title: Practical aspects of the use of the X(2) holder for HRTEM-quality TEM sample preparation by FIB.
abstract: The X(2) holder enables the effective production of thin, electron transparent samples for high-resolution transmission electron microscopy (HRTEM). Improvements to the X(2) holder for high-quality transmission electron microscopy (TEM) sample preparation are presented in this paper. We discuss the influence of backscattered electrons (BSE) from the sample holder in determining the lamella thickness in situ and demonstrate that a significant improvement in thickness determination can be achieved by comparatively simple means using the relative BSE intensity. We show (using Monte Carlo simulations) that by taking into account the finite collection angle of the electron backscatter detector, an approximately 20% underestimation of the lamella thickness in a silicon sample can be avoided. However, a correct thickness determination for light-element lamellas still remains a problem with the backscatter method; we introduce a more accurate method using the energy dispersive X-ray spectroscopy (EDX) signal for in situ thickness determination. Finally, we demonstrate how to produce a thin lamella with a nearly damage-free surface using the X(2) holder in combination with sub-kV polishing in the Fischione Instruments׳ NanoMill(®) TEM specimen preparation system.
authors.affiliation: Materialwissenschaftliche Elektronenmikroskopie, University of Ulm, Germany. Electronic address: VanmiW01@matthey.com.
authors.forename: Willem
authors.initials: W
authors.lastname: van Mierlo
authors.affiliation: Materialwissenschaftliche Elektronenmikroskopie, University of Ulm, Germany.
authors.forename: Dorin
authors.initials: D
authors.lastname: Geiger
authors.affiliation: E.A. Fischione Instruments, Inc., 9003 Corporate Circle, Export, PA 15632, USA.
authors.forename: Alan
authors.initials: A
authors.lastname: Robins
authors.affiliation: E.A. Fischione Instruments, Inc., 9003 Corporate Circle, Export, PA 15632, USA.
authors.forename: Matthias
authors.initials: M
authors.lastname: Stumpf
authors.affiliation: E.A. Fischione Instruments, Inc., 9003 Corporate Circle, Export, PA 15632, USA.
authors.forename: Mary Louise
authors.initials: ML
authors.lastname: Ray
authors.affiliation: E.A. Fischione Instruments, Inc., 9003 Corporate Circle, Export, PA 15632, USA.
authors.forename: Paul
authors.initials: P
authors.lastname: Fischione
authors.affiliation: Materialwissenschaftliche Elektronenmikroskopie, University of Ulm, Germany.
authors.forename: Ute
authors.initials: U
authors.lastname: Kaiser
keywords: Backscattered electrons; Carlo simulations; EDX; FIB; Monte; Sample thickness; Sub-kV argon milling; TEM specimen preparation