title: Calibration for medium resolution off-axis electron holography using a flexible dual-lens imaging system in a JEOL ARM 200F microscope.
abstract: In this work the calibration of a medium resolution off-axis electron holography using a dual-lens imaging system in a JEOL ARM 200F is shown. The objective dual-lens configuration allows adjusting the field of view from 35nm to 2.5μm. Subsequently, the parameters used in phase shift reconstruction were calibrated considering biprism voltage versus fringe spacing (σ) and versus fringe width (W). The reliability of the transmission electron microscope performance using these parameters was achieved using gold nanoparticles of known size and adjusting the excitation voltage of the lenses.
authors.affiliation: Department of Physics and Astronomy, University of Texas at San Antonio, One UTSA Circle, San Antonio, TX 78249, USA.
authors.forename: Jesus
authors.initials: J
authors.lastname: Cantu-Valle
authors.affiliation: Department of Physics and Astronomy, University of Texas at San Antonio, One UTSA Circle, San Antonio, TX 78249, USA.
authors.forename: Francisco
authors.initials: F
authors.lastname: Ruiz-Zepeda
authors.affiliation: Department of Physics and Astronomy, University of Texas at San Antonio, One UTSA Circle, San Antonio, TX 78249, USA.
authors.forename: Fernando
authors.initials: F
authors.lastname: Mendoza-Santoyo
authors.affiliation: Department of Physics and Astronomy, University of Texas at San Antonio, One UTSA Circle, San Antonio, TX 78249, USA.
authors.forename: Miguel
authors.initials: M
authors.lastname: Jose-Yacaman
authors.affiliation: Department of Physics and Astronomy, University of Texas at San Antonio, One UTSA Circle, San Antonio, TX 78249, USA. Electronic address: arturo.ponce@utsa.edu.
authors.forename: Arturo
authors.initials: A
authors.lastname: Ponce
mesh_terms: D002138:Calibration; D006696:Holography / Q000379:methods*; D046529:Microscopy, Electron, Transmission / Q000379:methods*; D036103:Nanotechnology / Q000379:methods
keywords: Dual-lens imaging; Electron holography; Electron optics; Metallic nanoparticles; Phase reconstruction