Correlation between gloss reflectance and surface texture in photographic paper.
Surface textures of a large collection of photographic papers dating from 1896 to the present were measured using a laser scanning confocal microscope (LSCM) with four different objective lenses. Roughness characterization parameters were calculated from the texture measurements and were compared with gloss measurements. Characterization by the area-scale fractal dimension (Das) and the area-scale fractal complexity (Asfc) provided the strongest correlations between gloss reflectance and surface texture. The measurements with the 5× and 10× objectives, which contained many large-scale, spiky measurement artifacts that distorted the measurement, resulted in the strongest correlations (R(2)  > 0.8) compared to the 20× and 50× (R(2)  < 0.5). The presence of spiky artifacts in the measurements, which increases when the magnification of the objective lens is decreased, appears to amplify surface features in such a way to improve the correlations.
Ecole Nationale d'Ingénieur de Saint-Etienne - E.N.I.S.E., 58 rue Jean Parot 42023, Saint-Etienne, Cedex 02, France.
Kevin
K
Vessot
Paul Messier LLC, Conservation of Photographs & Works on Paper, 103 Brooks Street, Boston, 02135, Massachusetts.
Paul
P
Messier
Surface Metrology Laboratory, Worcester Polytechnic Institute, 100 Institute Road, Worcester, 01609, Massachusetts.
Joyce M
JM
Hyde
Surface Metrology Laboratory, Worcester Polytechnic Institute, 100 Institute Road, Worcester, 01609, Massachusetts.
Christopher A
CA
Brown
fractal analysis; gloss reflectance; photographic paper; roughness; surface texture