title: The Dark Side of EDX Tomography: Modeling Detector Shadowing to Aid 3D Elemental Signal Analysis.
abstract: A simple model is proposed to account for the loss of collected X-ray signal by the shadowing of X-ray detectors in the scanning transmission electron microscope. The model is intended to aid the analysis of three-dimensional elemental data sets acquired using energy-dispersive X-ray tomography methods where shadow-free specimen holders are unsuitable or unavailable. The model also provides a useful measure of the detection system geometry.
authors: Department of Materials Science and Metallurgy,University of Cambridge,27 Charles Babbage Road,Cambridge,CB3 0FS,UK.
authors: Catriona S M
authors: CS
authors: Yeoh
authors: Department of Materials Science and Metallurgy,University of Cambridge,27 Charles Babbage Road,Cambridge,CB3 0FS,UK.
authors: David
authors: D
authors: Rossouw
authors: Department of Materials Science and Metallurgy,University of Cambridge,27 Charles Babbage Road,Cambridge,CB3 0FS,UK.
authors: Zineb
authors: Z
authors: Saghi
authors: Department of Materials Science and Metallurgy,University of Cambridge,27 Charles Babbage Road,Cambridge,CB3 0FS,UK.
authors: Pierre
authors: P
authors: Burdet
authors: Department of Materials Science and Metallurgy,University of Cambridge,27 Charles Babbage Road,Cambridge,CB3 0FS,UK.
authors: Rowan K
authors: RK
authors: Leary
authors: Department of Materials Science and Metallurgy,University of Cambridge,27 Charles Babbage Road,Cambridge,CB3 0FS,UK.
authors: Paul A
authors: PA
authors: Midgley
keywords: EDX tomography; detector shadowing; elemental analysis