title: Scanning force microscope for in situ nanofocused X-ray diffraction studies.
abstract: A compact scanning force microscope has been developed for in situ combination with nanofocused X-ray diffraction techniques at third-generation synchrotron beamlines. Its capabilities are demonstrated on Au nano-islands grown on a sapphire substrate. The new in situ device allows for in situ imaging the sample topography and the crystallinity by recording simultaneously an atomic force microscope (AFM) image and a scanning X-ray diffraction map of the same area. Moreover, a selected Au island can be mechanically deformed using the AFM tip while monitoring the deformation of the atomic lattice by nanofocused X-ray diffraction. This in situ approach gives access to the mechanical behavior of nanomaterials.
authors.affiliation: IM2NP (UMR 7334), Aix-Marseille Université, CNRS, Faculté des Sciences, Campus de Saint-Jérôme, Avenue Escadrille Normandie Niemen - Case 142, F-13397 Marseille, France.
authors.forename: Zhe
authors.initials: Z
authors.lastname: Ren
authors.affiliation: IM2NP (UMR 7334), Aix-Marseille Université, CNRS, Faculté des Sciences, Campus de Saint-Jérôme, Avenue Escadrille Normandie Niemen - Case 142, F-13397 Marseille, France.
authors.forename: Francesca
authors.initials: F
authors.lastname: Mastropietro
authors.affiliation: IM2NP (UMR 7334), Aix-Marseille Université, CNRS, Faculté des Sciences, Campus de Saint-Jérôme, Avenue Escadrille Normandie Niemen - Case 142, F-13397 Marseille, France.
authors.forename: Anton
authors.initials: A
authors.lastname: Davydok
authors.affiliation: Grenoble Institute of Technology and CNRS, BP 75, F-38402 Saint-Martin d'Hères Cedex, France.
authors.forename: Simon
authors.initials: S
authors.lastname: Langlais
authors.affiliation: IM2NP (UMR 7334), Aix-Marseille Université, CNRS, Faculté des Sciences, Campus de Saint-Jérôme, Avenue Escadrille Normandie Niemen - Case 142, F-13397 Marseille, France.
authors.forename: Marie Ingrid
authors.initials: MI
authors.lastname: Richard
authors.affiliation: IM2NP (UMR 7334), Aix-Marseille Université, CNRS, Faculté des Sciences, Campus de Saint-Jérôme, Avenue Escadrille Normandie Niemen - Case 142, F-13397 Marseille, France.
authors.forename: Jean Jacques
authors.initials: JJ
authors.lastname: Furter
authors.affiliation: IM2NP (UMR 7334), Aix-Marseille Université, CNRS, Faculté des Sciences, Campus de Saint-Jérôme, Avenue Escadrille Normandie Niemen - Case 142, F-13397 Marseille, France.
authors.forename: Olivier
authors.initials: O
authors.lastname: Thomas
authors.affiliation: Grenoble Institute of Technology and CNRS, BP 75, F-38402 Saint-Martin d'Hères Cedex, France.
authors.forename: Maxime
authors.initials: M
authors.lastname: Dupraz
authors.affiliation: Grenoble Institute of Technology and CNRS, BP 75, F-38402 Saint-Martin d'Hères Cedex, France.
authors.forename: Marc
authors.initials: M
authors.lastname: Verdier
authors.affiliation: Grenoble Institute of Technology and CNRS, BP 75, F-38402 Saint-Martin d'Hères Cedex, France.
authors.forename: Guillaume
authors.initials: G
authors.lastname: Beutier
authors.affiliation: European Synchrotron Radiation Facility (ESRF), 6 rue Jules Horowitz, BP 220, 38043 Grenoble, France.
authors.forename: Peter
authors.initials: P
authors.lastname: Boesecke
authors.affiliation: IM2NP (UMR 7334), Aix-Marseille Université, CNRS, Faculté des Sciences, Campus de Saint-Jérôme, Avenue Escadrille Normandie Niemen - Case 142, F-13397 Marseille, France.
authors.forename: Thomas W
authors.initials: TW
authors.lastname: Cornelius
keywords: in situ atomic force microscopy; mechanical properties; nanofocused X-ray diffraction; nanostructure