title: An X-ray diffractometer using mirage diffraction.
abstract: Some characteristics are reported of a triple-crystal diffractometer with a (+, -, +) setting of Si(220) using mirage diffraction. The first crystal is flat, while the second and third crystals are bent. Basically, the first crystal is used as a collimator, the second as a monochromator and the third as the sample. The third crystal also works as an analyzer. The advantages of this diffractometer are that its setup is easy, its structure is simple, the divergence angle from the second crystal is small and the energy resolution of the third crystal is high, of the order of sub-meV.
authors.affiliation: Saitama Institute of Technology, Fukaya, Saitama 369-0293, Japan.
authors.forename: Tomoe
authors.initials: T
authors.lastname: Fukamachi
authors.affiliation: Saitama Institute of Technology, Fukaya, Saitama 369-0293, Japan.
authors.forename: Sukswat
authors.initials: S
authors.lastname: Jongsukswat
authors.affiliation: Saitama Institute of Technology, Fukaya, Saitama 369-0293, Japan.
authors.forename: Dongying
authors.initials: D
authors.lastname: Ju
authors.affiliation: Saitama Institute of Technology, Fukaya, Saitama 369-0293, Japan.
authors.forename: Riichirou
authors.initials: R
authors.lastname: Negishi
authors.affiliation: Institute of Material Structure Science, KEK-PF, High Energy Accelerator Research Organization, Tsukuba, Ibaraki 305-0801, Japan.
authors.forename: Keiichi
authors.initials: K
authors.lastname: Hirano
authors.affiliation: University of Yamanashi, Kofu, 400-8510, Japan.
authors.forename: Takaaki
authors.initials: T
authors.lastname: Kawamura
keywords: X-ray difractometers; dynamical theory of X-ray diffraction; interference fringes; mirage diffraction; mirage fringes; monochromators