title: Modulation of the coffee-ring effect in particle/surfactant mixtures: the importance of particle-interface interactions.
abstract: We study the effect of surfactants on the deposits formed after the evaporation of colloidal suspension drops, at initial concentrations lower than the critical micellar concentrations, for various particle/surfactant mixtures. We show that the surfactant-mediated interactions between particles and the liquid-gas (LG) and liquid-solid (LS) interfaces, rather than the flow patterns, primarily define the morphology of the dry deposit in a robust and reproducible manner. For like-charged particle/surfactant mixtures, most of the particles form a ring-shaped deposit (according to the so-called "Coffee-Ring Effect"), but some particles can also be deposited inside the ring in a way that is modulated by electrostatic interactions between the particles and the LS interface. For oppositely charged systems, surfactant adsorption to the particle surface strongly affects particle-LG interface interactions, which in turn control the deposition pattern. For low surfactant concentrations, coffee-rings are systematically observed. For intermediate concentrations, the charge of surfactant-decorated particles becomes nearly neutral, and their hydrophobicity is enhanced, which promotes particle trapping at the LG interface. A particle skin is formed and its deposition upon drying leads to homogeneous disk-like patterns. For high surfactant concentrations, particle charge is reversed, and coffee-rings are observed again. Notably, this ring-disk-ring evolution of the deposition behavior as a function of surfactant concentration is observed in a variety of mixtures, regardless of particle absolute charge and surface chemistry as well as of surfactant charge and hydrophobicity. Its apparent universal character makes it a promising strategy for a robust control of particle deposition from evaporating drops.
authors: Department of Chemistry, Ecole Normale Supérieure-PSL Research University, 24 rue Lhomond, F-75005, Paris, France.|Sorbonne Universités, UPMC Univ Paris 06, PASTEUR, F-75005, Paris, France.|CNRS, UMR 8640 PASTEUR, F-75005, Paris, France.
authors: Manos
authors: M
authors: Anyfantakis
authors: Department of Chemistry, Ecole Normale Supérieure-PSL Research University, 24 rue Lhomond, F-75005, Paris, France.|Sorbonne Universités, UPMC Univ Paris 06, PASTEUR, F-75005, Paris, France.|CNRS, UMR 8640 PASTEUR, F-75005, Paris, France.
authors: Zheng
authors: Z
authors: Geng
authors: Department of Chemistry, Ecole Normale Supérieure-PSL Research University, 24 rue Lhomond, F-75005, Paris, France.|Sorbonne Universités, UPMC Univ Paris 06, PASTEUR, F-75005, Paris, France.|CNRS, UMR 8640 PASTEUR, F-75005, Paris, France.
authors: Mathieu
authors: M
authors: Morel
authors: Department of Chemistry, Ecole Normale Supérieure-PSL Research University, 24 rue Lhomond, F-75005, Paris, France.|Sorbonne Universités, UPMC Univ Paris 06, PASTEUR, F-75005, Paris, France.|CNRS, UMR 8640 PASTEUR, F-75005, Paris, France.
authors: Sergii
authors: S
authors: Rudiuk
authors: Department of Chemistry, Ecole Normale Supérieure-PSL Research University, 24 rue Lhomond, F-75005, Paris, France.|Sorbonne Universités, UPMC Univ Paris 06, PASTEUR, F-75005, Paris, France.|CNRS, UMR 8640 PASTEUR, F-75005, Paris, France.
authors: Damien
authors: D
authors: Baigl