title: Real-time DC-dynamic biasing method for switching time improvement in severely underdamped fringing-field electrostatic MEMS actuators.
abstract: Mechanically underdamped electrostatic fringing-field MEMS actuators are well known for their fast switching operation in response to a unit step input bias voltage. However, the tradeoff for the improved switching performance is a relatively long settling time to reach each gap height in response to various applied voltages. Transient applied bias waveforms are employed to facilitate reduced switching times for electrostatic fringing-field MEMS actuators with high mechanical quality factors. Removing the underlying substrate of the fringing-field actuator creates the low mechanical damping environment necessary to effectively test the concept. The removal of the underlying substrate also a has substantial improvement on the reliability performance of the device in regards to failure due to stiction. Although DC-dynamic biasing is useful in improving settling time, the required slew rates for typical MEMS devices may place aggressive requirements on the charge pumps for fully-integrated on-chip designs. Additionally, there may be challenges integrating the substrate removal step into the back-end-of-line commercial CMOS processing steps. Experimental validation of fabricated actuators demonstrates an improvement of 50x in switching time when compared to conventional step biasing results. Compared to theoretical calculations, the experimental results are in good agreement.
authors.affiliation: Department of Electrical and Computer Engineering, University of California, Davis; jasmall@ucdavis.edu.
authors.forename: Joshua
authors.initials: J
authors.lastname: Small
authors.affiliation: Digital Light Projection (DLP) Technology Development, Texas Instruments.
authors.forename: Adam
authors.initials: A
authors.lastname: Fruehling
authors.affiliation: Birck Nanotechnology Center and the Department of Electrical and Computer Engineering, Purdue University.
authors.forename: Anurag
authors.initials: A
authors.lastname: Garg
authors.affiliation: Department of Electrical and Computer Engineering, University of California, Davis.
authors.forename: Xiaoguang
authors.initials: X
authors.lastname: Liu
authors.affiliation: Birck Nanotechnology Center and the Department of Electrical and Computer Engineering, Purdue University.
authors.forename: Dimitrios
authors.initials: D
authors.lastname: Peroulis
mesh_terms: D004867:Equipment Design; D055595:Mechanical Phenomena; D055617:Micro-Electrical-Mechanical Systems / Q000295:instrumentation* / Q000379:methods*; D055672:Static Electricity