title: Two-dimensional scanning focused refractive-index microscopy and applications to refractive-index profiling of optical fibers.
abstract: The refractive-index profile (RIP) of optical fibers is of fundamental significance in determining critical fiber properties. Here, we present the application of a two-dimensional (2-D) scanning focused refractive-index microscopy (SFRIM) to accurately obtain the 2-D RIP of a graded-index optical fiber. Some modifications are made to SFRIM for better 2-D measurement. Quantitative RIP of the fiber is obtained with derivative total reflection method. The refractive-index accuracy is 0.002. The measured result is in good agreement with theoretical expectation. This method is straightforward, simple, repeatable, and free from signal distortion. This technique is suitable for symmetric and asymmetric optical fibers. The results indicate that this technique can be applied to obtain the RIPs of a wide range of materials and has broad application prospect in many fields.
authors: The Key Laboratory of Weak-Light Nonlinear Photonics, Ministry of Education, School of Physics and TEDA Applied Physics School, Nankai University, Tianjin 300071, China.
authors: Xiaowan
authors: X
authors: Wang
authors: The Key Laboratory of Weak-Light Nonlinear Photonics, Ministry of Education, School of Physics and TEDA Applied Physics School, Nankai University, Tianjin 300071, China.
authors: Qing
authors: Q
authors: Ye
authors: The Key Laboratory of Weak-Light Nonlinear Photonics, Ministry of Education, School of Physics and TEDA Applied Physics School, Nankai University, Tianjin 300071, China.
authors: Tengqian
authors: T
authors: Sun
authors: The Key Laboratory of Weak-Light Nonlinear Photonics, Ministry of Education, School of Physics and TEDA Applied Physics School, Nankai University, Tianjin 300071, China.
authors: Jin
authors: J
authors: Wang
authors: The Key Laboratory of Weak-Light Nonlinear Photonics, Ministry of Education, School of Physics and TEDA Applied Physics School, Nankai University, Tianjin 300071, China.
authors: Zhichao
authors: Z
authors: Deng
authors: Advanced Technology Institute, Nankai University, Tianjin 300071, China.
authors: Jianchun
authors: J
authors: Mei
authors: The Key Laboratory of Weak-Light Nonlinear Photonics, Ministry of Education, School of Physics and TEDA Applied Physics School, Nankai University, Tianjin 300071, China.
authors: Wenyuan
authors: W
authors: Zhou
authors: The Key Laboratory of Weak-Light Nonlinear Photonics, Ministry of Education, School of Physics and TEDA Applied Physics School, Nankai University, Tianjin 300071, China.
authors: Chunping
authors: C
authors: Zhang
authors: The Key Laboratory of Weak-Light Nonlinear Photonics, Ministry of Education, School of Physics and TEDA Applied Physics School, Nankai University, Tianjin 300071, China.
authors: Jianguo
authors: J
authors: Tian