title: Magnetic reflectometry of heterostructures.
abstract: Measuring the magnetic configuration at complex buried layers and interfaces is an important task, which requires especially a non-destructive probing technique. X-ray resonant magnetic reflectometry (XRMR) combines the non-destructive depth profiling potential of x-ray reflectometry with the excellent sensitivity for magnetic phenomena, utilizing the x-ray magnetic circular dichroism effect. It provides the magnetic spatial distribution with a precision down to the angstrom scale, combined with element and symmetry specificity, sub-monolayer sensitivity, and the possible separation of spin and orbital magnetic moments. This review provides an overview to the XRMR technique in a tutorial way. We focus on the introduction to the theory, measurement types, and data simulation. We provide related experimental examples and show selected applications.
authors.affiliation: Quantum Matter Institute, University of British Columbia, 2355 East Mall, Vancouver V6T 1Z4, Canada. Max Planck Institute for Solid State Research, Heisenbergstraße 1, 70569 Stuttgart, Germany.
authors.forename: S
authors.initials: S
authors.lastname: Macke
authors.forename: E
authors.initials: E
authors.lastname: Goering