title: Edge impurity rotation profile measurement by using high-resolution ultraviolet/visible spectrometer on J-TEXT.
abstract: An upgrade of the edge rotation diagnostic system is achieved by increasing the number of viewing channels to 17 on J-TEXT tokamak. With the upgrade, the spatial resolution reaches 1 cm. The bulk plasma is used as the calibration light source. And the toroidal velocity profile of C V (carbon V) at edge region is obtained by using a spatial deconvolution technique. The valid measurement region is at ρ = 0.6-0.9, corresponding to the emitting region of C V. The preliminary experimental results express that the velocity of plasma may have a zero point near ρ = 0.85.
authors.affiliation: State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan 430074, China.
authors.forename: Z F
authors.initials: ZF
authors.lastname: Cheng
authors.affiliation: State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan 430074, China.
authors.forename: J
authors.initials: J
authors.lastname: Luo
authors.affiliation: State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan 430074, China.
authors.forename: Z J
authors.initials: ZJ
authors.lastname: Wang
authors.affiliation: State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan 430074, China.
authors.forename: Z P
authors.initials: ZP
authors.lastname: Zhang
authors.affiliation: State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan 430074, China.
authors.forename: X L
authors.initials: XL
authors.lastname: Zhang
authors.affiliation: State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan 430074, China.
authors.forename: S Y
authors.initials: SY
authors.lastname: Hou
authors.affiliation: State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan 430074, China.
authors.forename: C
authors.initials: C
authors.lastname: Cheng
authors.affiliation: State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan 430074, China.
authors.forename: Z
authors.initials: Z
authors.lastname: Li
authors.affiliation: State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan 430074, China.
authors.forename: G
authors.initials: G
authors.lastname: Zhuang