title: Precisely detecting atomic position of atomic intensity images.
abstract: We proposed a quantitative method to detect atomic position in atomic intensity images from experiments such as high-resolution transmission electron microscopy, atomic force microscopy, and simulation such as phase field crystal modeling. The evaluation of detection accuracy proves the excellent performance of the method. This method provides a chance to precisely determine atomic interactions based on the detected atomic positions from the atomic intensity image, and hence to investigate the related physical, chemical and electrical properties.
authors.affiliation: State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi'an 710072, PR China.
authors.forename: Zhijun
authors.initials: Z
authors.lastname: Wang
authors.affiliation: State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi'an 710072, PR China.
authors.forename: Yaolin
authors.initials: Y
authors.lastname: Guo
authors.affiliation: State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi'an 710072, PR China.
authors.forename: Sai
authors.initials: S
authors.lastname: Tang
authors.affiliation: State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi'an 710072, PR China.
authors.forename: Junjie
authors.initials: J
authors.lastname: Li
authors.affiliation: State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi'an 710072, PR China. Electronic address: jchwang@nwpu.edu.cn.
authors.forename: Jincheng
authors.initials: J
authors.lastname: Wang
authors.affiliation: State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi'an 710072, PR China.
authors.forename: Yaohe
authors.initials: Y
authors.lastname: Zhou
keywords: Atomic intensity image; Atomic position; Strain mapping