title: Fourier transform spectral imaging microscopy (FT-SIM) and scanning Raman microscopy for the detection of indoor common contaminants on the surface of dental implants.
abstract: Endosteal dental implants are used routinely with high success rates to rehabilitate the integrity of the dentition. However if implant surfaces become contaminated by foreign material, osseointegration may not occur and the dental implant will fail because of the lack of mechanical stability. Detection and characterization of dental implant surface contaminants is a difficult task. In this article we investigate the application of several spectral microscopy methods to detect airborne contaminants on dental implant surfaces. We found that Fourier Transform Spectral Imaging Microscopy (FT-SIM) and scanning Raman microscopy provided the most useful information. Some implants possess weak and homogeneous auto-fluorescence and are best analyzed using FT-SIM methods, while others are Raman inactive and can be analyzed using scanning Raman microscopy.
authors.affiliation: Schulich department of chemistry, Technion - Israel Institute of Technology, Haifa 32000, Israel.
authors.forename: Anna
authors.initials: A
authors.lastname: Lutin
authors.affiliation: Schulich department of chemistry, Technion - Israel Institute of Technology, Haifa 32000, Israel.
authors.forename: Valery
authors.initials: V
authors.lastname: Bulatov
authors.affiliation: Periodontology and Oral Medicine, School of Oral Health Sciences, Faculty of Health Sciences, University of Limpopo, Medunsa Campus, 0204, South Africa.
authors.forename: Yusuf
authors.initials: Y
authors.lastname: Jadwat
authors.affiliation: Periodontology and Oral Medicine, School of Oral Health Sciences, Faculty of Health Sciences, University of Limpopo, Medunsa Campus, 0204, South Africa.
authors.forename: Neil H
authors.initials: NH
authors.lastname: Wood
authors.affiliation: Periodontology and Oral Medicine, School of Oral Health Sciences, Faculty of Health Sciences, University of Limpopo, Medunsa Campus, 0204, South Africa.
authors.forename: Liviu
authors.initials: L
authors.lastname: Feller
authors.affiliation: Schulich department of chemistry, Technion - Israel Institute of Technology, Haifa 32000, Israel. Electronic address: Israel@techunix.technion.ac.il.
authors.forename: Israel
authors.initials: I
authors.lastname: Schechter
mesh_terms: D000393:Air Pollutants / Q000032:analysis*; D016902:Air Pollution, Indoor; D019659:Asteraceae; D002119:Calcium Carbonate / Q000032:analysis; D015921:Dental Implants; D005583:Fourier Analysis; D008853:Microscopy / Q000379:methods; D030007:Nerium; D052638:Particulate Matter / Q000032:analysis; D028223:Pinus; D011058:Pollen; D011084:Polycyclic Aromatic Hydrocarbons / Q000032:analysis; D013059:Spectrum Analysis, Raman; D013627:Talc / Q000032:analysis; D013784:Textiles
chemical_list: D000393:Air Pollutants; D015921:Dental Implants; D052638:Particulate Matter; D011084:Polycyclic Aromatic Hydrocarbons; D013627:Talc; D002119:Calcium Carbonate
keywords: Analysis; Contamination; Dental; Inplant; Spectroscopy