title: Spectral modulation interferometry for quantitative phase imaging.
abstract: We propose a spectral-domain interferometric technique, termed spectral modulation interferometry (SMI), and present its application to high-sensitivity, high-speed, and speckle-free quantitative phase imaging. In SMI, one-dimensional complex field of an object is interferometrically modulated onto a broadband spectrum. Full-field phase and intensity images are obtained by scanning along the orthogonal direction. SMI integrates the high sensitivity of spectral-domain interferometry with the high speed of spectral modulation to quantify fast phase dynamics, and its dispersive and confocal nature eliminates laser speckles. The principle and implementation of SMI are discussed. Its performance is evaluated using static and dynamic objects.
authors.affiliation: Department of Electrical and Computer Engineering, Virginia Tech, Blacksburg, VA, 24061, USA.
authors.forename: Ruibo
authors.initials: R
authors.lastname: Shang
authors.affiliation: Department of Electrical and Computer Engineering, Virginia Tech, Blacksburg, VA, 24061, USA.
authors.forename: Shichao
authors.initials: S
authors.lastname: Chen
authors.affiliation: Department of Electrical and Computer Engineering, Virginia Tech, Blacksburg, VA, 24061, USA.
authors.forename: Chengshuai
authors.initials: C
authors.lastname: Li
authors.affiliation: Department of Electrical and Computer Engineering, Virginia Tech, Blacksburg, VA, 24061, USA.
authors.forename: Yizheng
authors.initials: Y
authors.lastname: Zhu
keywords: (110.3175) Interferometric imaging; (120.5050) Phase measurement; (170.1650) Coherence imaging; (180.0180) Microscopy; (180.3170) Interference microscopy