title: Quantitative evaluation of annular bright-field phase images in STEM.
abstract: A phase reconstruction method based on multiple scanning transmission electron microscope (STEM) images was evaluated quantitatively using image simulations. The simulation results indicated that the phase shift caused by a single atom was proportional to the 0.6th power of the atomic number Z. For a thin SrTiO3 [001] crystal, the reconstructed phase at each atomic column increased according to the specimen thickness. The STEM phase images can quantify the oxygen vacancy concentration if the thickness is less than several nanometers.
authors.affiliation: Department of Electrical Engineering and Computer Science, Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa, Nagoya 464-8603, Japan takafu_i@nuee.nagoya-u.ac.jp.
authors.forename: Takafumi
authors.initials: T
authors.lastname: Ishida
authors.affiliation: EcoTopia Science Institute, Nagoya University, Furo-cho, Chikusa, Nagoya 464-8502, Japan Nanostructures Research Laboratory, Japan Fine Ceramics Center, 2-4-1 Mutsuno, Atsuta, Nagoya 456-8587, Japan Global Research Center for Environment and Energy Based on Nanomaterials Science, Furo-cho, Chikusa, Nagoya 464-8502, Japan.
authors.forename: Tadahiro
authors.initials: T
authors.lastname: Kawasaki
authors.affiliation: EcoTopia Science Institute, Nagoya University, Furo-cho, Chikusa, Nagoya 464-8502, Japan Global Research Center for Environment and Energy Based on Nanomaterials Science, Furo-cho, Chikusa, Nagoya 464-8502, Japan.
authors.forename: Takayoshi
authors.initials: T
authors.lastname: Tanji
authors.affiliation: Department of Electrical and Electronic Engineering, Faculty of Engineering, Osaka Electro-Communication University, 18-8 Hatsu-cho, Neyagawa 572-8530, Japan.
authors.forename: Takashi
authors.initials: T
authors.lastname: Ikuta
keywords: annular aperture; annular bright-field imaging; multi-channel detector; phase reconstruction; scanning transmission electron microscopy