title: Enhanced electrical properties in sub-10-nm WO3 nanoflakes prepared via a two-step sol-gel-exfoliation method.
abstract: The morphology and electrical properties of orthorhombic β-WO3 nanoflakes with thickness of ~7 to 9 nm were investigated at the nanoscale with a combination of scanning electron microscopy (SEM), energy dispersive X-ray spectroscopy (EDX), current sensing force spectroscopy atomic force microscopy (CSFS-AFM, or PeakForce TUNA™), Fourier transform infra-red absorption spectroscopy (FTIR), linear sweep voltammetry (LSV) and Raman spectroscopy techniques. CSFS-AFM analysis established good correlation between the topography of the developed nanostructures and various features of WO3 nanoflakes synthesized via a two-step sol-gel-exfoliation method. It was determined that β-WO3 nanoflakes annealed at 550°C possess distinguished and exceptional thickness-dependent properties in comparison with the bulk, micro and nanostructured WO3 synthesized at alternative temperatures.
authors.affiliation: Materials Science and Engineering Division, CSIRO, 37 Graham Road, Highett, VIC 3190, Australia.
authors.forename: Serge
authors.initials: S
authors.lastname: Zhuiykov
authors.affiliation: Materials Science and Engineering Division, CSIRO, 37 Graham Road, Highett, VIC 3190, Australia.
authors.forename: Eugene
authors.initials: E
authors.lastname: Kats
keywords: Exfoliation; Layered semiconductors; Nanoflake; Sol-gel; WO3