title: A high resolution on-chip delay sensor with low supply-voltage sensitivity for high-performance electronic systems.
abstract: An all-digital on-chip delay sensor (OCDS) circuit with high delay-measurement resolution and low supply-voltage sensitivity for efficient detection and diagnosis in high-performance electronic system applications is presented. Based on the proposed delay measurement scheme, the quantization resolution of the proposed OCDS can be reduced to several picoseconds. Additionally, the proposed cascade-stage delay measurement circuit can enhance immunity to supply-voltage variations of the delay measurement resolution without extra self-biasing or calibration circuits. Simulation results show that the delay measurement resolution can be improved to 1.2 ps; the average delay resolution variation is 0.55% with supply-voltage variations of ±10%. Moreover, the proposed delay sensor can be implemented in an all-digital manner, making it very suitable for high-performance electronic system applications as well as system-level integration.
authors: Department of Electrical Engineering, Fu Jen Catholic University, Taipei 24205, Taiwan. duosheng@mail.fju.edu.tw.
authors: Duo
authors: D
authors: Sheng
authors: Department of Electrical Engineering, Fu Jen Catholic University, Taipei 24205, Taiwan. zero7260@hotmail.com.
authors: Hsiu-Fan
authors: HF
authors: Lai
authors: Department of Electrical Engineering, Fu Jen Catholic University, Taipei 24205, Taiwan. a2553858@hotmail.com.
authors: Sheng-Min
authors: SM
authors: Chan
authors: Department of Electrical Engineering, Fu Jen Catholic University, Taipei 24205, Taiwan. perp8825@hotmail.com.
authors: Min-Rong
authors: MR
authors: Hong