title: Statistical analysis and interpolation of compositional data in materials science.
abstract: Compositional data are ubiquitous in chemistry and materials science: analysis of elements in multicomponent systems, combinatorial problems, etc., lead to data that are non-negative and sum to a constant (for example, atomic concentrations). The constant sum constraint restricts the sampling space to a simplex instead of the usual Euclidean space. Since statistical measures such as mean and standard deviation are defined for the Euclidean space, traditional correlation studies, multivariate analysis, and hypothesis testing may lead to erroneous dependencies and incorrect inferences when applied to compositional data. Furthermore, composition measurements that are used for data analytics may not include all of the elements contained in the material; that is, the measurements may be subcompositions of a higher-dimensional parent composition. Physically meaningful statistical analysis must yield results that are invariant under the number of composition elements, requiring the application of specialized statistical tools. We present specifics and subtleties of compositional data processing through discussion of illustrative examples. We introduce basic concepts, terminology, and methods required for the analysis of compositional data and utilize them for the spatial interpolation of composition in a sputtered thin film. The results demonstrate the importance of this mathematical framework for compositional data analysis (CDA) in the fields of materials science and chemistry.
authors.affiliation: Joint Center for Artificial Photosynthesis, California Institute of Technology , Pasadena, California 91125, United States.
authors.forename: Misha Z
authors.initials: MZ
authors.lastname: Pesenson
authors.forename: Santosh K
authors.initials: SK
authors.lastname: Suram
authors.forename: John M
authors.initials: JM
authors.lastname: Gregoire
mesh_terms: D003627:Data Interpretation, Statistical; D008422:Materials Testing / Q000379:methods*
keywords: big data; complex data; compositional data; electrocatalyst; high-throughput screening; inkjet printing; interpolation; sputtering; statistical data analysis; thin-films