title: Axial plane optical microscopy.
abstract: We present axial plane optical microscopy (APOM) that can, in contrast to conventional microscopy, directly image a sample's cross-section parallel to the optical axis of an objective lens without scanning. APOM combined with conventional microscopy simultaneously provides two orthogonal images of a 3D sample. More importantly, APOM uses only a single lens near the sample to achieve selective-plane illumination microscopy, as we demonstrated by three-dimensional (3D) imaging of fluorescent pollens and brain slices. This technique allows fast, high-contrast, and convenient 3D imaging of structures that are hundreds of microns beneath the surfaces of large biological tissues.
authors.affiliation: 1] NSF Nano-scale Science and Engineering Center, 3112 Etcheverry Hall, University of California, Berkeley, California 94720, USA [2] Materials Sciences Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, California 94720, USA.
authors.forename: Tongcang
authors.initials: T
authors.lastname: Li
authors.affiliation: NSF Nano-scale Science and Engineering Center, 3112 Etcheverry Hall, University of California, Berkeley, California 94720, USA.
authors.forename: Sadao
authors.initials: S
authors.lastname: Ota
authors.affiliation: NSF Nano-scale Science and Engineering Center, 3112 Etcheverry Hall, University of California, Berkeley, California 94720, USA.
authors.forename: Jeongmin
authors.initials: J
authors.lastname: Kim
authors.affiliation: NSF Nano-scale Science and Engineering Center, 3112 Etcheverry Hall, University of California, Berkeley, California 94720, USA.
authors.forename: Zi Jing
authors.initials: ZJ
authors.lastname: Wong
authors.affiliation: 1] NSF Nano-scale Science and Engineering Center, 3112 Etcheverry Hall, University of California, Berkeley, California 94720, USA [2] Materials Sciences Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, California 94720, USA.
authors.forename: Yuan
authors.initials: Y
authors.lastname: Wang
authors.affiliation: 1] NSF Nano-scale Science and Engineering Center, 3112 Etcheverry Hall, University of California, Berkeley, California 94720, USA [2] Materials Sciences Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, California 94720, USA.
authors.forename: Xiaobo
authors.initials: X
authors.lastname: Yin
authors.affiliation: 1] NSF Nano-scale Science and Engineering Center, 3112 Etcheverry Hall, University of California, Berkeley, California 94720, USA [2] Materials Sciences Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, California 94720, USA.
authors.forename: Xiang
authors.initials: X
authors.lastname: Zhang
mesh_terms: D004867:Equipment Design; D019544:Equipment Failure Analysis; D007089:Image Enhancement / Q000295:instrumentation*; D021621:Imaging, Three-Dimensional / Q000295:instrumentation*; D007909:Lenses; D008853:Microscopy / Q000295:instrumentation*; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity