title: Silicon nanodisk array design for effective light trapping in ultrathin c-Si.
abstract: The use of ultrathin c-Si (crystalline silicon) wafers thinner than 20 μm for solar cells is a very promising approach to realize dramatic reduction in cell cost. However, the ultrathin c-Si requires highly effective light trapping to compensate optical absorption reduction. Conventional texturing in micron scale is hardly applicable to the ultrathin c-Si wafers; thus, nano scale texturing is demanded. In general, nanotexturing is inevitably accompanied by surface area enlargements, which must be minimized in order to suppress surface recombination of minority carriers. In this study, we demonstrate using optical simulations that periodic c-Si nanodisk arrays of short heights less than 200 nm and optimal periods are very useful in terms of light trapping in the ultrathin c-Si wafers while low surface area enlargements are maintained. Double side texturing with the nanodisk arrays leads to over 90% of the Lambertian absorption limit while the surface area enlargement is kept below 1.5.
authors.forename: Inho
authors.initials: I
authors.lastname: Kim
authors.forename: Doo Seok
authors.initials: DS
authors.lastname: Jeong
authors.forename: Wook Seong
authors.initials: WS
authors.lastname: Lee
authors.forename: Won Mok
authors.initials: WM
authors.lastname: Kim
authors.forename: Taek-Sung
authors.initials: TS
authors.lastname: Lee
authors.forename: Doh-Kwon
authors.initials: DK
authors.lastname: Lee
authors.forename: Jong-Han
authors.initials: JH
authors.lastname: Song
authors.forename: Joon-Kon
authors.initials: JK
authors.lastname: Kim
authors.forename: Kyeong-Seok
authors.initials: KS
authors.lastname: Lee
mesh_terms: D065638:Absorption, Radiation; D003198:Computer Simulation; D017076:Computer-Aided Design; D004867:Equipment Design; D019544:Equipment Failure Analysis; D008027:Light; D008962:Models, Theoretical; D053758:Nanoparticles / Q000737:chemistry* / Q000648:ultrastructure*; D036103:Nanotechnology / Q000295:instrumentation; D012031:Refractometry / Q000295:instrumentation*; D012542:Scattering, Radiation; D012825:Silicon / Q000737:chemistry*; D020349:Surface Plasmon Resonance / Q000295:instrumentation*
chemical_list: D012825:Silicon