Hard x-ray telescopes to be onboard ASTRO-H.
The new Japanese x-ray astronomy satellite, ASTRO-H, will carry two identical hard x-ray telescopes (HXTs), which cover the energy range of 5 to 80 keV. The HXT mirrors employ tightly nested, conically approximated thin-foil Wolter-I optics, and the mirror surfaces are coated with Pt/C depth-graded multilayers to enhance the hard x-ray effective area by means of Bragg reflection. The HXT comprises foils 120-450 mm in diameter and 200 mm in length, with a focal length of 12 m. To obtain a large effective area, 213 aluminum foils 0.2 mm in thickness are tightly nested confocally. The requirements for HXT are a total effective area of >300  cm2at 30 keV and an angular resolution of <1.7'in half-power diameter (HPD). Fabrication of two HXTs has been completed, and the x-ray performance of each HXT was measured at a synchrotron radiation facility, SPring-8 BL20B2 in Japan. Angular resolutions (HPD) of 1.9'and 1.8'at 30 keV were obtained for the full telescopes of HXT-1 and HXT-2, respectively. The total effective area of the two HXTs at 30 keV is 349  cm2.
Hisamitsu
H
Awaki
Hideyo
H
Kunieda
Manabu
M
Ishida
Hironori
H
Matsumoto
Yasunori
Y
Babazaki
Tadatsugu
T
Demoto
Akihiro
A
Furuzawa
Yoshito
Y
Haba
Takayuki
T
Hayashi
Ryo
R
Iizuka
Kazunori
K
Ishibashi
Naoki
N
Ishida
Masayuki
M
Itoh
Toshihiro
T
Iwase
Tatsuro
T
Kosaka
Daichi
D
Kurihara
Yuuji
Y
Kuroda
Yoshitomo
Y
Maeda
Yoshifumi
Y
Meshino
Ikuyuki
I
Mitsuishi
Yuusuke
Y
Miyata
Takuya
T
Miyazawa
Hideyuki
H
Mori
Housei
H
Nagano
Yoshiharu
Y
Namba
Yasushi
Y
Ogasaka
Keiji
K
Ogi
Takashi
T
Okajima
Shigetaka
S
Saji
Fumiya
F
Shimasaki
Takuro
T
Sato
Toshiki
T
Sato
Satoshi
S
Sugita
Yoshio
Y
Suzuki
Kenji
K
Tachibana
Sasagu
S
Tachibana
Shunya
S
Takizawa
Keisuke
K
Tamura
Yuzuru
Y
Tawara
Tatsuharu
T
Torii
Kentato
K
Uesugi
Koujun
K
Yamashita
Shigeo
S
Yamauchi
D017076:Computer-Aided Design; D004867:Equipment Design; D019544:Equipment Failure Analysis; D007909:Lenses; D018531:Spacecraft / Q000295:instrumentation*; D061351:Telescopes; D014961:X-Ray Diffraction / Q000295:instrumentation*