title: Atomic force microscopy study of DNA flexibility on short length scales: smooth bending versus kinking.
abstract: The apparently anomalous flexibility of DNA on short length scales has attracted a lot of attention in recent years. We use atomic force microscopy (AFM) in solution to directly study the DNA bending statistics for small lengths down to one helical turn. The accuracy of experimental estimates could be improved due to a large data volume and a refined algorithm for image processing and measuring bend angles. It is found that, at length scales beyond two helical turns (7 nm), DNA is well described by the harmonic worm-like chain (WLC) model with the bending persistence length of 56 nm. Below this threshold, the AFM data are also described by the WLC model assuming that the accuracy of measured bend angles is limited by the physical width of the double helix. We conclude that the double helical DNA behaves as a uniform elastic rod even at very short length scales. Strong bends due to kinks, melting bubbles and other deviations from the WLC model are statistically negligible.
authors.affiliation: UPR9080 CNRS, Université Paris Diderot, Sorbonne Paris Cité, Institut de Biologie Physico-Chimique, 13, rue Pierre et Marie Curie, Paris 75005, France alexey@ibpc.fr.
authors.forename: Alexey K
authors.initials: AK
authors.lastname: Mazur
authors.affiliation: Institut Charles Sadron, CNRS-University of Strasbourg, 23 rue du Loess, BP 84087, 67034 Strasbourg Cedex 2, France.
authors.forename: Mounir
authors.initials: M
authors.lastname: Maaloum
mesh_terms: D000465:Algorithms; D004247:DNA / Q000737:chemistry* / Q000648:ultrastructure; D018625:Microscopy, Atomic Force; D009690:Nucleic Acid Conformation
chemical_list: D004247:DNA