title: Inelastic X-ray scattering with 0.75 meV resolution at 25.7 keV using a temperature-gradient analyzer.
abstract: The use of temperature-gradient analyzers for non-resonant high-resolution inelastic X-ray scattering is investigated. The gradient compensates for geometrical broadening of the energy resolution by adjusting the lattice spacing of the analyzer crystal. Applying a ∼ 12 mK temperature gradient across a 9.5 cm analyzer, resolutions of 0.75 (2) meV FWHM at 25.7 keV for Si(13 13 13) and 1.25(2) meV at 21.7 keV for Si(11 11 11) were measured, while retaining large (250 mm) clearance between the sample position and detector, and reasonable (9.3 mrad × 8.8 mrad) analyzer acceptance. The temperature control and stability are discussed.
authors.affiliation: Materials Dynamics Laboratory, RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo, Hyogo 679-5148, Japan.
authors.forename: Daisuke
authors.initials: D
authors.lastname: Ishikawa
authors.affiliation: Materials Dynamics Laboratory, RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo, Hyogo 679-5148, Japan.
authors.forename: David S
authors.initials: DS
authors.lastname: Ellis
authors.affiliation: Materials Dynamics Laboratory, RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo, Hyogo 679-5148, Japan.
authors.forename: Hiroshi
authors.initials: H
authors.lastname: Uchiyama
authors.affiliation: Materials Dynamics Laboratory, RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo, Hyogo 679-5148, Japan.
authors.forename: Alfred Q R
authors.initials: AQ
authors.lastname: Baron
keywords: X-ray optics; high-resolution analyzer; inelastic X-ray scattering