title: Analysis of grain boundary dynamics using event detection and cumulative averaging.
abstract: To analyze extended time series of high resolution images, we have employed automated frame-by-frame comparisons that are able to detect dynamic changes in the structure of a grain boundary in Au. Using cumulative averaging of images between events allowed high resolution measurements of the atomic relaxation in the interface with sufficient accuracy for comparison with atomistic models. Cumulative averaging was also used to observe the structural rearrangement of atomic columns at a moving step in the grain boundary. The technique of analyzing changing features in high resolution images by averaging between incidents can be used to deconvolute stochastic events that occur at random intervals and on time scales well beyond that accessible to single-shot imaging.
authors.affiliation: National Center for Electron Microscopy, LBNL, Berkeley, CA 94720, USA.
authors.forename: A
authors.initials: A
authors.lastname: Gautam
authors.affiliation: National Center for Electron Microscopy, LBNL, Berkeley, CA 94720, USA.
authors.forename: C
authors.initials: C
authors.lastname: Ophus
authors.affiliation: Laboratoire de Simulation Atomistique (L_Sim), SP2M, INAC, CEA, 38054 Grenoble, France.
authors.forename: F
authors.initials: F
authors.lastname: Lançon
authors.affiliation: National Center for Electron Microscopy, LBNL, Berkeley, CA 94720, USA.
authors.forename: P
authors.initials: P
authors.lastname: Denes
authors.affiliation: National Center for Electron Microscopy, LBNL, Berkeley, CA 94720, USA. Electronic address: udahmen@lbl.gov.
authors.forename: U
authors.initials: U
authors.lastname: Dahmen
keywords: Aberration correction; Atomic structure; Dynamics; Electron detector; Grain boundary; HAADF; HRTEM; Simulation; Step; Time average