title: Fabrication of high quality plan-view TEM specimens using the focused ion beam.
abstract: We describe a technique using a focused ion beam instrument to fabricate high quality plan-view specimens for transmission electron microscopy studies. The technique is simple, site-specific and is capable of fabricating multiple large, >100 μm(2) electron transparent windows within epitaxially grown thin films. A film of La0.67Sr0.33MnO3 is used to demonstrate the technique and its structural and functional properties are surveyed by high resolution imaging, electron spectroscopy, atomic force microscopy and Lorentz electron microscopy. The window is demonstrated to have good thickness uniformity and a low defect density that does not impair the film's Curie temperature. The technique will enable the study of in-plane structural and functional properties of a variety of epitaxial thin film systems.
authors: SUPA, School of Physics and Astronomy, University of Glasgow, G12 8QQ, UK. Electronic address: Kerry.OShea@glasgow.ac.uk.
authors: K J
authors: KJ
authors: O'Shea
authors: SUPA, School of Physics and Astronomy, University of Glasgow, G12 8QQ, UK.
authors: D
authors: D
authors: McGrouther
authors: SUPA, School of Physics and Astronomy, University of Glasgow, G12 8QQ, UK.
authors: C A
authors: CA
authors: Ferguson
authors: University of Gottingen, Institute Physics 1, Friedrich Hund Pl 1, D-37077 Gottingen, Germany.
authors: M
authors: M
authors: Jungbauer
authors: University of Gottingen, Institute Physics 1, Friedrich Hund Pl 1, D-37077 Gottingen, Germany.
authors: S
authors: S
authors: Hühn
authors: University of Gottingen, Institute Physics 1, Friedrich Hund Pl 1, D-37077 Gottingen, Germany.
authors: V
authors: V
authors: Moshnyaga
authors: SUPA, School of Physics and Astronomy, University of Glasgow, G12 8QQ, UK.
authors: D A
authors: DA
authors: MacLaren
keywords: AFM; Epitaxial; FIB; Plan-view; TEM