title: Spatial-phase-shift imaging interferometry using a spectrally modulated white light source.
abstract: An extension of the white light spatial-phase-shift (WLSPS) for object surface measurements is described. Using WLSPS, surface measurements can be obtained from any real object image without the need of a reference beam, thus achieving inherent vibration cancellation. The surface topography is obtained by acquiring multiple images of an object illuminated by a spectrally modulated white light source and using an appropriate algorithm. The modulation of the light source obviates the need for the continuous phase delay to obtain the interferograms.
authors.forename: Shlomi
authors.initials: S
authors.lastname: Epshtein
authors.forename: Alon
authors.initials: A
authors.lastname: Harris
authors.forename: Igor
authors.initials: I
authors.lastname: Yaacobovitz
authors.forename: Garrett
authors.initials: G
authors.lastname: Locketz
authors.forename: Yitzhak
authors.initials: Y
authors.lastname: Yitzhaky
authors.forename: Yoel
authors.initials: Y
authors.lastname: Arieli
mesh_terms: D007091:Image Processing, Computer-Assisted; D007368:Interferometry; D008027:Light; D061848:Optical Imaging / Q000379:methods*