title: Invited article: Characterization of background sources in space-based time-of-flight mass spectrometers.
abstract: For instruments that use time-of-flight techniques to measure space plasma, there are common sources of background signals that evidence themselves in the data. The background from these sources may increase the complexity of data analysis and reduce the signal-to-noise response of the instrument, thereby diminishing the science value or usefulness of the data. This paper reviews several sources of background commonly found in time-of-flight mass spectrometers and illustrates their effect in actual data using examples from ACE-SWICS and MESSENGER-FIPS. Sources include penetrating particles and radiation, UV photons, energy straggling and angular scattering, electron stimulated desorption of ions, ion-induced electron emission, accidental coincidence events, and noise signatures from instrument electronics. Data signatures of these sources are shown, as well as mitigation strategies and design considerations for future instruments.
authors.affiliation: Department of Atmospheric, Oceanic and Space Sciences, University of Michigan, 2455 Hayward St, Ann Arbor, Michigan 48109, USA.
authors.forename: J A
authors.initials: JA
authors.lastname: Gilbert
authors.affiliation: Department of Atmospheric, Oceanic and Space Sciences, University of Michigan, 2455 Hayward St, Ann Arbor, Michigan 48109, USA.
authors.forename: D J
authors.initials: DJ
authors.lastname: Gershman
authors.affiliation: Department of Atmospheric, Oceanic and Space Sciences, University of Michigan, 2455 Hayward St, Ann Arbor, Michigan 48109, USA.
authors.forename: G
authors.initials: G
authors.lastname: Gloeckler
authors.affiliation: Department of Atmospheric, Oceanic and Space Sciences, University of Michigan, 2455 Hayward St, Ann Arbor, Michigan 48109, USA.
authors.forename: R A
authors.initials: RA
authors.lastname: Lundgren
authors.affiliation: Department of Atmospheric, Oceanic and Space Sciences, University of Michigan, 2455 Hayward St, Ann Arbor, Michigan 48109, USA.
authors.forename: T H
authors.initials: TH
authors.lastname: Zurbuchen
authors.affiliation: Georgia Institute of Technology, 225 North Ave NW, Atlanta, Georgia 30332, USA.
authors.forename: T M
authors.initials: TM
authors.lastname: Orlando
authors.affiliation: Georgia Institute of Technology, 225 North Ave NW, Atlanta, Georgia 30332, USA.
authors.forename: J
authors.initials: J
authors.lastname: McLain
authors.affiliation: International Space Science Institute, Hallerstrasse 6, CH-3012 Bern, Switzerland and Physikalisches Institut, Universität Bern, Sidlerstrasse 5, CH-3012 Bern, Switzerland.
authors.forename: R
authors.initials: R
authors.lastname: von Steiger