title: Design of high speed and low offset dynamic latch comparator in 0.18 µm CMOS process.
abstract: The cross-coupled circuit mechanism based dynamic latch comparator is presented in this research. The comparator is designed using differential input stages with regenerative S-R latch to achieve lower offset, lower power, higher speed and higher resolution. In order to decrease circuit complexity, a comparator should maintain power, speed, resolution and offset-voltage properly. Simulations show that this novel dynamic latch comparator designed in 0.18 µm CMOS technology achieves 3.44 mV resolution with 8 bit precision at a frequency of 50 MHz while dissipating 158.5 µW from 1.8 V supply and 88.05 µA average current. Moreover, the proposed design propagates as fast as 4.2 nS with energy efficiency of 0.7 fJ/conversion-step. Additionally, the core circuit layout only occupies 0.008 mm2.
authors.affiliation: Department of Electrical, Electronic and Systems Engineering, Universiti Kebangsaan Malaysia, Bangi, Selangor, Malaysia.
authors.forename: Labonnah Farzana
authors.initials: LF
authors.lastname: Rahman
authors.affiliation: Department of Electrical, Electronic and Systems Engineering, Universiti Kebangsaan Malaysia, Bangi, Selangor, Malaysia.
authors.forename: Mamun Bin Ibne
authors.initials: MB
authors.lastname: Reaz
authors.affiliation: MIMOS Berhad, Technology Park Malaysia, Kuala Lumpur, Malaysia.
authors.forename: Chia Chieu
authors.initials: CC
authors.lastname: Yin
authors.affiliation: Department of Electrical, Electronic and Systems Engineering, Universiti Kebangsaan Malaysia, Bangi, Selangor, Malaysia.
authors.forename: Mohammad Alauddin Mohammad
authors.initials: MA
authors.lastname: Ali
authors.affiliation: Department of Electrical, Electronic and Systems Engineering, Universiti Kebangsaan Malaysia, Bangi, Selangor, Malaysia.
authors.forename: Mohammad
authors.initials: M
authors.lastname: Marufuzzaman
mesh_terms: D004582:Electronics, Medical / Q000295:instrumentation; D004867:Equipment Design / Q000295:instrumentation*; D019544:Equipment Failure Analysis / Q000295:instrumentation; D012666:Semiconductors; D012815:Signal Processing, Computer-Assisted / Q000295:instrumentation*; D014173:Transistors, Electronic