title: A thermally annealed Mach-Zehnder interferometer for high temperature measurement.
abstract: An in-fiber Mach-Zehnder interferometer (MZI) for high temperature measurement is proposed and experimentally demonstrated. The device is constructed of a piece of thin-core fiber (TCF) sandwiched between two short sections of multimode fiber (MMF), i.e., a MMF-TCF-MMF structure. A well-defined interference spectrum is obtained owing to the core-mismatch, and the interference dips are sensitive to the ambient temperature. The experimental results show that the proposed interferometer is capable of high temperature measurement up to 875 °C with a sensitivity of 92 pm/°C over repeated measurements. The explored wavelength drop point may limit the measurement range, which can be improved by repeated thermal annealing.
authors.affiliation: Physics Department, Northwest University, No.229, Taibai Road (North), Xi'an 710069, China. fengzhongyao@nwu.edu.cn.
authors.forename: Zhongyao
authors.initials: Z
authors.lastname: Feng
authors.affiliation: Physics Department, Northwest University, No.229, Taibai Road (North), Xi'an 710069, China. jcli@stumail.nwu.edu.cn.
authors.forename: Jiacheng
authors.initials: J
authors.lastname: Li
authors.affiliation: Physics Department, Northwest University, No.229, Taibai Road (North), Xi'an 710069, China. xgqiao@nwu.edu.cn.
authors.forename: Xueguang
authors.initials: X
authors.lastname: Qiao
authors.affiliation: Physics Department, Northwest University, No.229, Taibai Road (North), Xi'an 710069, China. lli@stumail.nwu.edu.cn.
authors.forename: Ling
authors.initials: L
authors.lastname: Li
authors.affiliation: Physics Department, Northwest University, No.229, Taibai Road (North), Xi'an 710069, China. yanghz@nwu.edu.cn.
authors.forename: Hangzhou
authors.initials: H
authors.lastname: Yang
authors.affiliation: Physics Department, Northwest University, No.229, Taibai Road (North), Xi'an 710069, China. huml@nwu.edu.cn.
authors.forename: Manli
authors.initials: M
authors.lastname: Hu
mesh_terms: D004867:Equipment Design / Q000295:instrumentation*; D006358:Hot Temperature; D007368:Interferometry / Q000295:instrumentation* / Q000379:methods*
references.citation: Appl Opt. 1999 Jun 1;38(16):3450-9
references.pmid: 18319944
references.citation: Opt Lett. 2004 Jun 1;29(11):1185-7
references.pmid: 15209241
references.citation: Opt Express. 2011 Jun 20;19(13):12418-26
references.pmid: 21716480
references.citation: Opt Lett. 1996 May 1;21(9):692-4
references.pmid: 19876127
references.citation: Opt Lett. 2011 Oct 1;36(19):3753-5
references.pmid: 21964086
references.citation: Opt Lett. 2011 Oct 15;36(20):4029-31
references.pmid: 22002375
references.citation: Opt Express. 2012 May 7;20(10):11109-20
references.pmid: 22565734
references.citation: Opt Express. 2011 Jan 17;19(2):1198-206
references.pmid: 21263661
references.citation: Opt Lett. 2005 Apr 1;30(7):711-3
references.pmid: 15832914
references.citation: Opt Express. 2013 Feb 25;21(4):4591-7
references.pmid: 23481992