title: Wavefront sensing by means of binary intensity modulation.
abstract: We propose a kind of wavefront sensing technique by means of binary intensity modulation. A digital micromirror device operates as a binary intensity modulator and a pinhole works as a binary-aberration-mode filter. Through modulating intensity distribution of incident light, light emitting from the pinhole is capable of containing information on binary aberration coefficients. With the amount of light acquired by a single detector, the coefficients of binary aberration modes for reconstructing incident wavefront can be calculated. Differing from the conventional wavefront sensing technique, this method turns the complex two-dimensional wavefront sensing into simple total-light-intensity detection. The simulation experiment has validated the feasibility of the theoretical model.
authors.forename: Shuai
authors.initials: S
authors.lastname: Wang
authors.forename: Ping
authors.initials: P
authors.lastname: Yang
authors.forename: Mingwu
authors.initials: M
authors.lastname: Ao
authors.forename: Lizhi
authors.initials: L
authors.lastname: Dong
authors.forename: Bing
authors.initials: B
authors.lastname: Xu
mesh_terms: D004867:Equipment Design; D019544:Equipment Failure Analysis / Q000295:instrumentation*; D007909:Lenses; D008029:Lighting / Q000295:instrumentation*; D012031:Refractometry / Q000295:instrumentation*; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity; D020349:Surface Plasmon Resonance / Q000295:instrumentation*