title: Radially polarized light for detection and nanolocalization of dielectric particles on a planar substrate.
abstract: A fast noninvasive method based on scattering from a focused radially polarized light to detect and localize subwavelength nanoparticles on a substrate is presented. The technique relies on polarization matching in the far field between scattered and spurious reflected fields. Results show a localization uncertainty of ≈10^{-4}λ^{2} is possible for a particle of area ≈λ^{2}/16. The effect of simple pupil shaping is also shown.
authors: Department of Imaging Physics, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, Netherlands.
authors: S
authors: S
authors: Roy
authors: Department of Imaging Physics, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, Netherlands.
authors: K
authors: K
authors: Ushakova
authors: Department of Imaging Physics, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, Netherlands.
authors: Q
authors: Q
authors: van den Berg
authors: Department of Imaging Physics, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, Netherlands.
authors: S F
authors: SF
authors: Pereira
authors: Department of Imaging Physics, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, Netherlands.
authors: H P
authors: HP
authors: Urbach