title: Novel scanning electron microscope bulge test technique integrated with loading function.
abstract: Membranes and film-on-substrate structures are critical elements for some devices in electronics industry and for Micro Electro Mechanical Systems devices. These structures are normally at the scale of micrometer or even nanometer. Thus, the measurement for the mechanical property of these membranes poses a challenge over the conventional measurements at macro-scales. In this study, a novel bulge test method is presented for the evaluation of mechanical property of micro thin membranes. Three aspects are discussed in the study: (a) A novel bulge test with a Scanning Electron Microscope system realizing the function of loading and measuring simultaneously; (b) a simplified Digital Image Correlation method for a height measurement; and (c) an imaging distortion correction by the introduction of a scanning Moiré method. Combined with the above techniques, biaxial modulus as well as Young's modulus of the polyimide film can be determined. Besides, a standard tensile test is conducted as an auxiliary experiment to validate the feasibility of the proposed method.
authors.affiliation: AML, Department of Engineering Mechanics, Tsinghua University, Beijing 100084, China.
authors.forename: Chuanwei
authors.initials: C
authors.lastname: Li
authors.affiliation: School of Aerospace Engineering, Beijing Institute of Technology, Beijing 100081, China.
authors.forename: Zhanwei
authors.initials: Z
authors.lastname: Liu
authors.affiliation: AML, Department of Engineering Mechanics, Tsinghua University, Beijing 100084, China.
authors.forename: Huimin
authors.initials: H
authors.lastname: Xie