title: Ellipse fitting for interferometry. Part 1: static methods.
abstract: We compare a number of different methods for fitting an ellipse to a static set of measured data points, specifically considering their suitability for interferometric application. We suggest an improved distance approximation for least-square geometric fitting and alternative normalizations for linear algebraic fitting. Of the methods considered, an algebraic fit using a data-dependent normalization has both the least bias in phase and amplitude estimation and the greatest robustness against uneven distribution of data.
authors.forename: M J
authors.initials: MJ
authors.lastname: Collett
authors.forename: G J
authors.initials: GJ
authors.lastname: Tee