title: The influence of Cs/Cc correction in analytical imaging and spectroscopy in scanning and transmission electron microscopy.
abstract: Aberration correction in scanning/transmission electron microscopy (S/TEM) owes much to the efforts of a small dedicated group of innovators. Leading that frontier has been Prof. Harald Rose. To date his leadership and dynamic personality has spearheaded our ability to leave behind many of the limitations imposed by spherical aberration (Cs) in high resolution phase contrast imaging. Following shortly behind, has been the development of chromatic aberration correction (Cc) which augments those accomplishments. In this paper we will review and summarize how the combination of Cs/Cc technology enhances our ability to conduct hyperspectral imaging and spectroscopy in today's and future computationally mediated experiments in both thin as well as realistic specimens in vacuo and during in-situ/environmental experiments.
authors.affiliation: Electron Microscopy Center, Nanoscience and Technology Division, Argonne National Laboratory, Argonne, IL 60439, United States. Electronic address: zaluzec@microscopy.com.
authors.forename: Nestor J
authors.initials: NJ
authors.lastname: Zaluzec
keywords: AEM; Aberration correction; Amplitude contrast; EELS; EFTEM; ETEM; HREM; In-situ; Phase contrast; Tomography; XEDS