title: Test generation algorithm for fault detection of analog circuits based on extreme learning machine.
abstract: This paper proposes a novel test generation algorithm based on extreme learning machine (ELM), and such algorithm is cost-effective and low-risk for analog device under test (DUT). This method uses test patterns derived from the test generation algorithm to stimulate DUT, and then samples output responses of the DUT for fault classification and detection. The novel ELM-based test generation algorithm proposed in this paper contains mainly three aspects of innovation. Firstly, this algorithm saves time efficiently by classifying response space with ELM. Secondly, this algorithm can avoid reduced test precision efficiently in case of reduction of the number of impulse-response samples. Thirdly, a new process of test signal generator and a test structure in test generation algorithm are presented, and both of them are very simple. Finally, the abovementioned improvement and functioning are confirmed in experiments.
authors.affiliation: School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China.
authors.forename: Jingyu
authors.initials: J
authors.lastname: Zhou
authors.affiliation: School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China.
authors.forename: Shulin
authors.initials: S
authors.lastname: Tian
authors.affiliation: School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China.
authors.forename: Chenglin
authors.initials: C
authors.lastname: Yang
authors.affiliation: School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China.
authors.forename: Xuelong
authors.initials: X
authors.lastname: Ren
mesh_terms: D000465:Algorithms; D001185:Artificial Intelligence; D006801:Humans; D008962:Models, Theoretical; D010363:Pattern Recognition, Automated; D012815:Signal Processing, Computer-Assisted; D013997:Time Factors