title: Development and characterization of a portable total reflection X-ray fluorescence system using a waveguide for trace elements analysis.
abstract: This paper presents a portable total reflection X-ray fluorescence system composed of a 15 W X-ray tube, with a gold anode, a waveguide constituted by two Perspex(®) parallel plates, a Si PIN detector and a quartz optical flat. The critical angle of the total reflection system was experimentally determined by measuring a zinc solution (100 mg/L). The accuracy of the system was checked using SRM 1577b Bovine Liver by NIST as standard reference material. We obtained the absolute detection limits of the following elements: P (450 ± 40 ng), S (200 ± 31 ng), K (30 ± 2.5 ng), Ca (19 ± 3.5 ng), Mn (4.1 ± 0.5 ng), Fe (3.6 ± 0.9 ng), Cu (3.3 ± 0.4 ng) and Zn (3.5 ± 0.3 ng). This paper shows that it is possible to produce total reflection X-ray fluorescence with very compact, efficient, low-cost and easy-to-handle instrumentation using a low-power X-ray tube and a Si PIN compact detector.
authors.affiliation: Nuclear Instrumentation Laboratory-COPPE/UFRJ.
authors.forename: Ana Cristina M
authors.initials: AC
authors.lastname: da Costa
authors.forename: Ubiratan B
authors.initials: UB
authors.lastname: de Araújo
authors.forename: Edgar F O
authors.initials: EF
authors.lastname: de Jesus
authors.forename: Marcelino J
authors.initials: MJ
authors.lastname: Anjos
authors.forename: Ricardo T
authors.initials: RT
authors.lastname: Lopes