title: Atomic force microscope-assisted scanning tunneling spectroscopy under ambient conditions.
abstract: We have developed a method of atomic force microscopy (AFM)-assisted scanning tunneling spectroscopy (STS) under ambient conditions. An AFM function is used for rapid access to a selected position prior to performing STS. The AFM feedback is further used to suppress vertical thermal drift of the tip-sample distance during spectroscopy, enabling flexible and stable spectroscopy measurements at room temperature.
authors.affiliation: Department of Physics, Graduate School of Science, Tohoku University, Sendai, Miyagi 980-8578, Japan amin-v@s.tohoku.ac.jp.
authors.forename: Amin
authors.initials: A
authors.lastname: Vakhshouri
authors.affiliation: Department of Physics, Graduate School of Science, Tohoku University, Sendai, Miyagi 980-8578, Japan JST, ERATO Nuclear Spin Electronics Project, Sendai 980-8578, Japan.
authors.forename: Katsushi
authors.initials: K
authors.lastname: Hashimoto
authors.affiliation: Department of Physics, Graduate School of Science, Tohoku University, Sendai, Miyagi 980-8578, Japan JST, ERATO Nuclear Spin Electronics Project, Sendai 980-8578, Japan WPI-AIMR, Tohoku University, Sendai 980-8577, Japan.
authors.forename: Yoshiro
authors.initials: Y
authors.lastname: Hirayama
keywords: combined atomic force/tunneling microscopy; room temperature tunneling spectroscopy; thermal drift suppression