title: Advanced atomic force microscopy techniques II.
authors.affiliation: Department of Physics, University of Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland.
authors.forename: Thilo
authors.initials: T
authors.lastname: Glatzel
authors.affiliation: Instituto de Microelectronica de Madrid, CSIC Isaac Newton 8, 28760 Tres Cantos, Madrid, Spain.
authors.forename: Ricardo
authors.initials: R
authors.lastname: Garcia
authors.affiliation: Institute of Nanotechnology (INT), Karlsruhe Institute of Technology (KIT), 76021 Karlsruhe, Germany.
authors.forename: Thomas
authors.initials: T
authors.lastname: Schimmel
keywords: AFM