title: Electron-impact ionization cross-sections of silane.
abstract: We have made a study of the total ionization cross-sections of a silane (SiH4) molecule caused by electron impact for a single ionization. Electron-impact ionization cross-sections (EIICS) have been calculated from threshold ionization energy to 1400 eV. The theoretical model, developed by Jain and Khare, has been used to calculate the EIICS for silane. We observed the following product ions: SiH3(+), SiH2(+), SiH(+), Si(+), H2(+) and H(+). The predicted EIICS of silane for all six fragment ions are compared with other theoretical and experimental data. The present model shows a good agreement with the previously reported data.
authors.forename: Sham Singh
authors.initials: SS
authors.lastname: Saini
authors.forename: Praveen
authors.initials: P
authors.lastname: Bhatt
authors.forename: Umesh
authors.initials: U
authors.lastname: Bhardwaj
authors.forename: Santosh
authors.initials: S
authors.lastname: Bhardwaj
mesh_terms: D004583:Electrons; D008956:Models, Chemical; D012821:Silanes / Q000737:chemistry*
chemical_list: D012821:Silanes