title: High-precision (143)Nd/(144)Nd ratios from NdO(+) data corrected with in-run measured oxygen isotope ratios.
abstract: The NdO(+) technique has been considerably refined in recent years for high-precision measurement of Nd isotope ratios in low-level samples (1-5 ng Nd). As oxygen isotopic compositions may vary significantly with experimental conditions such as filament material, ionization enhancer and the ambient oxygen in the ion source, great "care" should be taken for using correct oxygen isotopic compositions to do the isobaric oxide corrections for the "conventional" NdO(+) method. Our method presented here for NdO(+) data reduction and PrO(+) interference corrections uses the oxygen isotope composition determined in each cycle of the NdO(+) measurements. For that purpose, we measured the small ion signals of (150)Nd(17)O(+) and (150)Nd(18)O(+) with amplifiers equipped with 10(12) Ω feedback resistors, and those of Nd(16)O(+) ion beams with 10(11) Ω amplifiers. Using 10(12) Ω amplifiers facilitates a precise measurement of the very small (150)Nd(17)O(+) and (150)Nd(18)O(+) ion signals and calculation of highly accurate and precise (143)Nd/(144)Nd isotope ratios. The (143)Nd/(144)Nd ratios for JNdi-1 standards and several whole-rock reference materials determined with the method on 4 ng of Nd loads are consistent with previously reported values within analytical error, with internal and external precision (2 RSE and 2 RSD) of better than 20 and 30 ppm, respectively.
authors.affiliation: State Key Laboratory of Lithospheric Evolution, Institute of Geology and Geophysics, Chinese Academy of Sciences , Beijing 100029, China.
authors.forename: Zhu-Yin
authors.initials: ZY
authors.lastname: Chu
authors.forename: Chao-Feng
authors.initials: CF
authors.lastname: Li
authors.forename: Ernst
authors.initials: E
authors.lastname: Hegner
authors.forename: Zhi
authors.initials: Z
authors.lastname: Chen
authors.forename: Yan
authors.initials: Y
authors.lastname: Yan
authors.forename: Jing-Hui
authors.initials: JH
authors.lastname: Guo