title: Structural study and Raman scattering analysis of Cu2ZnSiTe4 bulk crystals.
abstract: Bulk crystals of Cu(2)ZnSiTe(4) (CZSiTe) have been prepared by modified Bridgman method and have been investigated by single crystal X-ray method, Energy Dispersive X-Ray analysis and Raman scattering techniques. The structural studies revealed that the CZSiTe compounds crystallizes in the tetragonal space group I4¯2m, with a = b = 5.9612(1) Å and c = 11.7887(4) Å at 293 K. The Raman spectrum characteristic of the crystals exhibits nine peaks, with two dominant peaks at approximately 134 cm(-1) and 151 cm(-1) that can be used as fingerprint peaks for the identification of this compound. The Raman peaks were analyzed on the basis of the derived irreducible representation for the zone center phonons and by comparison with experimental and theoretical data from close related semiconductors as Cu(2)FeSnS(4) and Cu(2)ZnSnSe(4).
authors.forename: Serghei
authors.initials: S
authors.lastname: Levcenko
authors.forename: Alexandr
authors.initials: A
authors.lastname: Nateprov
authors.forename: Victor
authors.initials: V
authors.lastname: Kravtsov
authors.forename: Maxim
authors.initials: M
authors.lastname: Guc
authors.forename: Alejandro
authors.initials: A
authors.lastname: Pérez-Rodríguez
authors.forename: Victor
authors.initials: V
authors.lastname: Izquierdo-Roca
authors.forename: Xavier
authors.initials: X
authors.lastname: Fontané
authors.forename: Ernest
authors.initials: E
authors.lastname: Arushanov