Magnetic force microscopy using tip magnetization modulated by ferromagnetic resonance.
In magnetic force microscopy (MFM), the tip-sample distance should be reduced to analyze the microscopic magnetic domain structure with high spatial resolution. However, achieving a small tip-sample distance has been difficult because of superimposition of interaction forces such as van der Waals and electrostatic forces induced by the sample surface. In this study, we propose a new method of MFM using ferromagnetic resonance (FMR) to extract only the magnetic field near the sample surface. In this method, the magnetization of a magnetic cantilever is modulated by FMR to separate the magnetic field and topographic structure. We demonstrate the modulation of the magnetization of the cantilever and the identification of the polarities of a perpendicular magnetic medium.
Department of Applied Physics, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita 565-0871, Japan.
Eiji
E
Arima
Yoshitaka
Y
Naitoh
Yan Jun
YJ
Li
Satoru
S
Yoshimura
Hitoshi
H
Saito
Hikaru
H
Nomura
Ryoichi
R
Nakatani
Yasuhiro
Y
Sugawara