title: Polarization-resolved near-field mapping of plasmonic aperture emission by a dual-SNOM system.
abstract: We study the polarization characteristics of light emission and collection in the near field by the tips of a Dual-SNOM (two scanning near-field optical microscopes) setup. We find that cantilevered fiber probes can serve as emitters of polarized light, or as polarization-sensitive detectors. The polarization characteristics depend on the fiber type used for tip fabrication. In Dual-SNOM measurements, we demonstrate mapping of different field components of the plasmonic dipole pattern emitted by an aperture probe.
authors.affiliation: Institute of Applied Physics, Abbe Center of Photonics, Friedrich-Schiller-Universität Jena , Jena, Germany.
authors.forename: Angela E
authors.initials: AE
authors.lastname: Klein
authors.forename: Norik
authors.initials: N
authors.lastname: Janunts
authors.forename: Michael
authors.initials: M
authors.lastname: Steinert
authors.forename: Andreas
authors.initials: A
authors.lastname: Tünnermann
authors.forename: Thomas
authors.initials: T
authors.lastname: Pertsch
keywords: Near-field optical microscopy; dipole; plasmonics; scanning probe microscopy; surface plasmon polariton