Convenient preparation of high-quality specimens for annealing experiments in the transmission electron microscope.
A procedure based on focused ion beam milling and in situ lift-out is introduced for the preparation of high-quality specimens for in situ annealing experiments in the transmission electron microscope. The procedure allows an electron-transparent lamella to be cleaned directly on a heating chip using a low ion energy and back-side milling in order to minimize redeposition and damage. The approach is illustrated through the preparation of an Al-Mn-Fe complex metallic alloy specimen.
1Ernst Ruska-Center for Microscopy and Spectroscopy with Electrons (ER-C) and Peter Grünberg Institute,Forschungszentrum Jülich,52428 Jülich,Germany.
Martial
M
Duchamp
2DENSsolutions,2628XH Delft,The Netherlands.
Qiang
Q
Xu
1Ernst Ruska-Center for Microscopy and Spectroscopy with Electrons (ER-C) and Peter Grünberg Institute,Forschungszentrum Jülich,52428 Jülich,Germany.
Rafal E
RE
Dunin-Borkowski