HAADF-STEM atom counting in atom probe tomography specimens: Towards quantitative correlative microscopy.
The geometry of atom probe tomography tips strongly differs from standard scanning transmission electron microscopy foils. Whereas the later are rather flat and thin (<20 nm), tips display a curved surface and a significantly larger thickness. As far as a correlative approach aims at analysing the same specimen by both techniques, it is mandatory to explore the limits and advantages imposed by the particular geometry of atom probe tomography specimens. Based on simulations (electron probe propagation and image simulations), the possibility to apply quantitative high angle annular dark field scanning transmission electron microscopy to of atom probe tomography specimens has been tested. The influence of electron probe convergence and the benefice of deconvolution of electron probe point spread function electron have been established. Atom counting in atom probe tomography specimens is for the first time reported in this present work. It is demonstrated that, based on single projections of high angle annular dark field imaging, significant quantitative information can be used as additional input for refining the data obtained by correlative analysis of the specimen in APT, therefore opening new perspectives in the field of atomic scale tomography.
UR, Université de Rouen, GPM, UMR CNRS 6634 BP 12, Avenue de l'Université, 76801 Saint Etienne de Rouvray, France. Electronic address: williams.lefebvre@univ-rouen.fr.
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Lefebvre
UR, Université de Rouen, GPM, UMR CNRS 6634 BP 12, Avenue de l'Université, 76801 Saint Etienne de Rouvray, France.
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Hernandez-Maldonado
UR, Université de Rouen, GPM, UMR CNRS 6634 BP 12, Avenue de l'Université, 76801 Saint Etienne de Rouvray, France.
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Moyon
UR, Université de Rouen, GPM, UMR CNRS 6634 BP 12, Avenue de l'Université, 76801 Saint Etienne de Rouvray, France.
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Cuvilly
UR, Université de Rouen, GPM, UMR CNRS 6634 BP 12, Avenue de l'Université, 76801 Saint Etienne de Rouvray, France.
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Vaudolon
UR, Université de Rouen, GPM, UMR CNRS 6634 BP 12, Avenue de l'Université, 76801 Saint Etienne de Rouvray, France.
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Shinde
UR, Université de Rouen, GPM, UMR CNRS 6634 BP 12, Avenue de l'Université, 76801 Saint Etienne de Rouvray, France.
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Vurpillot
Atom counting; Atom probe tomography; Correlative microscopy; HAADF; STEM