title: Optical properties and electrical transport of thin films of terbium(III) bis(phthalocyanine) on cobalt.
abstract: The optical and electrical properties of terbium(III) bis(phthalocyanine) (TbPc2) films on cobalt substrates were studied using variable angle spectroscopic ellipsometry (VASE) and current sensing atomic force microscopy (cs-AFM). Thin films of TbPc2 with a thickness between 18 nm and 87 nm were prepared by organic molecular beam deposition onto a cobalt layer grown by electron beam evaporation. The molecular orientation of the molecules on the metallic film was estimated from the analysis of the spectroscopic ellipsometry data. A detailed analysis of the AFM topography shows that the TbPc2 films consist of islands which increase in size with the thickness of the organic film. Furthermore, the cs-AFM technique allows local variations of the organic film topography to be correlated with electrical transport properties. Local current mapping as well as local I-V spectroscopy shows that despite the granular structure of the films, the electrical transport is uniform through the organic films on the microscale. The AFM-based electrical measurements allow the local charge carrier mobility of the TbPc2 thin films to be quantified with nanoscale resolution.
authors.affiliation: Semiconductor Physics, Technische Universität Chemnitz, Reichenhainer Straße 70, 09107 Chemnitz, Germany.
authors.forename: Peter
authors.initials: P
authors.lastname: Robaschik
authors.affiliation: Material Systems for Nanoelectronics, Technische Universität Chemnitz, Reichenhainer Straße 70, 09107 Chemnitz, Germany ; Institute for Integrative Nanosciences, IFW Dresden, Helmholtzstraße 20, 01069 Dresden, Germany.
authors.forename: Pablo F
authors.initials: PF
authors.lastname: Siles
authors.affiliation: Semiconductor Physics, Technische Universität Chemnitz, Reichenhainer Straße 70, 09107 Chemnitz, Germany.
authors.forename: Daniel
authors.initials: D
authors.lastname: Bülz
authors.affiliation: Semiconductor Physics, Technische Universität Chemnitz, Reichenhainer Straße 70, 09107 Chemnitz, Germany.
authors.forename: Peter
authors.initials: P
authors.lastname: Richter
authors.affiliation: Semiconductor Physics, Technische Universität Chemnitz, Reichenhainer Straße 70, 09107 Chemnitz, Germany.
authors.forename: Manuel
authors.initials: M
authors.lastname: Monecke
authors.affiliation: Semiconductor Physics, Technische Universität Chemnitz, Reichenhainer Straße 70, 09107 Chemnitz, Germany.
authors.forename: Michael
authors.initials: M
authors.lastname: Fronk
authors.affiliation: Institute of Nanotechnology, Karlsruhe Institute of Technology (KIT), 76344 Eggenstein-Leopoldshafen, Germany.
authors.forename: Svetlana
authors.initials: S
authors.lastname: Klyatskaya
authors.affiliation: Material Systems for Nanoelectronics, Technische Universität Chemnitz, Reichenhainer Straße 70, 09107 Chemnitz, Germany ; Institute for Integrative Nanosciences, IFW Dresden, Helmholtzstraße 20, 01069 Dresden, Germany.
authors.forename: Daniel
authors.initials: D
authors.lastname: Grimm
authors.affiliation: Material Systems for Nanoelectronics, Technische Universität Chemnitz, Reichenhainer Straße 70, 09107 Chemnitz, Germany ; Institute for Integrative Nanosciences, IFW Dresden, Helmholtzstraße 20, 01069 Dresden, Germany.
authors.forename: Oliver G
authors.initials: OG
authors.lastname: Schmidt
authors.affiliation: Institute of Nanotechnology, Karlsruhe Institute of Technology (KIT), 76344 Eggenstein-Leopoldshafen, Germany, ; Université de Strasbourg, Institut de Physique et de Chimie des Materiaux de Strasbourg, CNRS UMP 7504, 23 Rue du Loess, 67034 Strasbourg Cedex 2, France.
authors.forename: Mario
authors.initials: M
authors.lastname: Ruben
authors.affiliation: Semiconductor Physics, Technische Universität Chemnitz, Reichenhainer Straße 70, 09107 Chemnitz, Germany.
authors.forename: Dietrich R T
authors.initials: DR
authors.lastname: Zahn
authors.affiliation: Semiconductor Physics, Technische Universität Chemnitz, Reichenhainer Straße 70, 09107 Chemnitz, Germany.
authors.forename: Georgeta
authors.initials: G
authors.lastname: Salvan
keywords: TbPc2; current sensing AFM; ellipsometry; spintronics; transport properties