title: A flexible multi-stimuli in situ (S)TEM: concept, optical performance, and outlook.
abstract: The progress in (scanning) transmission electron microscopy development had led to an unprecedented knowledge of the microscopic structure of functional materials at the atomic level. Additionally, although not widely used yet, electron holography is capable to map the electric and magnetic potential distributions at the sub-nanometer scale. Nevertheless, in situ studies inside a (scanning) transmission electron microscope ((S)TEM) are extremely challenging because of the much restricted size and accessibility of the sample space. Here, we introduce a concept for a dedicated in situ (S)TEM with a large sample chamber for flexible multi-stimuli experimental setups and report about the electron optical performance of the instrument. We demonstrate a maximum resolving power of about 1 nm in conventional imaging mode and substantially better than 5 nm in scanning mode while providing an effectively usable "pole piece gap" of 70 mm.
authors.affiliation: Speziallabor Triebenberg, Technische Universität Dresden, 01062 Dresden, Germany; IFW Dresden, PF 27 01 16, 01171 Dresden, Germany; Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, United Kingdom. Electronic address: felix.boerrnert@triebenberg.de.
authors.forename: Felix
authors.initials: F
authors.lastname: Börrnert
authors.affiliation: CEOS GmbH, Englerstraße 28, 69126 Heidelberg, Germany.
authors.forename: Heiko
authors.initials: H
authors.lastname: Müller
authors.affiliation: CEOS GmbH, Englerstraße 28, 69126 Heidelberg, Germany.
authors.forename: Thomas
authors.initials: T
authors.lastname: Riedel
authors.affiliation: CEOS GmbH, Englerstraße 28, 69126 Heidelberg, Germany.
authors.forename: Martin
authors.initials: M
authors.lastname: Linck
authors.affiliation: Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, United Kingdom.
authors.forename: Angus I
authors.initials: AI
authors.lastname: Kirkland
authors.affiliation: CEOS GmbH, Englerstraße 28, 69126 Heidelberg, Germany.
authors.forename: Max
authors.initials: M
authors.lastname: Haider
authors.affiliation: IFW Dresden, PF 27 01 16, 01171 Dresden, Germany.
authors.forename: Bernd
authors.initials: B
authors.lastname: Büchner
authors.affiliation: Speziallabor Triebenberg, Technische Universität Dresden, 01062 Dresden, Germany.
authors.forename: Hannes
authors.initials: H
authors.lastname: Lichte
keywords: In situ STEM; In situ TEM; Lorentz STEM; Lorentz TEM