title: Ferroelectric 180° domain wall motion controlled by biaxial strain.
abstract: 180° domain wall motion in a tetragonal ferroelectric oxide is accelerated by an order of magnitude using in situ strain in a force microscope. Single-domain PbZr0.2 Ti0.8 O3 films on piezoelectric (001)-oriented 0.72PbMg1/3 Nb2/3 O3 -0.28PbTiO3 substrates allow for direct investigation of strain-dependent domain dynamics. The strain effect depends on the sign of applied field through strain-dependent electrode built-in potentials and a suggested charging of tilted walls.
authors.affiliation: Institute for Physics, Martin-Luther-University, Halle-Wittenberg, 06099, Halle, Germany; Institute for Metallic Materials, IFW Dresden, Postfach 270116, 01069, Dresden, Germany.
authors.forename: Er-Jia
authors.initials: EJ
authors.lastname: Guo
authors.forename: Robert
authors.initials: R
authors.lastname: Roth
authors.forename: Andreas
authors.initials: A
authors.lastname: Herklotz
authors.forename: Dietrich
authors.initials: D
authors.lastname: Hesse
authors.forename: Kathrin
authors.initials: K
authors.lastname: Dörr
keywords: conductive domain walls; epitaxial strain; ferroelectric domain dynamics; piezoelectric substrates; piezoresponse force microscopy