title: Speckle-based x-ray phase-contrast and dark-field imaging with a laboratory source.
abstract: We report on the observation and application of near-field speckles with a laboratory x-ray source. The detection of speckles is possible thanks to the enhanced brilliance properties of the used liquid-metal-jet source, and opens the way to a range of new applications in laboratory-based coherent x-ray imaging. Here, we use the speckle pattern for multimodal imaging of demonstrator objects. Moreover, we introduce algorithms for phase and dark-field imaging using speckle tracking, and we show that they yield superior results with respect to existing methods.
authors.affiliation: Physik-Department, Technische Universität München, Garching 85748, Germany.
authors.forename: I
authors.initials: I
authors.lastname: Zanette
authors.affiliation: Department of Applied Physics, KTH Royal Institute of Technology, Stockholm 106 91, Sweden.
authors.forename: T
authors.initials: T
authors.lastname: Zhou
authors.affiliation: Department of Applied Physics, KTH Royal Institute of Technology, Stockholm 106 91, Sweden.
authors.forename: A
authors.initials: A
authors.lastname: Burvall
authors.affiliation: Department of Applied Physics, KTH Royal Institute of Technology, Stockholm 106 91, Sweden.
authors.forename: U
authors.initials: U
authors.lastname: Lundström
authors.affiliation: Department of Applied Physics, KTH Royal Institute of Technology, Stockholm 106 91, Sweden.
authors.forename: D H
authors.initials: DH
authors.lastname: Larsson
authors.affiliation: Physik-Department, Technische Universität München, Garching 85748, Germany.
authors.forename: M
authors.initials: M
authors.lastname: Zdora
authors.affiliation: Department of Physics & Astronomy, University College London, London WC1E 6BT, United Kingdom.
authors.forename: P
authors.initials: P
authors.lastname: Thibault
authors.affiliation: Physik-Department, Technische Universität München, Garching 85748, Germany.
authors.forename: F
authors.initials: F
authors.lastname: Pfeiffer
authors.affiliation: Department of Applied Physics, KTH Royal Institute of Technology, Stockholm 106 91, Sweden.
authors.forename: H M
authors.initials: HM
authors.lastname: Hertz