title: Direct measurement of the thickness-dependent electronic band structure of MoS2 using angle-resolved photoemission spectroscopy.
abstract: We report on the evolution of the thickness-dependent electronic band structure of the two-dimensional layered-dichalcogenide molybdenum disulfide (MoS2). Micrometer-scale angle-resolved photoemission spectroscopy of mechanically exfoliated and chemical-vapor-deposition-grown crystals provides direct evidence for the shifting of the valence band maximum from Γ to K, for the case of MoS2 having more than one layer, to the case of single-layer MoS2, as predicted by density functional theory. This evolution of the electronic structure from bulk to few-layer to monolayer MoS2 had earlier been predicted to arise from quantum confinement. Furthermore, one of the consequences of this progression in the electronic structure is the dramatic increase in the hole effective mass, in going from bulk to monolayer MoS2 at its Brillouin zone center, which is known as the cause for the decreased carrier mobility of the monolayer form compared to that of bulk MoS2.
authors.affiliation: Department of Applied Physics and Applied Mathematics, Columbia University, New York, New York 10027, USA.
authors.forename: Wencan
authors.initials: W
authors.lastname: Jin
authors.affiliation: Department of Electrical Engineering, Columbia University, New York, New York 10027, USA.
authors.forename: Po-Chun
authors.initials: PC
authors.lastname: Yeh
authors.affiliation: Department of Electrical Engineering, Columbia University, New York, New York 10027, USA.
authors.forename: Nader
authors.initials: N
authors.lastname: Zaki
authors.affiliation: Department of Applied Physics and Applied Mathematics, Columbia University, New York, New York 10027, USA.
authors.forename: Datong
authors.initials: D
authors.lastname: Zhang
authors.affiliation: Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, New York 11973, USA.
authors.forename: Jerzy T
authors.initials: JT
authors.lastname: Sadowski
authors.affiliation: Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, New York 11973, USA.
authors.forename: Abdullah
authors.initials: A
authors.lastname: Al-Mahboob
authors.affiliation: Energy Frontier Research Center, Columbia University, New York, New York 10027, USA and Department of Mechanical Engineering, Columbia University, New York, New York 10027, USA.
authors.forename: Arend M
authors.initials: AM
authors.lastname: van der Zande
authors.affiliation: Department of Mechanical Engineering, Columbia University, New York, New York 10027, USA.
authors.forename: Daniel A
authors.initials: DA
authors.lastname: Chenet
authors.affiliation: Department of Applied Physics and Applied Mathematics, Columbia University, New York, New York 10027, USA.
authors.forename: Jerry I
authors.initials: JI
authors.lastname: Dadap
authors.affiliation: Department of Applied Physics and Applied Mathematics, Columbia University, New York, New York 10027, USA.
authors.forename: Irving P
authors.initials: IP
authors.lastname: Herman
authors.affiliation: Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, New York 11973, USA.
authors.forename: Peter
authors.initials: P
authors.lastname: Sutter
authors.affiliation: Department of Mechanical Engineering, Columbia University, New York, New York 10027, USA.
authors.forename: James
authors.initials: J
authors.lastname: Hone
authors.affiliation: Department of Applied Physics and Applied Mathematics, Columbia University, New York, New York 10027, USA and Department of Electrical Engineering, Columbia University, New York, New York 10027, USA.
authors.forename: Richard M
authors.initials: RM
authors.lastname: Osgood