title: Erratum to: lateral resolution of nanoscaled images delivered by surface-analytical instruments: application of the BAM-L200 certified reference material and related ISO standards.
authors.affiliation: BAM Bundesanstalt für Materialforschung und -prüfung, 12200, Berlin, Germany.
authors.forename: M
authors.initials: M
authors.lastname: Senoner
authors.forename: A
authors.initials: A
authors.lastname: Maaßdorf
authors.forename: H
authors.initials: H
authors.lastname: Rooch
authors.forename: W
authors.initials: W
authors.lastname: Österle
authors.forename: M
authors.initials: M
authors.lastname: Malcher
authors.forename: M
authors.initials: M
authors.lastname: Schmidt
authors.forename: F
authors.initials: F
authors.lastname: Kollmer
authors.forename: D
authors.initials: D
authors.lastname: Paul
authors.forename: V-D
authors.initials: VD
authors.lastname: Hodoroaba
authors.forename: S
authors.initials: S
authors.lastname: Rades
authors.forename: W E S
authors.initials: WE
authors.lastname: Unger