title: Single- and multi-frequency detection of surface displacements via scanning probe microscopy.
abstract: Piezoresponse force microscopy (PFM) provides a novel opportunity to detect picometer-level displacements induced by an electric field applied through a conducting tip of an atomic force microscope (AFM). Recently, it was discovered that superb vertical sensitivity provided by PFM is high enough to monitor electric-field-induced ionic displacements in solids, the technique being referred to as electrochemical strain microscopy (ESM). ESM has been implemented only in multi-frequency detection modes such as dual AC resonance tracking (DART) and band excitation, where the response is recorded within a finite frequency range, typically around the first contact resonance. In this paper, we analyze and compare signal-to-noise ratios of the conventional single-frequency method with multi-frequency regimes of measuring surface displacements. Single-frequency detection ESM is demonstrated using a commercial AFM.
authors.affiliation: 1Department of Materials and Ceramic Engineering & CICECO,University of Aveiro,3810-193 Aveiro,Portugal.
authors.forename: Konstantin
authors.initials: K
authors.lastname: Romanyuk
authors.affiliation: 1Department of Materials and Ceramic Engineering & CICECO,University of Aveiro,3810-193 Aveiro,Portugal.
authors.forename: Sergey Yu
authors.initials: SY
authors.lastname: Luchkin
authors.affiliation: 1Department of Materials and Ceramic Engineering & CICECO,University of Aveiro,3810-193 Aveiro,Portugal.
authors.forename: Maxim
authors.initials: M
authors.lastname: Ivanov
authors.affiliation: 3NT-MDT Co.,Post Box 158,Building 317-А,Zelenograd,Moscow 124482,Russia.
authors.forename: Arseny
authors.initials: A
authors.lastname: Kalinin
authors.affiliation: 1Department of Materials and Ceramic Engineering & CICECO,University of Aveiro,3810-193 Aveiro,Portugal.
authors.forename: Andrei L
authors.initials: AL
authors.lastname: Kholkin
keywords: resonance amplification