A high speed CMOS image sensor with a novel digital correlated double sampling and a differential difference amplifier.
In order to increase the operating speed of a CMOS image sensor (CIS), a new technique of digital correlated double sampling (CDS) is described. In general, the fixed pattern noise (FPN) of a CIS has been reduced with the subtraction algorithm between the reset signal and pixel signal. This is because a single-slope analog-to-digital converter (ADC) has been normally adopted in the conventional digital CDS with the reset ramp and signal ramp. Thus, the operating speed of a digital CDS is much slower than that of an analog CDS. In order to improve the operating speed, we propose a novel digital CDS based on a differential difference amplifier (DDA) that compares the reset signal and the pixel signal using only one ramp. The prototype CIS has been fabricated with 0.13 µm CIS technology and it has the VGA resolution of 640 × 480. The measured conversion time is 16 µs, and a high frame rate of 131 fps is achieved at the VGA resolution.
Department of Semiconductor Science, Dongguk University, Seoul 100-715, Korea. dh7423@dongguk.edu.
Daehyeok
D
Kim
Department of Semiconductor Science, Dongguk University, Seoul 100-715, Korea. sorcebaeru@dongguk.edu.
Jaeyoung
J
Bae
Department of Semiconductor Science, Dongguk University, Seoul 100-715, Korea. mksong@dongguk.edu.
Minkyu
M
Song