title: Effect of interface atomic structure on the electronic properties of nano-sized metal-oxide interfaces.
abstract: We report that the size dependence of electronic properties at nanosized metal-semiconducting oxide interfaces is significantly affected by the interface atomic structure. The properties of interfaces with two orientations are compared over size range of 20-200 nm. The difference in interface atomic structure leads to electronic structure differences that alter electron transfer paths. Specifically, interfaces with a higher concentration of undercoordinated Ti result in enhanced tunneling due to the presence of defect states or locally reduced tunnel barrier widths. This effect is superimposed on the mechanisms of size dependent properties at such small scales.
authors.affiliation: Department of Materials Science and Engineering, University of Pennsylvania , Philadelphia, Pennsylvania 19104, United States.
authors.forename: Wei
authors.initials: W
authors.lastname: Qin
authors.forename: Jiechang
authors.initials: J
authors.lastname: Hou
authors.forename: Dawn A
authors.initials: DA
authors.lastname: Bonnell
keywords: AFM; TEM; electronic properties; interface structure; metal oxide; metal−semiconductor interface