title: Patient specific seizure prediction system using Hilbert spectrum and Bayesian networks classifiers.
abstract: The aim of this paper is to develop an automated system for epileptic seizure prediction from intracranial EEG signals based on Hilbert-Huang transform (HHT) and Bayesian classifiers. Proposed system includes decomposition of the signals into intrinsic mode functions for obtaining features and use of Bayesian networks with correlation based feature selection for binary classification of preictal and interictal recordings. The system was trained and tested on Freiburg EEG database. 58 hours of preictal data, 40-minute data blocks prior to each of 87 seizures collected from 21 patients, and 503.1 hours of interictal data were examined resulting in 96.55% sensitivity with 0.21 false alarms per hour, 13.896% average proportion of time spent in warning, and 33.21 minutes of average detection latency using 30-second EEG segments with 50% overlap and a simple postprocessing technique resulting in a decision (a seizure is expected/not expected) every 5 minutes. High sensitivity and low false positive rate with reasonable detection latency show that HHT based features are acceptable for patient specific seizure prediction from intracranial EEG data. Time spent for testing an EEG segment was 4.1451 seconds on average, which makes the system viable for use in real-time seizure control systems.
authors.affiliation: Iskenderun Vocational School, Mustafa Kemal University, 31200 Iskenderun, Hatay, Turkey.
authors.forename: Nilufer
authors.initials: N
authors.lastname: Ozdemir
authors.affiliation: Department of Computer Engineering, Mustafa Kemal University, 31200 Iskenderun, Hatay, Turkey.
authors.forename: Esen
authors.initials: E
authors.lastname: Yildirim
mesh_terms: D000465:Algorithms; D001499:Bayes Theorem; D003199:Computer Systems; D004569:Electroencephalography / Q000379:methods* / Q000592:standards; D004827:Epilepsy / Q000175:diagnosis*; D005189:False Positive Reactions; D006801:Humans; D011237:Predictive Value of Tests; D012680:Sensitivity and Specificity