title: Near surface magnetic domain observation with ultra-high resolution.
abstract: Near field magnetic force microscopy (NF-MFM) has been demonstrated to locally observe the magnetic fine structures in nanosized recording bits at an operating distance of 1 nm. The nanoscale magnetic domains, the polarity of surface magnetic charges, as well as the 3D magnetic fields leaking from the bits are investigated via NF-MFM with a soft NiFe tip. A Fourier analysis of the images suggests that the magnetic moment can be determined locally in a volume as small as 5 nanometers. The NF-MFM is crucial to the analysis of surface magnetic features and allows a wide range of future applications, for example, in data storage and biomedicine.
authors.affiliation: Liaoning Key Lab of Optoelectronic Films & Materials, School of Physics and Materials Engineering, Dalian Nationalities University, Dalian, 116600, China. dongping.liu@dlnu.edu.cn.
authors.forename: Zhenghua
authors.initials: Z
authors.lastname: Li
authors.forename: Xiang
authors.initials: X
authors.lastname: Li
authors.forename: Dongping
authors.initials: D
authors.lastname: Liu
authors.forename: H
authors.initials: H
authors.lastname: Saito
authors.forename: S
authors.initials: S
authors.lastname: Ishio