title: Electron beam position monitor for a dielectric microaccelerator.
abstract: We report the fabrication and first demonstration of an electron beam position monitor for a dielectric microaccelerator. This device is fabricated on a fused silica substrate using standard optical lithography techniques and uses the radiated optical wavelength to measure the electron beam position with a resolution of 10 μm, or 7% of the electron beam spot size. This device also measures the electron beam spot size in one dimension.
authors.forename: Ken
authors.initials: K
authors.lastname: Soong
authors.forename: Edgar A
authors.initials: EA
authors.lastname: Peralta
authors.forename: R Joel
authors.initials: RJ
authors.lastname: England
authors.forename: Ziran
authors.initials: Z
authors.lastname: Wu
authors.forename: Eric R
authors.initials: ER
authors.lastname: Colby
authors.forename: Igor
authors.initials: I
authors.lastname: Makasyuk
authors.forename: James P
authors.initials: JP
authors.lastname: MacArthur
authors.forename: Andrew
authors.initials: A
authors.lastname: Ceballos
authors.forename: Robert L
authors.initials: RL
authors.lastname: Byer