title: Experimental method for testing diffraction properties of reflection waveguide holograms.
abstract: Waveguide holograms' diffraction properties include peak wavelength and diffraction efficiency, which play an important role in determining their display performance. Based on the record and reconstruction theory of reflection waveguide holograms, a novel experimental method for testing diffraction properties is introduced and analyzed in this paper, which uses a plano-convex lens optically contacted to the surface of the substrate plate of the waveguide hologram, so that the diffracted light beam can be easily detected. Then an experiment is implemented. The designed reconstruction wavelength of the test sample is 530 nm, and its diffraction efficiency is 100%. The experimental results are a peak wavelength of 527.7 nm and a diffraction efficiency of 94.1%. It is shown that the tested value corresponds well with the designed value.
authors.forename: Yi
authors.initials: Y
authors.lastname: Xie
authors.forename: Ming-Wu
authors.initials: MW
authors.lastname: Kang
authors.forename: Bao-Ping
authors.initials: BP
authors.lastname: Wang