title: Opto-mechanical probe for combining atomic force microscopy and optical near-field surface analysis.
abstract: We have developed a new easy-to-use probe that can be used to combine atomic force microscopy (AFM) and scanning near-field optical microscopy (SNOM). We show that, using this device, the evanescent field, obtained by total internal reflection conditions in a prism, can be visualized by approaching the surface with the scanning tip. Furthermore, we were able to obtain simultaneous AFM and SNOM images of a standard test grating in air and in liquid. The lateral resolution in AFM and SNOM mode was estimated to be 45 and 160 nm, respectively. This new probe overcomes a number of limitations that commercial probes have, while yielding the same resolution.
authors.forename: C H
authors.initials: CH
authors.lastname: van Hoorn
authors.forename: D C
authors.initials: DC
authors.lastname: Chavan
authors.forename: B
authors.initials: B
authors.lastname: Tiribilli
authors.forename: G
authors.initials: G
authors.lastname: Margheri
authors.forename: A J G
authors.initials: AJ
authors.lastname: Mank
authors.forename: F
authors.initials: F
authors.lastname: Ariese
authors.forename: D
authors.initials: D
authors.lastname: Iannuzzi