title: Controlling dielectric and relaxor-ferroelectric properties for energy storage by tuning Pb0.92La0.08Zr0.52Ti0.48O3 film thickness.
abstract: The energy storage properties of Pb0.92La0.08Zr0.52Ti0.48O3 (PLZT) films grown via pulsed laser deposition were evaluated at variable film thickness of 125, 250, 500, and 1000 nm. These films show high dielectric permittivity up to ∼1200. Cyclic I-V measurements were used to evaluate the dielectric properties of these thin films, which not only provide the total electric displacement, but also separate contributions from each of the relevant components including electric conductivity (D1), dielectric capacitance (D2), and relaxor-ferroelectric domain switching polarization (P). The results show that, as the film thickness increases, the material transits from a linear dielectric to nonlinear relaxor-ferroelectric. While the energy storage per volume increases with the film thickness, the energy storage efficiency drops from ∼80% to ∼30%. The PLZT films can be optimized for different energy storage applications by tuning the film thickness to optimize between the linear and nonlinear dielectric properties and energy storage efficiency.
authors.affiliation: Department of Chemistry, Kansas State University , 213 CBC Building, Manhattan, Kansas 66506, United States.
authors.forename: Emery
authors.initials: E
authors.lastname: Brown
authors.forename: Chunrui
authors.initials: C
authors.lastname: Ma
authors.forename: Jagaran
authors.initials: J
authors.lastname: Acharya
authors.forename: Beihai
authors.initials: B
authors.lastname: Ma
authors.forename: Judy
authors.initials: J
authors.lastname: Wu
authors.forename: Jun
authors.initials: J
authors.lastname: Li
keywords: PLZT film; energy storage; relaxor ferroelectrics; solid-state dielectric capacitors