title: Towards a unified description of the charge transport mechanisms in conductive atomic force microscopy studies of semiconducting polymers.
abstract: In this work, conductive atomic force microscopy (C-AFM) is used to study the local electrical properties in thin films of self-organized fibrillate poly(3-hexylthiophene) (P3HT), as a reference polymer semiconductor. Depending on the geometrical confinement in the transport channel, the C-AFM current is shown to be governed either by the charge transport in the film or by the carrier injection at the tip-sample contact, leading to either bulk or local electrical characterization of the semiconducting polymer, respectively. Local I-V profiles allow discrimination of the different dominating electrical mechanisms, i.e., resistive in the transport regime and space charge limited current (SCLC) in the local regime. A modified Mott-Gurney law is analytically derived for the contact regime, taking into account the point-probe geometry of the contact and the radial injection of carriers. Within the SCLC regime, the probed depth is shown to remain below 12 nm with a lateral electrical resolution below 5 nm. This confirms that high resolution is reached in those C-AFM measurements, which therefore allows for the analysis of single organic semiconducting nanostructures. The carrier density and mobility in the volume probed under the tip under steady-state conditions are also determined in the SCLC regime.
authors: Laboratory for Chemistry of Novel Materials, Center for Innovation and Research in Materials and Polymers - CIRMAP, University of Mons - UMONS, Place du Parc 20, B-7000 Mons, Belgium. olivier.douheret@materianova.be.
authors: D
authors: D
authors: Moerman
authors: N
authors: N
authors: Sebaihi
authors: S E
authors: SE
authors: Kaviyil
authors: P
authors: P
authors: Leclère
authors: R
authors: R
authors: Lazzaroni
authors: O
authors: O
authors: Douhéret