X-ray multilens interferometer based on Si refractive lenses.
We report a multilens X-ray interferometer consisting of six parallel arrays of planar compound refractive lenses, each of which creates a diffraction limited beam under coherent illumination. Overlapping such coherent beams produces an interference pattern demonstrating substantially strong longitudinal functional dependence. The interference fringe pattern produced by multilens interferometer was described by Talbot imaging formalism. Theoretical analysis of the interference pattern formation was carried out and corresponding computer simulations were performed. The proposed multilens interferometer was experimentally tested at ID06 ESRF beamline in the X-ray energy range from 10 to 30 keV. The experimentally recorded fractional Talbot images are in a good agreement with computer simulations.
A
A
Snigirev
I
I
Snigireva
M
M
Lyubomirskiy
V
V
Kohn
V
V
Yunkin
S
S
Kuznetsov
D007368:Interferometry / Q000295:instrumentation*; D007909:Lenses; D008855:Microscopy, Electron, Scanning; D012031:Refractometry; D012825:Silicon / Q000737:chemistry*; D014965:X-Rays
D012825:Silicon