title: Optimal sample preparation to characterize corrosion in historical photographs with analytical TEM.
abstract: An alternative focused ion beam preparation method is used for sampling historical photographs containing metallic nanoparticles in a polymer matrix. We use the preparation steps of classical ultra-microtomy with an alternative final sectioning with a focused ion beam. Transmission electron microscopy techniques show that the lamella has a uniform thickness, which is an important factor for analytical transmission electron microscopy. Furthermore, the method maintains the spatial distribution of nanoparticles in the soft matrix. The results are compared with traditional preparation techniques such as ultra-microtomy and classical focused ion beam milling.
authors.affiliation: 1EMAT,Department of Physics,University of Antwerp,Groeneborgerlaan 171,2020 Antwerp,Belgium.
authors.forename: Eva
authors.initials: E
authors.lastname: Grieten
authors.affiliation: 2Research Group Heritage & Sustainability, Faculty of Design Sciences, Conservation Studies,University of Antwerp,Blindestraat 9, 2000 Antwerp,Belgium.
authors.forename: Joost
authors.initials: J
authors.lastname: Caen
authors.affiliation: 1EMAT,Department of Physics,University of Antwerp,Groeneborgerlaan 171,2020 Antwerp,Belgium.
authors.forename: Dominique
authors.initials: D
authors.lastname: Schryvers
mesh_terms: D002623:Chemistry Techniques, Analytical / Q000379:methods*; D003343:Corrosion; D008670:Metals / Q000032:analysis*; D046529:Microscopy, Electron, Transmission / Q000379:methods*; D008867:Microtomy / Q000379:methods*; D053758:Nanoparticles / Q000032:analysis*
chemical_list: D008670:Metals