title: Electron backscatter diffraction applied to lithium sheets prepared by broad ion beam milling.
abstract: Due to its very low hardness and atomic number, pure lithium cannot be prepared by conventional methods prior to scanning electron microscopy analysis. Here, we report on the characterization of pure lithium metallic sheets used as base electrodes in the lithium-ion battery technology using electron backscatter diffraction (EBSD) and X-ray microanalysis using energy dispersive spectroscopy (EDS) after the sheet surface was polished by broad argon ion milling (IM). No grinding and polishing were necessary to achieve the sufficiently damage free necessary for surface analysis. Based on EDS results the impurities could be characterized and EBSD revealed the microsctructure and microtexture of this material with accuracy. The beam damage and oxidation/hydration resulting from the intensive use of IM and the transfer of the sample into the microscope chamber was estimated to be <50 nm. Despite the fact that the IM process generates an increase of temperature at the specimen surface, it was assumed that the milling parameters were sufficient to minimize the heating effect on the surface temperature. However, a cryo-stage should be used if available during milling to guaranty a heating artefact free surface after the milling process.
authors.affiliation: Mining and Materials Engineering Department, McGill University, Montréal, Québec, Canada.
authors.forename: Nicolas
authors.initials: N
authors.lastname: Brodusch
authors.forename: Karim
authors.initials: K
authors.lastname: Zaghib
authors.forename: Raynald
authors.initials: R
authors.lastname: Gauvin
keywords: EBSD; Monte Carlo; SRIM; ion etching; lithium ion battery