachi Street, Changsha 410073, China. ypchenhk@gmail.com.
authors: Yiping
authors: Y
authors: Chen
authors: School of Electrical Science and Engineering, National University of Defense Technology, 137 Yanwachi Street, Changsha 410073, China. zwzhuang@nudt.edu.cn.
authors: Zhaowen
authors: Z
authors: Zhuang
authors: School of Electrical Science and Engineering, National University of Defense Technology, 137 Yanwachi Street, Changsha 410073, China. ypchenhk@gmail.com.
authors: Yongqiang
authors: Y
authors: Cheng
authors: School of Electrical Science and Engineering, National University of Defense Technology, 137 Yanwachi Street, Changsha 410073, China. dengbin@nudt.edu.cn.
authors: Bin
authors: B
authors: Deng
authors: State Key Laboratory of Complex Electromagnetic Environment Effects on Electronics and Information System (CEMEE), Luoyang 471003, China. CEMEE@vip.163.com.
authors: Liandong
authors: L
authors: Wang
authors: State Key Laboratory of Complex Electromagnetic Environment Effects on Electronics and Information System (CEMEE), Luoyang 471003, China. lotus2seeds@gmail.com.
authors: Yonghu
authors: Y
authors: Zeng
authors: State Key Laboratory of Complex Electromagnetic Environment Effects on Electronics and Information System (CEMEE), Luoyang 471003, China. ren_lgao@126.com.
authors: Lei
authors: L
authors: Gao