title: Epi-illumination diffraction phase microscopy with white light.
abstract: We demonstrate the first reflection-based epi-illumination diffraction phase microscope with white light (epi-wDPM). The epi-wDPM system combines the off-axis, common-path, and white light approaches, in a reflection geometry enabling sub-nanometer spatial and temporal noise levels, while providing single-shot acquisition for opaque samples. We verified the epi-wDPM results by measuring control samples with known dimensions and comparing them to measurements from other well-established techniques. We imaged gold-coated HeLa cells to illustrate the tradeoffs between epi-wDPM with low and high spatial coherence.
authors.forename: C
authors.initials: C
authors.lastname: Edwards
authors.forename: B
authors.initials: B
authors.lastname: Bhaduri
authors.forename: B G
authors.initials: BG
authors.lastname: Griffin
authors.forename: L L
authors.initials: LL
authors.lastname: Goddard
authors.forename: G
authors.initials: G
authors.lastname: Popescu