title: Probing and analyzing buried interfaces of multifunctional oxides using a secondary electron energy analyzer.
abstract: A contactless method of probing and analyzing multifunctional oxide interfaces using an electron energy analyzer inside a scanning electron microscope is presented. High contrast experimental secondary electron analyzer signals are used to detect changes in the interface conductivity of a LaAlO3/SrTiO3 sample. Monte Carlo simulations of the primary beam/specimen interaction are carried out and correlated with the experimental results in order to help understand the role of the primary beam energy and adjust it to enhance contrast.
authors.affiliation: Department of Electrical and Computer Engineering,Centre for Integrated Circuit Failure Analysis and Reliability (CICFAR),National University of Singapore,Singapore117581.
authors.forename: Avinash
authors.initials: A
authors.lastname: Srinivasan
authors.affiliation: Department of Electrical and Computer Engineering,Centre for Integrated Circuit Failure Analysis and Reliability (CICFAR),National University of Singapore,Singapore117581.
authors.forename: Anjam
authors.initials: A
authors.lastname: Khursheed