title: Element specific monolayer depth profiling.
abstract: The electronic phase behavior and functionality of interfaces and surfaces in complex materials are strongly correlated to chemical composition profiles, stoichiometry and intermixing. Here a novel analysis scheme for resonant X-ray reflectivity maps is introduced to determine such profiles, which is element specific and non-destructive, and which exhibits atomic-layer resolution and a probing depth of hundreds of nanometers.
authors.affiliation: Quantum Matter Institute and Department of Physics and Astronomy, University of British Columbia, 2355 East Mall, Vancouver, V6T 1Z4, Canada; Max Planck Institute for Solid State Research, Heisenbergstraße 1, 70569, Stuttgart, Germany.
authors.forename: Sebastian
authors.initials: S
authors.lastname: Macke
authors.forename: Abdullah
authors.initials: A
authors.lastname: Radi
authors.forename: Jorge E
authors.initials: JE
authors.lastname: Hamann-Borrero
authors.forename: Adriano
authors.initials: A
authors.lastname: Verna
authors.forename: Martin
authors.initials: M
authors.lastname: Bluschke
authors.forename: Sebastian
authors.initials: S
authors.lastname: Brück
authors.forename: Eberhard
authors.initials: E
authors.lastname: Goering
authors.forename: Ronny
authors.initials: R
authors.lastname: Sutarto
authors.forename: Feizhou
authors.initials: F
authors.lastname: He
authors.forename: Georg
authors.initials: G
authors.lastname: Cristiani
authors.forename: Meng
authors.initials: M
authors.lastname: Wu
authors.forename: Eva
authors.initials: E
authors.lastname: Benckiser
authors.forename: Hanns-Ulrich
authors.initials: HU
authors.lastname: Habermeier
authors.forename: Gennady
authors.initials: G
authors.lastname: Logvenov
authors.forename: Nicolas
authors.initials: N
authors.lastname: Gauquelin
authors.forename: Gianluigi A
authors.initials: GA
authors.lastname: Botton
authors.forename: Adam P
authors.initials: AP
authors.lastname: Kajdos
authors.forename: Susanne
authors.initials: S
authors.lastname: Stemmer
authors.forename: George A
authors.initials: GA
authors.lastname: Sawatzky
authors.forename: Maurits W
authors.initials: MW
authors.lastname: Haverkort
authors.forename: Bernhard
authors.initials: B
authors.lastname: Keimer
authors.forename: Vladimir
authors.initials: V
authors.lastname: Hinkov
mesh_terms: D049329:Nanostructures / Q000737:chemistry*; D055620:Optical Phenomena; D013057:Spectrum Analysis; D014965:X-Rays
keywords: complex functional materials; depth profiling; non-destructive characterization; resonant X-ray reflectivity; thin film heterostructures