title: Real-time deflection and friction force imaging by bimorph-based resonance-type high-speed scanning force microscopy in the contact mode.
abstract: We report herein an alternative high-speed scanning force microscopy method in the contact mode based on a resonance-type piezoelectric bimorph scanner. The experimental setup, the modified optical beam deflection scheme suitable for smaller cantilevers, and a high-speed control program for simultaneous data capture are described in detail. The feature of the method is that the deflection and friction force images of the sample surface can be obtained simultaneously in real time. Images of various samples (e.g., a test grating, a thin gold film, and fluorine-doped tin oxide-coated glass slides) are acquired successfully. The imaging rate is 25 frames per second, and the average scan speed reaches a value of approximately 2.5 cm/s. The method combines the advantages of both observing the dynamic processes of the sample surface and monitoring the frictional properties on the nanometer scale.
  07.79.Lh; 07.79.Sp; 68.37.Ps.
authors.affiliation: Department of Applied Physics, Beihang University, Beijing 100191, People's Republic of China ; Key Laboratory of Micro-nano Measurement-Manipulation and Physics (Ministry of Education), Beihang University, Beijing 100191, People's Republic of China.
authors.forename: Wei
authors.initials: W
authors.lastname: Cai
authors.affiliation: Department of Applied Physics, Beihang University, Beijing 100191, People's Republic of China.
authors.forename: Haiyun
authors.initials: H
authors.lastname: Fan
authors.affiliation: Key Laboratory of Micro-nano Measurement-Manipulation and Physics (Ministry of Education), Beihang University, Beijing 100191, People's Republic of China.
authors.forename: Jianyong
authors.initials: J
authors.lastname: Zhao
authors.affiliation: Department of Applied Physics, Beihang University, Beijing 100191, People's Republic of China ; Key Laboratory of Micro-nano Measurement-Manipulation and Physics (Ministry of Education), Beihang University, Beijing 100191, People's Republic of China.
authors.forename: Guangyi
authors.initials: G
authors.lastname: Shang
keywords: Atomic force microscopy; Friction force microscopy; High-speed atomic force microscopy; Resonance-type bimorph scanner