Probing buried magnetic interface structure with the quantum size effect in spin-dependent electron reflectivity.
The quantum size effect (QSE) in electron reflectivity from Fe thin films grown on a W(110) surface precovered with a two monolayer Cu film has been investigated using spin polarized low energy electron microscopy. Spin-dependent QSE-induced oscillations in the reflected intensity occur with energy and film thickness. The series of intensity peaks that is observed identifies spin-dependent quantum well resonances in the Fe film that are sensitive to electronic band structure and details of the buried interface. Information about the spin-dependent unoccupied bands of the Fe film in the ΓΝ direction normal to the film plane is obtained by analyzing the observed quantum well resonance conditions. The spin-split bands that are determined are uniformly shifted downward by 1.7 eV compared to bulk-like bands determined previously in Fe films on a bare W(110) substrate by the same method. Evidence is also obtained that the buried interface that defines the thin film quantum well boundary is located one layer above the W(110) surface. These results suggest that the Cu layer in direct contact with the substrate remains largely intact, but the weakly-bound second Cu layer mixes or segregates freely.
Department of Physics, Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong, PR China.
Qiang
Q
Wu
Department of Physics, Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong, PR China.
M S
MS
Altman
Electron reflectivity; Quantum size effect; Spin polarized low energy electron microscopy; Thin film