title: Polarity continuation and frustration in ZnSe nanospirals.
abstract: ZnSe nanospirals including structures with polarity continuation and polarity frustration are simultaneously observed at atomic resolution. Through careful analysis of polarity within each dumbbell based on aberration-corrected high-angle annular-dark-field imaging, polarity continuation across parallel polytype interfaces as well as the surrounding Z-shape faulted dipoles is verified. Moreover, polarity frustration across regions with different stacking sequence, which would lead to accumulations of boundary interface charges in the triangular-shaped mixed regions with potential optoelectronic applications, is carefully studied.
authors.affiliation: Center for Nanoscale Characterization and Devices, Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan 430074, China.
authors.forename: Luying
authors.initials: L
authors.lastname: Li
authors.affiliation: Center for Nanoscale Characterization and Devices, Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan 430074, China.
authors.forename: Fanfan
authors.initials: F
authors.lastname: Tu
authors.affiliation: School of Physics and Technology, Center for Electron Microscopy and MOE Key Laboratory of Artificial Micro- and Nano-structures, Wuhan University, Wuhan 430072, China.
authors.forename: Lei
authors.initials: L
authors.lastname: Jin
authors.affiliation: Department of Electrical and Electronic Engineering, University of Hong Kong, Pokfulam Road, Hong Kong, China.
authors.forename: Wallace C H
authors.initials: WC
authors.lastname: Choy
authors.affiliation: 1] Center for Nanoscale Characterization and Devices, Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan 430074, China [2] School of Physics, Huazhong University of Science and Technology, Wuhan 430074, China.
authors.forename: Yihua
authors.initials: Y
authors.lastname: Gao
authors.affiliation: School of Physics and Technology, Center for Electron Microscopy and MOE Key Laboratory of Artificial Micro- and Nano-structures, Wuhan University, Wuhan 430072, China.
authors.forename: Jianbo
authors.initials: J
authors.lastname: Wang