title: Correcting for surface topography in X-ray fluorescence imaging.
abstract: Samples with non-planar surfaces present challenges for X-ray fluorescence imaging analysis. Here, approximations are derived to describe the modulation of fluorescence signals by surface angles and topography, and suggestions are made for reducing this effect. A correction procedure is developed that is effective for trace element analysis of samples having a uniform matrix, and requires only a fluorescence map from a single detector. This procedure is applied to fluorescence maps from an incised gypsum tablet.
authors.affiliation: Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, NY 14853, USA.
authors.forename: E C
authors.initials: EC
authors.lastname: Geil
authors.affiliation: Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, NY 14853, USA.
authors.forename: R E
authors.initials: RE
authors.lastname: Thorne
mesh_terms: D002133:Calcium Sulfate; D003952:Diagnostic Imaging / Q000379:methods*; D006801:Humans; D019047:Phantoms, Imaging; D012680:Sensitivity and Specificity; D013052:Spectrometry, X-Ray Emission / Q000379:methods*; D013499:Surface Properties; D013607:Tablets / Q000737:chemistry; D014131:Trace Elements / Q000032:analysis
chemical_list: D013607:Tablets; D014131:Trace Elements; D002133:Calcium Sulfate
keywords: X-ray fluorescence; imaging; surface angle; surface orientation; topography