title: Synthesis of structural and optical characterization of surfactant capped ZnO nanocrystalline.
abstract: The presence of surfactant (CTAB) at three different concentrations viz., (0.5, 1 and 1.5 M) on zinc oxide (ZnO) nanocrystalline at 550°C was synthesized. The optical properties of each surfactant capped zinc oxide nanocrystalline were investigated using UV-Visible absorption. The characterization of these nanocrystalline was performed by X-ray diffractometer Spectrum (XRD), Scanning electron microscopy (SEM) with energy dispersive spectroscopy (EDS), and Atomic force microscopy (AFM) and Fourier transformer infrared (FTIR) spectroscopy. The effect of CTAB on the morphology of the ZnO was studied by SEM/EDS which revealed that the diameter of the product is in the range of 42-70 nm. Out of the three surfactant concentrations CTAB (0.5 M) capped zinc oxide nanoparticle has smallest crystalline size of 19.4 nm. Thus, the presence of surfactant on the surface of zinc oxide plays a significant role in reducing defect. The excitonic UV emission has been observed at 275 nm.
authors.affiliation: Department of Physics, Annamalai University, Annamalai Nagar 608002, Tamil Nadu, India.
authors.forename: K
authors.initials: K
authors.lastname: Raja
authors.affiliation: Department of Physics (DDE Wings), Annamalai University, Annamalai Nagar 608002, Tamil Nadu, India. Electronic address: psrddephyau@gmail.com.
authors.forename: P S
authors.initials: PS
authors.lastname: Ramesh
authors.affiliation: Department of Physics, Annamalai University, Annamalai Nagar 608002, Tamil Nadu, India.
authors.forename: D
authors.initials: D
authors.lastname: Geetha
authors.affiliation: Department of Physics, Annamalai University, Annamalai Nagar 608002, Tamil Nadu, India.
authors.forename: T
authors.initials: T
authors.lastname: Kokila
authors.affiliation: Department of Physics, Annamalai University, Annamalai Nagar 608002, Tamil Nadu, India.
authors.forename: R
authors.initials: R
authors.lastname: Sathiyapriya
mesh_terms: D000077286:Cetrimonium; D002593:Cetrimonium Compounds / Q000737:chemistry; D018625:Microscopy, Atomic Force; D008855:Microscopy, Electron, Scanning; D053758:Nanoparticles / Q000737:chemistry* / Q000648:ultrastructure; D055620:Optical Phenomena; D013050:Spectrometry, Fluorescence; D013052:Spectrometry, X-Ray Emission; D013056:Spectrophotometry, Ultraviolet; D017550:Spectroscopy, Fourier Transform Infrared; D013501:Surface-Active Agents / Q000737:chemistry*; D014961:X-Ray Diffraction; D015034:Zinc Oxide / Q000138:chemical synthesis* / Q000737:chemistry
chemical_list: D002593:Cetrimonium Compounds; D013501:Surface-Active Agents; D015034:Zinc Oxide; D000077286:Cetrimonium
keywords: Atomic force microscopy; FTIR; UV–Visible absorption