title: Dark-field imaging based on post-processed electron backscatter diffraction patterns of bulk crystalline materials in a scanning electron microscope.
abstract: Dark-field (DF) images were acquired in the scanning electron microscope with an offline procedure based on electron backscatter diffraction (EBSD) patterns (EBSPs). These EBSD-DF images were generated by selecting a particular reflection on the electron backscatter diffraction pattern and by reporting the intensity of one or several pixels around this point at each pixel of the EBSD-DF image. Unlike previous studies, the diffraction information of the sample is the basis of the final image contrast with a pixel scale resolution at the EBSP providing DF imaging in the scanning electron microscope. The offline facility of this technique permits the selection of any diffraction condition available in the diffraction pattern and displaying the corresponding image. The high number of diffraction-based images available allows a better monitoring of deformation structures compared to electron channeling contrast imaging (ECCI) which is generally limited to a few images of the same area. This technique was applied to steel and iron specimens and showed its high capability in describing more rigorously the deformation structures around micro-hardness indents. Due to the offline relation between the reference EBSP and the EBSD-DF images, this new technique will undoubtedly greatly improve our knowledge of deformation mechanism and help to improve our understanding of the ECCI contrast mechanisms.
authors.affiliation: McGill University, Mining and Materials Engineering Department, Montréal, Québec, Canada H3A 0C5. Electronic address: nicolas.brodusch@mcgill.ca.
authors.forename: Nicolas
authors.initials: N
authors.lastname: Brodusch
authors.affiliation: McGill University, Mining and Materials Engineering Department, Montréal, Québec, Canada H3A 0C5.
authors.forename: Hendrix
authors.initials: H
authors.lastname: Demers
authors.affiliation: McGill University, Mining and Materials Engineering Department, Montréal, Québec, Canada H3A 0C5.
authors.forename: Raynald
authors.initials: R
authors.lastname: Gauvin
keywords: Dark-field (DF); Deformation; Electron backscatter diffraction (EBSD); Electron channeling contrast imaging (ECCI); Electron channeling pattern (ECP); Scanning electron microscope (SEM)