title: Validation study of a ray-tracing simulator for focal construct geometry.
abstract: We present the results of a computer modelling package designed to simulate X-ray diffraction imaging employing focal construct geometry. The paths of coherently diffracted X-rays are modelled by ray-tracing. The results of the study show good agreement between simulated and measured data obtained in the laboratory. The validation of the modelling package permits the rapid optimisation and prototyping of focal construct technology, which has wide applicability in security X-ray imaging.
authors.affiliation: Imaging Science Group, Rosalind Franklin Building, Nottingham Trent University, Nottingham NG11 8NS, UK.
authors.forename: Anthony
authors.initials: A
authors.lastname: Dicken
authors.affiliation: Department of Engineering and Applied Science, Cranfield University, Shrivenham SN68LA, UK.
authors.forename: Keith
authors.initials: K
authors.lastname: Rogers
authors.affiliation: Imaging Science Group, Rosalind Franklin Building, Nottingham Trent University, Nottingham NG11 8NS, UK.
authors.forename: Simon
authors.initials: S
authors.lastname: Godber
authors.affiliation: Department of Engineering and Applied Science, Cranfield University, Shrivenham SN68LA, UK.
authors.forename: Danae
authors.initials: D
authors.lastname: Prokopiou
authors.affiliation: Imaging Science Group, Rosalind Franklin Building, Nottingham Trent University, Nottingham NG11 8NS, UK.
authors.forename: Alex
authors.initials: A
authors.lastname: Shevchuk
authors.affiliation: Imaging Science Group, Rosalind Franklin Building, Nottingham Trent University, Nottingham NG11 8NS, UK.
authors.forename: Graham
authors.initials: G
authors.lastname: Tranfield
authors.affiliation: Imaging Science Group, Rosalind Franklin Building, Nottingham Trent University, Nottingham NG11 8NS, UK. Electronic address: paul.evans@ntu.ac.uk.
authors.forename: Paul
authors.initials: P
authors.lastname: Evans
keywords: Aviation security; Diffraction geometry; Focal construct geometry; Ray-tracing simulator; X-ray diffraction