title: Do you believe that atoms stay in place when you observe them in HREM?
abstract: Recent advancements in aberration-corrected electron microscopy allow for an evaluation of unexpectedly large atom displacements beyond a resolution limit of ∼0.5 Å, which are found to be dose-rate dependent in high resolution images. In this paper we outline a consistent description of the electron scattering process, which explains these unexpected phenomena. Our approach links thermal diffuse scattering to electron beam-induced object excitation and relaxation processes, which strongly contribute to the image formation process. The effect can provide an explanation for the well-known contrast mismatch ("Stobbs factor") between image calculations and experiments.
authors.affiliation: EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerpen, Belgium. Electronic address: dirk.vandyck@uantwerp.be.
authors.forename: Dirk
authors.initials: D
authors.lastname: Van Dyck
authors.affiliation: EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerpen, Belgium. Electronic address: ivan.lobato@uantwerp.be.
authors.forename: Ivan
authors.initials: I
authors.lastname: Lobato
authors.affiliation: Department of Engineering and System Science, National Tsing Hua University, Number 101, Section 2, Kuang-Fu Road, Hsin Chu, Taiwan 300, China. Electronic address: frchen1@me.com.
authors.forename: Fu-Rong
authors.initials: FR
authors.lastname: Chen
authors.affiliation: National Center for Electron Microscopy and Joint Center for Artificial Photosynthesis, Lawrence Berkeley National Laboratory, One Cyclotron Road, Berkeley, CA 94720, USA. Electronic address: cfkisielowski@lbl.gov.
authors.forename: Christian
authors.initials: C
authors.lastname: Kisielowski
keywords: Dose rate dependence; Quantitative HREM; TDS