title: 100 kHz Mueller polarimeter in reflection configuration.
abstract: A new setup is proposed to perform high-speed Mueller polarimetry by spectral coding of polarization in a reflection configuration. The system uses a swept laser source and a photodiode, which results in a simple optical setup that allows measurement of Mueller matrices at 100 kHz repetition rate. A special focus is made on the influence of the cube beam splitter polarimetric response, which is essential to measurements in a reflection configuration. The instrument is first validated on reference samples for single-point measurements, and the effect of a proper system calibration is also demonstrated on polarimetric images. The device is intended to be implemented within a laser scanning microscope to perform multimodal imaging (confocal/multiphoton and Mueller polarimetry).
authors: Aymeric
authors: A
authors: Le Gratiet
authors: Sylvain
authors: S
authors: Rivet
authors: Matthieu
authors: M
authors: Dubreuil
authors: Yann
authors: Y
authors: Le Grand
mesh_terms: D000388:Air; D005583:Fourier Analysis; D055096:Optical Devices