title: Motionless system to measure relative angular emission intensity of decaying or modulated light emitting diodes.
abstract: In this paper, a measurement system is presented which enables fast and accurate determination of the relative angular emission intensity of light emitting devices, taking into account their specific features such as low light output, narrow spectral distribution, high spatial luminous intensity ratios, and small dimensions. Application of logarithmic sensors allows for fast measurement of relative emission by simple analog circuitry, while locating 18 of them on a fixed ring around the emitter allows a motionless measurement system. As a result, the proposed system can determine the relative angular emission in less than 100 ms with a resolution of 5° for symmetric emitters.
authors.affiliation: Institute of Semiconductor and Solid State Physics, Johannes Kepler University, Linz, Austria.
authors.forename: M
authors.initials: M
authors.lastname: Radziwon
authors.affiliation: Institute of Microstructure Technology, Karlsruhe Institute of Technology, Eggenstein-Leopoldshafen, Germany.
authors.forename: G
authors.initials: G
authors.lastname: Hernandez-Sosa
authors.affiliation: Research Institute for Integrated Circuits, Johannes Kepler University, Linz, Austria.
authors.forename: C
authors.initials: C
authors.lastname: Lackner
authors.affiliation: Institute of Semiconductor and Solid State Physics, Johannes Kepler University, Linz, Austria.
authors.forename: H
authors.initials: H
authors.lastname: Sitter
authors.affiliation: Institute of Semiconductor and Solid State Physics, Johannes Kepler University, Linz, Austria.
authors.forename: C
authors.initials: C
authors.lastname: Simbrunner