title: Differential mobility spectrometry-mass spectrometry for atomic analysis.
abstract: Analysis and separation of atomic ions within a portable setting are studied in forensic applications of radiological debris analysis. Ion mobility spectrometry (IMS) may be used to show separation of atomic ions, while the related method of differential mobility spectrometry (DMS) has focused on fractionation of primarily molecular components. We set out to investigate DMS as a means for separating atomic ions. We initially derived the differential ion mobility parameter, alpha, from classic empirical IMS data of atomic ions, cesium and potassium, each showing its own distinct form of alpha. These alpha functions were applied to DMS simulations and supported by analytical treatment that suggested a means for a rapid disambiguation of atomic ions using DMS. We validated this hypothesis through the prototype cesium-potassium system investigated experimentally by DMS coupled to mass spectrometry (MS). Such a feature would be advantageous in a field portable instrument for rapid atomic analyses especially in the case of isobaric ions that cannot be distinguished by MS. Herein, we first report this novel method for the derivation of alpha from existing field dependent drift tube ion mobility data. Further, we translate experimental DMS data into alpha parameters by expanding upon existing methods. Refining the alpha parameter in this manner helps convey the interpretation of the alpha parameter particularly for those new to the DMS field.
authors.affiliation: Draper Laboratory , 3802 Spectrum Blvd. Ste 201, Tampa, Florida 33612, United States.
authors.forename: Francy L
authors.initials: FL
authors.lastname: Sinatra
authors.forename: Tianpeng
authors.initials: T
authors.lastname: Wu
authors.forename: Spiros
authors.initials: S
authors.lastname: Manolakos
authors.forename: Jing
authors.initials: J
authors.lastname: Wang
authors.forename: Theresa G
authors.initials: TG
authors.lastname: Evans-Nguyen