title: Dependence of the contact resistance on the design of stranded conductors.
abstract: During the manufacturing process multi-strand conductors are subject to compressive force and rotation moments. The current distribution in the multi-strand conductors is not uniform and is controlled by the transverse resistivity. This is mainly determined by the contact resistance at the strand crossovers and inter-strand contact resistance. The surface layer properties, and in particular the crystalline structure and degree of oxidation, are key parameters in determining the transverse resistivity. The experimental set-ups made it possible to find the dependence of contact resistivity as a function of continuous working stresses and cable design. A study based on measurements and numerical simulation is made to identify the contact resistivity functions.
authors.affiliation: Lille Nord de France, F-59000 Lille, France. youcef.zeroukhi@nexans.com.
authors.forename: Youcef
authors.initials: Y
authors.lastname: Zeroukhi
authors.affiliation: Lille Nord de France, F-59000 Lille, France. ewa.napieralskajuszczak@univ-artois.fr.
authors.forename: Ewa
authors.initials: E
authors.lastname: Napieralska-Juszczak
authors.affiliation: Nexans, 62300 Lens, Bd de Marais, France. guillaume.vega@nexans.com.
authors.forename: Guillaume
authors.initials: G
authors.lastname: Vega
authors.affiliation: Institute of Mechatronics and Information Systems Technical University of Lodz, Stefanowskiego 18/22, Lodz, Poland. komeza@p.lodz.pl.
authors.forename: Krzysztof
authors.initials: K
authors.lastname: Komeza
authors.affiliation: Lille Nord de France, F-59000 Lille, France. fabrice.morganti@univ-artois.fr.
authors.forename: Fabrice
authors.initials: F
authors.lastname: Morganti
authors.affiliation: Institute of Mechatronics and Information Systems Technical University of Lodz, Stefanowskiego 18/22, Lodz, Poland. swiak@wp.pl.
authors.forename: Slawomir
authors.initials: S
authors.lastname: Wiak
mesh_terms: D003198:Computer Simulation; D004553:Electric Conductivity; D013499:Surface Properties