title: Instrument for evaluating the electrical resistance and wavelength-resolved transparency of stretchable electronics during strain.
abstract: A complete analysis of strain tolerance in a stretchable transparent conductor (TC) should include tracking of both electrical conductivity and transparency during strain; however, transparency is generally neglected in contemporary analyses. In this paper, we describe an apparatus that tracks both parameters while TCs of arbitrary composition are deformed under stretching-mode strain. We demonstrate the tool by recording the electrical resistance and light transmission spectra for indium tin oxide-coated plastic substrates under both linearly increasing strain and complex cyclic strain processes. The optics are sensitive across the visible spectrum and into the near-infrared region (∼400-900 nm), and without specifically optimizing for sampling speed, we achieve a time resolution of ∼200 ms. In our automated analysis routine, we include a calculation of a common TC figure of merit (FOM), and because solar cell electrodes represent a key TC application, we also weigh both our transparency and FOM results against the solar power spectrum to determine "solar transparency" and "solar FOM." Finally, we demonstrate how the apparatus may be adapted to measure the basic performance metrics for complete solar cells under uniaxial strain.
authors: National Institute for Nanotechnology, 11421 Saskatchewan Drive, Edmonton, Alberta T6G 2M9, Canada.
authors: A D
authors: AD
authors: Azar
authors: National Institute for Nanotechnology, 11421 Saskatchewan Drive, Edmonton, Alberta T6G 2M9, Canada.
authors: E
authors: E
authors: Finley
authors: National Institute for Nanotechnology, 11421 Saskatchewan Drive, Edmonton, Alberta T6G 2M9, Canada.
authors: K D
authors: KD
authors: Harris